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        <title>All-about-Test</title>
        <description><![CDATA[Latest News Headlines from www.All-about-Test.eu]]></description>
        <link>http://www.all-about-test.eu/</link>
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            <title>Advantest launches Production at new Factory in South Korea</title>
            <link>http://www.all-about-test.eu/device-test/1553-advantest-launches-production-at-new-factory-in-south-korea.html</link>
            <description><![CDATA[Advantest launches Production at new Factory in South Korea
23 May 2013 Advantest Corporation announced that its new factory in Cheonan, South Korea, has been
Read More... (http://www.all-about-test.eu/device-test/1553-advantest-launches-production-at-new-factory-in-south-korea.html)]]></description>
			<pubDate>Thu, 23 May 2013 11:27:20 GMT</pubDate>
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            <title>New 21- Slot PXI Express Chassis and Compact 8-Slot PXI Chassis</title>
            <link>http://www.all-about-test.eu/general-tam/1552-new-21-slot-pxi-express-chassis-and-compact-8-slot-pxi-chassis.html</link>
            <description><![CDATA[New 21- Slot PXI Express Chassis and Compact 8-Slot PXI Chassis
23 May 2013 – Geotest-Marvin Test
Read More... (http://www.all-about-test.eu/general-tam/1552-new-21-slot-pxi-express-chassis-and-compact-8-slot-pxi-chassis.html)]]></description>
			<pubDate>Thu, 23 May 2013 06:25:46 GMT</pubDate>
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            <title>MatriX Technologies acquires FocalSpot Inc.</title>
            <link>http://www.all-about-test.eu/board-test/1551-matrix-technologies-acquires-focalspot-inc.html</link>
            <description><![CDATA[MatriX Technologies acquires FocalSpot Inc.
22 May 2013 MatriX Technologies GmbH, a global supplier of high-speed Automated In-line X-Ray inspection systems for industrial applications (AXI
Read More... (http://www.all-about-test.eu/board-test/1551-matrix-technologies-acquires-focalspot-inc.html)]]></description>
			<pubDate>Wed, 22 May 2013 10:35:26 GMT</pubDate>
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            <title>DC Power Supply ideal for testing PV Inverters and electric Vehicles</title>
            <link>http://www.all-about-test.eu/general-tam/1550-dc-power-supply-ideal-for-testing-pv-inverters-and-electric-vehicles.html</link>
            <description><![CDATA[DC Power Supply ideal for testing PV Inverters and electric Vehicles
22 May 2013 – AMETEK
Read More... (http://www.all-about-test.eu/general-tam/1550-dc-power-supply-ideal-for-testing-pv-inverters-and-electric-vehicles.html)]]></description>
			<pubDate>Wed, 22 May 2013 06:30:42 GMT</pubDate>
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            <title>Free Electronic Instrument Control and Automation Software</title>
            <link>http://www.all-about-test.eu/general-tam/1549-free-electronic-instrument-control-and-automation-software.html</link>
            <description><![CDATA[Free Electronic Instrument Control and Automation Software
21 May 2013 Agilent Technologies announced the latest enhancement on its Command Expert software for faster and easier
Read More... (http://www.all-about-test.eu/general-tam/1549-free-electronic-instrument-control-and-automation-software.html)]]></description>
			<pubDate>Tue, 21 May 2013 10:25:09 GMT</pubDate>
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            <title>HIOKI launches 3-Phase Digital Power Meters</title>
            <link>http://www.all-about-test.eu/board-test/1548-hioki-launches-3-phase-digital-power-meters.html</link>
            <description><![CDATA[HIOKI launches 3-Phase Digital Power Meters
21 May 2013 Hioki E.E. Corporation released two new
Read More... (http://www.all-about-test.eu/board-test/1548-hioki-launches-3-phase-digital-power-meters.html)]]></description>
			<pubDate>Tue, 21 May 2013 05:19:44 GMT</pubDate>
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            <title>KLA-Tencor announces novel Defect Discovery and Monitoring Technology</title>
            <link>http://www.all-about-test.eu/device-test/1547-kla-tencor-announces-novel-defect-discovery-and-monitoring-technology.html</link>
            <description><![CDATA[KLA-Tencor announces novel Defect Discovery and Monitoring Technology
17 May 2013 KLA-Tencor announced NanoPoint, a new family of patented technologies for its 2900 Series defect
Read More... (http://www.all-about-test.eu/device-test/1547-kla-tencor-announces-novel-defect-discovery-and-monitoring-technology.html)]]></description>
			<pubDate>Fri, 17 May 2013 10:48:04 GMT</pubDate>
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            <title>Modular Test System Power Supply from Diagnosys</title>
            <link>http://www.all-about-test.eu/board-test/1546-modular-test-system-power-supply-from-diagnosys.html</link>
            <description><![CDATA[Modular Test System Power Supply from Diagnosys
17 May 2013 The new modular powerpak unit from
Read More... (http://www.all-about-test.eu/board-test/1546-modular-test-system-power-supply-from-diagnosys.html)]]></description>
			<pubDate>Fri, 17 May 2013 06:41:32 GMT</pubDate>
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            <title>Four-Channel high Voltage Instrument for Analog Test System</title>
            <link>http://www.all-about-test.eu/device-test/1543-four-channel-high-voltage-instrument-for-analog-test-system.html</link>
            <description><![CDATA[Four-Channel high Voltage Instrument for Analog Test System
16 May 2013 – LTX-Credence introduces the VSX  four-channel multisite high voltage source and measure instrument for its
Read More... (http://www.all-about-test.eu/device-test/1543-four-channel-high-voltage-instrument-for-analog-test-system.html)]]></description>
			<pubDate>Thu, 16 May 2013 10:50:31 GMT</pubDate>
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            <title>Analysis Software for USB Protocol Analyzers</title>
            <link>http://www.all-about-test.eu/general-tam/1542-analysis-software-for-usb-protocol-analyzers.html</link>
            <description><![CDATA[Analysis Software for USB Protocol Analyzers
16 May 2013 – Agilent Technologies announced a new analysis software
Read More... (http://www.all-about-test.eu/general-tam/1542-analysis-software-for-usb-protocol-analyzers.html)]]></description>
			<pubDate>Thu, 16 May 2013 06:40:02 GMT</pubDate>
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