Graphic Operation Panels for Control of Chip Embedded Instruments

15 December 2011 - GOEPEL electronic announced the integration of special features for the creation of graphic control panels in its Boundary Scan software platform SYSTEM CASCON. The new options are primarily configured for interactive graphic user-interfaces on chip-embedded instruments and also offer users the possibility to freely define application specific control panels.

Visualisations and controls that are combined in this way not only improve efficiency levels during the design validation, they also facilitate debugging in the event of faults as well as operator management in the production tests.

"Along with the control of the different protocol and transport layers, above all else, a key factor in the increasing industrial use of chip-embedded instruments is the simple and intuitive usability of the appropriate target function through the appropriately adapted user interfaces. We are now able to offer a universal and flexible solution to this problem" says Stefan Meissner, Marketing Manager with GOEPEL electronic. "With this approach we are therefore primarily promoting the area of the FPGA Assisted Test where we are currently the only service provider in the world which offers a uniform concept consisting of instrument IPs, integrated system administration, automatic program generation and now an interactive user interface as well."

The new graphic control panels are based on technical extensions to the special JTAG/Boundary Scan programming language CASLAN (CASCON Language) and are created during runtime through the corresponding commands. In addition to a wide range of visualisations of measured values or vectors, control elements and input windows are freely definable. This results in the full universality of the solution through to the automatic creation of the source code. As CASLAN is the central control language for all test access technologies, the graphic control panels can also be used for other procedures such as Boundary Scan tests, processor emulation tests or core assisted programming. This means interactive operator panels can be realised for process-control.