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1.
Test of 6DOF Gyro Sensors in Singulated Packages
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(Component Test)
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Test of 6DOF Gyro Sensors in Singulated Packages
22 March 2018 - Multitest launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits ...
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Created on 21 March 2018
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2.
Contactors for Testing Wafer Level Chip Scale Packages
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(Component Test)
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Contactors for Testing Wafer Level Chip Scale Packages
08 March 2018 - Multitest introduced the Gemini Kelvin 050 for 0.5mm pitch contacting for packages with continuously shrinking dies, which are needed ...
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Created on 07 March 2018
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3.
Final Test of singulated WLCSPs
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(Component Test)
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Final Test of singulated WLCSPs
08 February 2018 - Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality ...
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Created on 05 February 2018
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4.
Super-Sharp” Option for Test Probes
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(General T&M)
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“Super-Sharp” Option for Test Probes
24 January 2018 - Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over ...
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Created on 22 January 2018
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5.
RF Contactor compensates for HIB Tolerances
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(Component Test)
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RF Contactor compensates for HIB Tolerances
13 September 2017 - Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending ...
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Created on 12 September 2017
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6.
Contactor for WLCSP Testing in Customer Evaluation
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(Component Test)
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Contactor for WLCSP Testing in Customer Evaluation
22 August 2017 - Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation ...
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Created on 20 August 2017
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7.
Cantilever Contactor Design for MCU and ASIC Testing
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(Component Test)
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Cantilever Contactor Design for MCU and ASIC Testing
10 August 2017 - Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test ...
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Created on 09 August 2017
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8.
Significant Reduction of Soaking Time during Temperature Tests
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(Component Test)
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Significant Reduction of Soaking Time during Temperature Tests
01 August 2017 - Multitest developed an enhanced Soak Booster option for its tri-temp handler MT9928. The Soak Booster cuts down the soak ...
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Created on 31 July 2017
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9.
Test of Pressure Sensors for Automotive Applications
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(Component Test)
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Test of Pressure Sensors for Automotive Applications
16 May 2017 - Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production ...
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Created on 12 May 2017
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10.
Pick-and-Place Handler with additional Temperature Control Features
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(Component Test)
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Pick-and-Place Handler with additional Temperature Control Features
26 April 2017 - The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is ...
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Created on 25 April 2017
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11.
Sensor Test Module for Twin Axis Stimulation
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(Component Test)
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Sensor Test Module for Twin Axis Stimulation
22 December 2016 - Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on ...
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Created on 20 December 2016
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12.
High Multi-Site Test of Pressure Sensors
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(Component Test)
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... up to 16 bar with an LTX-Credence Diamondx tester, a Multitest InStrip test handler, Xcerra test interfaces and a third party pressure supply unit. In addition to the hardware, Xcerra developed the test ...
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Created on 11 December 2016
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13.
Pick and Place Handler for small Packages below 3 x 3 mm
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(Component Test)
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Pick and Place Handler for small Packages below 3 x 3 mm
10 November 2016 - Multitest expanded the package range for both pick and place handler platforms - the MT9510 and MT2168 - to devices smaller ...
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Created on 07 November 2016
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14.
High Volume Test of environmental Sensors
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(Component Test)
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High Volume Test of environmental Sensors
17 August 2016 - Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest ...
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Created on 16 August 2016
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15.
High Volume Testing of Fingerprint Sensors
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(Component Test)
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High Volume Testing of Fingerprint Sensors
02 August 2016 - Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution ...
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Created on 01 August 2016
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16.
Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages
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(Component Test)
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Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages
30 June 2016 - Multitest introduced the ACE Contactor, which offers optimal RF performance for fine pitch FBGA, QFN and wafer-level ...
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Created on 28 June 2016
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17.
Tri-Temp Gravity Handler supports SOT23 Packages
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(Component Test)
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Tri-Temp Gravity Handler supports SOT23 Packages
21 June 2016 - Multitest recently shipped a high volume test handling solution for SOT23 packages. The innovative conversion kit design allows for tri-temp ...
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Created on 20 June 2016
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18.
Contactor for Large I/O Count BGA Devices
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(Component Test)
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Contactor for Large I/O Count BGA Devices
09 June 2016 - Multitest launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. ...
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Created on 08 June 2016
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19.
Pick-and-Place Handler offers advanced Temperature Control Features
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(Component Test)
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Pick-and-Place Handler offers advanced Temperature Control Features
04 May 2016 - The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio ...
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Created on 03 May 2016
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20.
mmWave Contactor for high Frequency Testing in high Volume Production
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(Component Test)
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mmWave Contactor for high Frequency Testing in high Volume Production
15 March 2016 - Multitest introduced an innovative contacting solution for testing of extremely high frequency semiconductors in ...
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Created on 14 March 2016
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21.
Multitest expands Contactor Portfolio for WLP / WLCSP Testing ...
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(Component Test)
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Multitest expands Contactor Portfolio for WLP / WLCSP Testing
13 January 2016 - Multitest’s new Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting ...
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Created on 12 January 2016
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22.
Multitest launches HC Contactor for high parallel Test ...
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(Component Test)
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Multitest launches HC Contactor for high parallel Test
09 September 2015 - Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a ...
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Created on 08 September 2015
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23.
Pick and Place Handler for testing High Voltage Applications up to 10 kV
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(Component Test)
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Pick and Place Handler for testing High Voltage Applications up to 10 kV
21 August 2015 - Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 ...
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Created on 19 August 2015
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24.
Lowering Cost of Test by Reuse of Test Interfaces
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(Component Test)
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Lowering Cost of Test by Reuse of Test Interfaces
09 July 2015 - Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible ...
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Created on 08 July 2015
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25.
Test Module for Magnetic Rotation Sensors
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(Component Test)
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Test Module for Magnetic Rotation Sensors
18 June 2015 - Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module ...
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Created on 17 June 2015
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26.
Pick-and-Place Handler offers one Insertion Multi-Temperature Testing
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(Component Test)
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Pick-and-Place Handler offers one Insertion Multi-Temperature Testing
15 May 2015 - The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic ...
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Created on 15 May 2015
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27.
High g Sensor Test Module for Gravity Handler
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(Component Test)
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High g Sensor Test Module for Gravity Handler
21 April 2015 - Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two ...
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Created on 21 April 2015
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28.
Multitest introduces Link Contactors with vertical Probes for IC Test ...
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(Component Test)
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Multitest introduces Link Contactors with vertical Probes for IC Test
26 March 2015 - Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative ...
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Created on 25 March 2015
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29.
New Loader for Test in Carriers
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(Component Test)
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New Loader for Test in Carriers
19 March 2015 - Multitest launched the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new ...
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Created on 18 March 2015
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30.
High Volume Test and Calibration of Barometric Sensors
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(Component Test)
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High Volume Test and Calibration of Barometric Sensors
24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test ...
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Created on 23 February 2015
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31.
Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells
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(Component Test)
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Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells
10 February 2015 - The Multitest ATC option for the MT2168 pick-and-place handler offers a cost-efficient and flexible ...
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Created on 09 February 2015
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32.
Package Characterization at Cold Conditions
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(Component Test)
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Package Characterization at Cold Conditions
21 November 2014 - The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving ...
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Created on 21 November 2014
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33.
High Volume Test Solution for Magnetic Sensors
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(Component Test)
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High Volume Test Solution for Magnetic Sensors
12 September 2014 - Multitest’s sensor calibration and test equipment for magnetic sensors using Helmholtz coils provide a highly integrated and compact ...
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Created on 12 September 2014
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34.
Strip Test for Automotive Applications
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(Component Test)
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... because singulation of the packages would have to take place after testing. Multitest’s InCarrier concept overcomes these issues and combines the substantial advantages of the strip handling process with ...
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Created on 28 August 2014
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35.
Improved Power Delivery for High Performance Load Boards
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(Component Test)
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Improved Power Delivery for High Performance Load Boards
10 June 2014 - Multitest improved the electrical performance of load boards used for device test by applying capacitor implants and embedded ...
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Created on 10 June 2014
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36.
Xcerra is the new parent Company of LTX, atg, ETC and Multitest ...
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(General T&M)
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Xcerra is the new parent Company of LTX, atg, ETC and Multitest
28 May 2014 - Xcerra Corporation is the new parent company of four brands that have been supplying innovative products and services to ...
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Created on 28 May 2014
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37.
MEMS Microphone Test Handler
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(Component Test)
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MEMS Microphone Test Handler
30 April 2014 - Multitest shipped the first MEMS Microphone Test Module that achieves a unique 65dbA signal to noise ratio over the whole frequency range of 20 Hz up to ...
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Created on 30 April 2014
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38.
Test Handler Solution for 3+2 Axis MEMS Magnetic Sensors
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(Component Test)
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Test Handler Solution for 3+2 Axis MEMS Magnetic Sensors
17 December 2013 - Multitest shipped the first MEMS tri-temp test handler solution for 3-axis magnetometer plus 2-axis low g-test and calibration. ...
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Created on 17 December 2013
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39.
LTX-Credence to acquire Multitest and Everett Charles Technologies ...
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(Component Test)
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LTX-Credence to acquire Multitest and Everett Charles Technologies
16 September 2013 - LTX-Credence announced an agreement to acquire Multitest and Everett Charles Technologies (ECT) from Dover Corporation. ...
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Created on 16 September 2013
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40.
Multitest doubles throughput of MT9510 Pick-and-Place Handler ...
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(Component Test)
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Multitest doubles throughput of MT9510 Pick-and-Place Handler
27 August 2013 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards, announced a special “Jumbo” ...
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Created on 27 August 2013
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41.
Kelvin Contactor for High Power Applications proves Performance
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(Component Test)
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Kelvin Contactor for High Power Applications proves Performance
06 May 2013 - Multitest announces that its ecoAmp high power Kelvin contactor successfully passed a challenging evaluation for an automotive ...
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Created on 06 May 2013
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42.
Multitest presents a new Contacting Unit Holder ...
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(Component Test)
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Multitest presents a new Contacting Unit Holder
19 April 2013 - Multitest, a designer and manufacturer of final test handlers, announces the new Access+ contact unit holder (CUH) for the MT9510 test ...
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Created on 19 April 2013
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43.
Test Handler for Gesture Recognition IC
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(Component Test)
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Test Handler for Gesture Recognition IC
14 March 2013 - Melexis, a mixed signal semiconductor manufacturer headquartered in Belgium, has chosen Multitest’s Standard MT9510 Pick and Place Test Handler ...
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Created on 14 March 2013
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44.
Free Expert Knowledge for Semiconductor Testing
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(Newsflash)
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11 December 2012 – Multitest launched its Expert Portal which offers free downloads of presentations and articles created by Multitest experts. The papers cover important topics and issues encountered ...
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Created on 11 December 2012
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45.
VP of Multitest became Member of EMTC ...
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(Newsflash)
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16 October 2012 - James Quinn, Vice President of Marketing and Sales of Multitest, was appointed as the latest member of the European Manufacturing Test Conference Committee (EMTC). The EMTC committee ...
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Created on 16 October 2012
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46.
Kelvin Contactor Repair and Refreshment
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(Component Test)
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... for various types of Kelvin Contact sets with tungsten probes on a variety of Multitest handler platforms.
Examples of typical savings are:
Needles and pcb are defective and have to be exchanged ...
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Created on 06 September 2012
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47.
Pick-and-Place Test Handler with full Device Traceability
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(Component Test)
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Pick-and-Place Test Handler with full Device Traceability
15 August 2012 - Multitest now offers its pick-and-place test handler MT2168 with optional 2D code reader to ensure 100 percent device traceability ...
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Created on 15 August 2012
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48.
Multitest introduces Signal Integrity and Power Glossary ...
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(Newsflash)
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07 August 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, introduces ...
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Created on 07 August 2012
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49.
High Performance Test Solution for Power Applications
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(Component Test)
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High Performance Test Solution for Power Applications
30 July 2012 - The Multitest MT9928 gravity handler ideally supports the special features of the recently launched ecoAmp Kelvin contactor. Field ...
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Created on 30 July 2012
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50.
Multitest’s Solution for 3D Packages Released to Production ...
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(Component Test)
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Multitest’s Solution for 3D Packages Released to Production
10 July 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers ...
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Created on 10 July 2012
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