-
1.
Integration of JTAG Solutions in Teradyne In-Circuit Platform
-
(Board test)
-
Integration of JTAG Solutions in Teradyne In-Circuit Platform
18 May 2017 - The integration of the Embedded JTAG Solutions from GOEPEL electronic increases the test scope of the TSi-052 In-Circuit tester ...
-
Created on 17 May 2017
-
2.
Teradyne acquires Pioneer of Collaborative Robots
-
(General T&M)
-
Teradyne acquires Pioneer of Collaborative Robots
23 June 2015 - Teradyne announced that it will acquire privately held company Universal Robots, a Danish pioneer of collaborative robots, for $285 million ...
-
Created on 23 June 2015
-
3.
Teradyne offers Real-time and Offline Test Data Analysis Software
-
(Component Test)
-
Teradyne offers Real-time and Offline Test Data Analysis Software
16 June 2015 - Teradyne announced that it entered into an OEM agreement to provide an integrated, advanced analysis capability for Teradyne' ...
-
Created on 15 June 2015
-
4.
Teradyne launched new ETS-800 Test System
-
(Component Test)
-
Teradyne launched new ETS-800 Test System
19 May 2015 - Teradyne announced the availability of the ETS-800 test system designed to further drive down the cost of test in the linear, power and automotive ...
-
Created on 18 May 2015
-
5.
Teradyne acquired Avionics Interface Technologies
-
(General T&M)
-
Teradyne acquired Avionics Interface Technologies
22 December 2014 - Teradyne has acquired substantially all of the assets of Avionics Interface Technologies, LLC, a provider of equipment for testing ...
-
Created on 22 December 2014
-
6.
Corelis and Teradyne cooperate to integrate Boundary Scan Software
-
(Board test)
-
Corelis and Teradyne cooperate to integrate Boundary Scan Software
16 December 2014 – Corelis, a supplier of boundary-scan test and measurement tools in collaboration with Teradyne announced integration ...
-
Created on 16 December 2014
-
7.
XJTAG releases Boundary Scan for Teradyne TestStation
-
(Board test)
-
XJTAG releases Boundary Scan for Teradyne TestStation
04 November 2014 – XJTAG announced the release of the XJLink2-CFM and XJLink2-CFMx. The new modules provide Teradyne users with integrated access ...
-
Created on 04 November 2014
-
8.
Teradyne and Test Insight partner to Shorten IC Design Cycle Times
-
(Component Test)
-
Teradyne and Test Insight partner to Shorten IC Design Cycle Times
10 July 2014 - Teradyne and Test Insight released new pattern conversion solutions for UltraFLEX digital instruments to reduce design ...
-
Created on 10 July 2014
-
9.
Inline Test Handler for Teradyne Test System
-
(Board test)
-
Inline Test Handler for Teradyne Test System
10 April 2014 - ENGMATEC developed a test handler for the Inline Test Station TSi of Teradyne. The TSi test system is positioned directly below the contacting ...
-
Created on 10 April 2014
-
10.
Boundary Scan Solution for Teradyne Board Tester
-
(Board test)
-
Boundary Scan Solution for Teradyne Board Tester
30 January 2014 - GOEPEL electronic and Teradyne developed an extended Boundary Scan option particularly for production In-Circuit Test/Functional ...
-
Created on 30 January 2014
-
11.
Mark Jagiela named Teradyne President
-
(General T&M)
-
Mark Jagiela named Teradyne President
03 December 2012 - Teradyne announced that Mark E. Jagiela has been appointed President of Teradyne, effective January 1, 2013. Mike Bradley will continue as the ...
-
Created on 03 December 2012
-
12.
ASSET integrates ScanWorks with Teradyne’s PXI Express Instruments
-
(Board test)
-
ASSET integrates ScanWorks with Teradyne’s PXI Express Instruments
18 September 2012 – ASSET InterTech and Teradyne have extended the integration of the JTAG and boundary-scan test capabilities of ...
-
Created on 18 September 2012
-
13.
Teradyne increases J750 Platform Throughput and Test Coverage
-
(Component Test)
-
Teradyne increases J750 Platform Throughput and Test Coverage
17 July 2012 - Teradyne announces the availability of the High Density Device Power Supply (HD DPS) instrument for the J750 and IP750 test ...
-
Created on 17 July 2012
-
14.
Teradyne and Corelis enter Boundary-Scan OEM Agreement
-
(Board test)
-
Teradyne and Corelis enter Boundary-Scan OEM Agreement
23 May 2012 – Teradyne announced that it has entered into an OEM agreement with Corelis, Inc. to sell and distribute a package of Corelis ScanExpress ...
-
Created on 23 May 2012
-
15.
Multi-TAP JTAG Solution for Teradyne ICTs
-
(Board test)
-
Multi-TAP JTAG Solution for Teradyne ICTs
24 April 2012 – Following the recent USB-1149.1/CFM announcement showcasing a high-performance single-channel JTAG hardware platform for Teradyne ICTs, Corelis, ...
-
Created on 24 April 2012
-
16.
Teradyne revamps Support Network Program
-
(Board test)
-
Teradyne revamps Support Network Program
12 April 2012 - The Teradyne Support Network (TSN) from Teradyne is a program designed to help manufacturers find high-quality service and support products ...
-
Created on 12 April 2012
-
17.
Teradyne introduces PXI functional Expansion Board
-
(Board test)
-
Teradyne introduces PXI functional Expansion Board
30 November 2011 – Teradyne introduces the PXI Functional Expansion Board for their TestStation family of In-Circuit Test systems. The PXI Functional ...
-
Created on 30 November 2011
-
18.
Advanced JTAG Solution for Teradyne In-Circuit Testers
-
(Board test)
-
Advanced JTAG Solution for Teradyne In-Circuit Testers
07 October 2011 – Corelis, Inc. announced the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test ...
-
Created on 07 October 2011
-
19.
Teradyne to acquire LitePoint
-
(Newsflash)
-
04 October 2011 - Teradyne announced it has signed a definitive agreement to purchase privately held LitePoint Corporation, a leading provider of production line test equipment for wireless products including ...
-
Created on 04 October 2011
-
20.
Teradyne and ASSET collaborate on Boundary-Scan Board Test
-
(Board test)
-
Teradyne and ASSET collaborate on Boundary-Scan Board Test
03 October 2011 - ASSET InterTech and Teradyne have collaborated to integrate the boundary-scan test capabilities of ASSET's ScanWorks platform ...
-
Created on 03 October 2011
-
21.
Teradyne expands Magnum’s Analog Test Performance
-
(Component Test)
-
Teradyne expands Magnum’s Analog Test Performance
25 July 2011 - Teradyne, Inc. announces the availability of the MPAC (Magnum Precision Analog Channel) instrument for the Magnum family of test systems ...
-
Created on 25 July 2011
-
22.
Teradyne and JTAG Technologies announce Boundary Scan Product Collaboration
-
(Board test)
-
Teradyne and JTAG Technologies announce Boundary Scan Product Collaboration
14. April 2011 - Teradyne, Inc. announced an agreement with JTAG Technologies to sell and distribute their Symphony/TS boundary ...
-
Created on 14 April 2011
-
23.
Teradyne announces Sale of Automotive System Test Unit
-
(Newsflash)
-
23 February 2011 - Teradyne, Inc. announced that it has reached an agreement to sell its Automotive Diagnostic Solutions unit to SPX Corporation. Diagnostic Solutions, which serves transportation OEMs, ...
-
Created on 23 February 2011
-
24.
Teradyne Extends Partnership with Accelonix in Europe
-
(General T&M)
-
Teradyne Extends Partnership with Accelonix in Europe
05 October 2010 -Teradyne, Inc. has entered into a distribution agreement with Accelonix in the United Kingdom and Ireland to satisfy increasing ...
-
Created on 05 October 2010
-
25.
Real-time Semiconductor Analytics
-
(Component Test)
-
... announcement is highlighted by a new enablement layer within the NI GO ecosystem and initial integration with leading ATE vendor, Teradyne.
Increasing quality, yield, throughput, and functionality ...
-
Created on 17 October 2023
-
26.
Corelis lauched new Version of Boundary-Scan Software Suite
-
(Board test)
-
... hardware or integrated into Teradyne testers with the QuadTAP/CFM and expander cards.
ScanExpress JET now supports Marvell OCTEON III CN7200 Multi-Core MIPS64 Processors and Texas Instruments TMS320C6748 ...
-
Created on 19 September 2019
-
27.
Corelis launched new Version Boundary-Scan Tool Suite
-
(Board test)
-
Corelis launched new Version Boundary-Scan Tool Suite
11 March 2019 – Corelis announced the availability of version 9.2 of its ScanExpress Boundary-Scan Tool Suite. The new software update features Teradyne ...
-
Created on 11 March 2019
-
28.
New Generation of connected Multi-TAP JTAG Controllers
-
(Board test)
-
... also been jointly working with Teradyne to enhance boundary-scan integration with Teradyne’s High Speed Subsystem (HSSub). New features of this product include fast-flash programming, general purpose I/O ...
-
Created on 18 September 2018
-
29.
Testing Service for CMOS Image Sensor Wafers
-
(Component Test)
-
... sharp images, as well as other 4K resolution cameras. The tester is located in Presto's EAL 5/6+ facilities so that it meets the security needs of sensitive applications.
Presto's Teradyne IP750Ex based ...
-
Created on 28 March 2018
-
30.
Product Focus: Oscilloscopes
-
(Focus)
-
...
Spectrum
x
x
x
x
Tektronix
x
x
x
x
x
x
Teledyne LeCroy
*
x
x
x
x
x
Teradyne
x
x
x ...
-
Created on 11 May 2017
-
31.
The Peak Group and Equip-Test offer Test Support across Europe
-
(Board test)
-
... ICT fixtures for users of systems from Agilent, Teradyne, etc., but expect that to expand as the partnership develops. For our part we will now be able to offer custom designed functional test systems ...
-
Created on 02 March 2016
-
32.
Corelis releases new Version 8.0 of Boundary-Scan Tool Suite
-
(Board test)
-
... documentation, and additional resources.
Support for Teradyne Di-Series modules and FTDI FT2232 ICs as JTAG controllers.
Current Corelis customers with a valid maintenance contract can now access ...
-
Created on 04 July 2014
-
33.
LitePoint Cellular Test Platform integrated into Intel Communications Calibration Tool
-
(Component Test)
-
... from Intel to qualified customers.
LitePoint, a wholly owned subsidiary of Teradyne, Inc. , is based in Sunnyvale, California. The company designs, develops and supports advanced wireless test solutions ...
-
Created on 14 February 2014
-
34.
Acculogic's new Flying Prober to Make European Debut at Productronic
-
(Board test)
-
... translation and a fixture adapter, to port Teradyne Z1800 test programs and fixtures to Acculogic’s In-Circuit SCORPION testers.
Additionally, company representatives will be performing Boundary Scan ...
-
Created on 11 November 2013
-
35.
LitePoint acquires ZTEC Instruments
-
(Component Test)
-
... wireless test products, located in Albuquerque, New Mexico and Orlando, Florida. LitePoint, a wholly owned subsidiary of Teradyne, is based in Sunnyvale, California.
“Our goal is always to provide ...
-
Created on 04 November 2013
-
36.
PXI Test Platform to replace legacy VXI-based Systems
-
(General T&M)
-
... Geotest Enhanced ATE System (GENASYS) platform offers digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, and VXI-based ...
-
Created on 26 October 2012
-
37.
Interview: Pre-owned systems are in-line with the market trend
-
(Board test)
-
... for products which are no longer manufactured, e.g. AXI systems from Agilent, Teradyne or Genrad. We can cover most of the machines. For the more common systems we maintain a well equipped spare parts ...
-
Created on 29 November 2011
-
38.
ASTER adds “Design-to-Test” to their DfT Solutions
-
(Board test)
-
... the test files for assembly, X-Ray, optical inspection, flying-probe, in-circuit and boundary-scan machines such as MYDATA; Agilent i3070, Agilent 5DX; Teradyne GR228x, TestStation, Z1800 and Spectrum; ...
-
Created on 09 November 2011
-
39.
JTAG Technologies: New Boundary Scan Solutions for Design, Engineering and Production
-
(Board test)
-
... test strategy with high coverage for digital and analog in one platform.
Symphony can be integrated within many of today's popular test systems such as : SPEA, Agilent, Digitaltest, Macpanel, Teradyne, ...
-
Created on 02 November 2011
-
40.
Interview: 25 Years Seica
-
(Board test)
-
... close working relationship first with Computer Automation, then GenRad and Teradyne, in the U.S. As our customer base has grown in different areas, we have opened local offices to offer direct support ...
-
Created on 24 October 2011
-
41.
Hardware and Software Solutions reduce Cost of Semiconductor Test
-
(Component Test)
-
... aimed at reducing the cost of test and minimizing CAPEX. The X750 is a new instrument that significantly increases the power density capabilities of the Teradyne J750 platform and MapWareHouse is a new ...
-
Created on 04 October 2011
-
42.
TestWay Express explores “yield estimation”
-
(Board test)
-
... Mirtec; MYDATA, OMRON; Orbotech; SAKI; SEICA; SPEA (3030, 4040); TAKAYA (APT8000, APT9000); Teradyne (Z1800, Spectrum, GR228x, TS124); TRI (TR7500, TR8001); VI Technology; VISCOM; XJTAG and YESTech.
...
-
Created on 17 November 2010
|
More events... See our Trade Show Calendar Click here
|