All-about-Test

1. Multitest expands Contactor Portfolio for WLP / WLCSP Testing: (Component Test); Multitest expands Contactor Portfolio for WLP / WLCSP Testing 13 January 2016 - Multitest’s new Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting ...; Created on 12 January 2016
2. Multitest launches HC Contactor for high parallel Test: (Component Test); Multitest launches HC Contactor for high parallel Test 09 September 2015 - Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a ...; Created on 08 September 2015
3. Multitest introduces Link Contactors with vertical Probes for IC Test: (Component Test); Multitest introduces Link Contactors with vertical Probes for IC Test 26 March 2015 - Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative ...; Created on 25 March 2015
4. Xcerra is the new parent Company of LTX, atg, ETC and Multitest: (General T&M); Xcerra is the new parent Company of LTX, atg, ETC and Multitest 28 May 2014 - Xcerra Corporation is the new parent company of four brands that have been supplying innovative products and services to ...; Created on 28 May 2014
5. LTX-Credence to acquire Multitest and Everett Charles Technologies: (Component Test); LTX-Credence to acquire Multitest and Everett Charles Technologies 16 September 2013 - LTX-Credence announced an agreement to acquire Multitest and Everett Charles Technologies (ECT) from Dover Corporation. ...; Created on 16 September 2013
6. Multitest doubles throughput of MT9510 Pick-and-Place Handler: (Component Test); Multitest doubles throughput of MT9510 Pick-and-Place Handler 27 August 2013 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards, announced a special “Jumbo” ...; Created on 27 August 2013
7. Multitest presents a new Contacting Unit Holder: (Component Test); Multitest presents a new Contacting Unit Holder 19 April 2013 - Multitest, a designer and manufacturer of final test handlers, announces the new Access+ contact unit holder (CUH) for the MT9510 test ...; Created on 19 April 2013
8. VP of Multitest became Member of EMTC: (Newsflash); 16 October 2012 - James Quinn, Vice President of Marketing and Sales of Multitest, was appointed as the latest member of the European Manufacturing Test Conference Committee (EMTC). The EMTC committee ...; Created on 16 October 2012
9. Multitest introduces Signal Integrity and Power Glossary: (Newsflash); 07 August 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, introduces ...; Created on 07 August 2012
10. Multitest’s Solution for 3D Packages Released to Production: (Component Test); Multitest’s Solution for 3D Packages Released to Production 10 July 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers ...; Created on 10 July 2012
11. Multitest offers comprehensive Tutorial for Kelvin Contactors: (Newsflash); 30 March 2012 - Multitest offers a Kelvin Tutorial. A Kelvin contactor is required for economical testing of devices with measurements that are sensitive to contact resistance. Tutorial explains how a ...; Created on 30 March 2012
12. Multitest Ships first Tri-Temp 16-Site Pick-and-Place Platform: (Component Test); Multitest Ships first Tri-Temp 16-Site Pick-and-Place Platform 10 February 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device ...; Created on 10 February 2012
13. Multitest names new VP of Global Sales & Marketing: (Newsflash); 06 December 2011 - Multitest announces the appointment of James Quinn to Vice President of Global Sales & Marketing effective November 14, 2011. Based in Rosenheim, Jim will be responsible for managing ...; Created on 06 December 2011
14. Multitest appoints new President: (Component Test); Multitest appoints new President 13 July 2011 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test ...; Created on 13 July 2011
15. Multitest’s contactor chosen by major semiconductor IDM: (Newsflash); 04 August 2010 - Multitest's Gemini™ series contactors have been chosen by another major semiconductor IDM as the contactor of choice for QFN packages. Gemini™ outperformed the competition in multiple categories ...; Created on 04 August 2010
16. Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration: (Component Test); Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration 05 September 2018 - Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both ...; Created on 05 September 2018
17. Tri-Temperature Test of LED Devices in Volume Production: (Component Test); Tri-Temperature Test of LED Devices in Volume Production 16 August 2018 - The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at ...; Created on 16 August 2018
18. Over-the-Air (OTA) Integrated Test Solution for Antenna in Package: (Component Test); Over-the-Air (OTA) Integrated Test Solution for Antenna in Package 28 May 2018 - Multitest delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated ...; Created on 25 May 2018
19. Pick-and-Place Handler Option for avoiding ESD Pre-Damages: (Component Test); Pick-and-Place Handler Option for avoiding ESD Pre-Damages 16 May 2018 - The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is ...; Created on 15 May 2018
20. Quick and easy Test Socket Replacement: (Component Test); Quick and easy Test Socket Replacement 04 May 2018 - Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted ...; Created on 02 May 2018
21. Test of 6DOF Gyro Sensors in Singulated Packages: (Component Test); Test of 6DOF Gyro Sensors in Singulated Packages 22 March 2018 - Multitest launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits ...; Created on 21 March 2018
22. Contactors for Testing Wafer Level Chip Scale Packages: (Component Test); Contactors for Testing Wafer Level Chip Scale Packages 08 March 2018 - Multitest introduced the Gemini Kelvin 050 for 0.5mm pitch contacting for packages with continuously shrinking dies, which are needed ...; Created on 07 March 2018
23. Final Test of singulated WLCSPs: (Component Test); Final Test of singulated WLCSPs 08 February 2018 - Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality ...; Created on 05 February 2018
24. Super-Sharp” Option for Test Probes: (General T&M); “Super-Sharp” Option for Test Probes 24 January 2018 - Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over ...; Created on 22 January 2018
25. RF Contactor compensates for HIB Tolerances: (Component Test); RF Contactor compensates for HIB Tolerances 13 September 2017 - Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending ...; Created on 12 September 2017
26. Contactor for WLCSP Testing in Customer Evaluation: (Component Test); Contactor for WLCSP Testing in Customer Evaluation 22 August 2017 - Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation ...; Created on 20 August 2017
27. Cantilever Contactor Design for MCU and ASIC Testing: (Component Test); Cantilever Contactor Design for MCU and ASIC Testing 10 August 2017 - Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test ...; Created on 09 August 2017
28. Significant Reduction of Soaking Time during Temperature Tests: (Component Test); Significant Reduction of Soaking Time during Temperature Tests 01 August 2017 - Multitest developed an enhanced Soak Booster option for its tri-temp handler MT9928. The Soak Booster cuts down the soak ...; Created on 31 July 2017
29. Test of Pressure Sensors for Automotive Applications: (Component Test); Test of Pressure Sensors for Automotive Applications 16 May 2017 - Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production ...; Created on 12 May 2017
30. Pick-and-Place Handler with additional Temperature Control Features: (Component Test); Pick-and-Place Handler with additional Temperature Control Features 26 April 2017 - The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is ...; Created on 25 April 2017
31. Sensor Test Module for Twin Axis Stimulation: (Component Test); Sensor Test Module for Twin Axis Stimulation 22 December 2016 - Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on ...; Created on 20 December 2016
32. High Multi-Site Test of Pressure Sensors: (Component Test); ... up to 16 bar with an LTX-Credence Diamondx tester, a Multitest InStrip test handler, Xcerra test interfaces and a third party pressure supply unit. In addition to the hardware, Xcerra developed the test ...; Created on 11 December 2016
33. Pick and Place Handler for small Packages below 3 x 3 mm: (Component Test); Pick and Place Handler for small Packages below 3 x 3 mm 10 November 2016 - Multitest expanded the package range for both pick and place handler platforms - the MT9510 and MT2168 - to devices smaller ...; Created on 07 November 2016
34. High Volume Test of environmental Sensors: (Component Test); High Volume Test of environmental Sensors 17 August 2016 - Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest ...; Created on 16 August 2016
35. High Volume Testing of Fingerprint Sensors: (Component Test); High Volume Testing of Fingerprint Sensors 02 August 2016 - Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution ...; Created on 01 August 2016
36. Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages: (Component Test); Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages 30 June 2016 - Multitest introduced the ACE Contactor, which offers optimal RF performance for fine pitch FBGA, QFN and wafer-level ...; Created on 28 June 2016
37. Tri-Temp Gravity Handler supports SOT23 Packages: (Component Test); Tri-Temp Gravity Handler supports SOT23 Packages 21 June 2016 - Multitest recently shipped a high volume test handling solution for SOT23 packages. The innovative conversion kit design allows for tri-temp ...; Created on 20 June 2016
38. Contactor for Large I/O Count BGA Devices: (Component Test); Contactor for Large I/O Count BGA Devices 09 June 2016 - Multitest launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. ...; Created on 08 June 2016
39. Pick-and-Place Handler offers advanced Temperature Control Features: (Component Test); Pick-and-Place Handler offers advanced Temperature Control Features 04 May 2016 - The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio ...; Created on 03 May 2016
40. mmWave Contactor for high Frequency Testing in high Volume Production: (Component Test); mmWave Contactor for high Frequency Testing in high Volume Production 15 March 2016 - Multitest introduced an innovative contacting solution for testing of extremely high frequency semiconductors in ...; Created on 14 March 2016
41. Pick and Place Handler for testing High Voltage Applications up to 10 kV: (Component Test); Pick and Place Handler for testing High Voltage Applications up to 10 kV 21 August 2015 - Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 ...; Created on 19 August 2015
42. Lowering Cost of Test by Reuse of Test Interfaces: (Component Test); Lowering Cost of Test by Reuse of Test Interfaces 09 July 2015 - Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible ...; Created on 08 July 2015
43. Test Module for Magnetic Rotation Sensors: (Component Test); Test Module for Magnetic Rotation Sensors 18 June 2015 - Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module ...; Created on 17 June 2015
44. Pick-and-Place Handler offers one Insertion Multi-Temperature Testing: (Component Test); Pick-and-Place Handler offers one Insertion Multi-Temperature Testing 15 May 2015 - The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic ...; Created on 15 May 2015
45. High g Sensor Test Module for Gravity Handler: (Component Test); High g Sensor Test Module for Gravity Handler 21 April 2015 - Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two ...; Created on 21 April 2015
46. New Loader for Test in Carriers: (Component Test); New Loader for Test in Carriers 19 March 2015 - Multitest launched the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new ...; Created on 18 March 2015
47. High Volume Test and Calibration of Barometric Sensors: (Component Test); High Volume Test and Calibration of Barometric Sensors 24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test ...; Created on 23 February 2015
48. Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells: (Component Test); Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells 10 February 2015 - The Multitest ATC option for the MT2168 pick-and-place handler offers a cost-efficient and flexible ...; Created on 09 February 2015
49. Package Characterization at Cold Conditions: (Component Test); Package Characterization at Cold Conditions 21 November 2014 - The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving ...; Created on 21 November 2014
50. High Volume Test Solution for Magnetic Sensors: (Component Test); High Volume Test Solution for Magnetic Sensors 12 September 2014 - Multitest’s sensor calibration and test equipment for magnetic sensors using Helmholtz coils provide a highly integrated and compact ...; Created on 12 September 2014

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