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Whitepaper Library

General Test and Measurement

Whitepaper, articles and application notes about general test and measurement technologies.
 
 
 

Files

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Getting Back to the Basics of Electrical Measurements

Short Description:
This white paper is intended to refresh the measurement fundamentals for all who want to learn more about making good quality measurements up to speed.
Submitted On:
14 Jul 2012
File Size:
334.32 Kb
File Author:
Keithley Instruments

Harmonic Distortion Measurements in the Presence of Noise

Short Description:
It is the purpose of this application note to investigate and discuss the influence of wideband noise on harmonic distortion measurements.
Submitted On:
14 Jul 2012
File Size:
265.43 Kb
File Author:
Rohde & Schwarz

Level Error Calculation for Spectrum Analyzers

Short Description:
Level or power measurement of especially modulated signals using spectrum analyzers is becoming more and more important.
Submitted On:
14 Jul 2012
File Size:
24.33 Kb
File Author:
Rohde & Schwarz

Oscilloscope Probes – Vital Link in the Measurement Chain

Short Description:
The probe is the first link in the oscilloscope measurement chain. It is the component that comes in direct contact with your circuit. Thus, it is imperative that the probe have minimum impact on the probed circuit and that it maintain adequate signal fidelity for the desired measurements.
Submitted On:
18 Feb 2013
File Size:
470.73 Kb
File Author:
Tektronix

The Impact of Digital Oscilloscope Blind Time on Your Measurements

Short Description:
All digital oscilloscopes are temporarily blind. During this blind time the user will miss critical signal events at his device under test. Thus, it is necessary to understand the impact of blind time to the measurement.
Submitted On:
14 Jul 2012
File Size:
530.50 Kb
File Author:
Rohde & Schwarz


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