|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component TestShort Link between EDA Environment and Device Tester23 May 2019 - Advantest Corporation has extended the capabilities of its V93000 SmarTest software with SmartShell, a new software bridge enabling direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor, a Siemens business. EDA tools can now connect to a tester remotely through an online network, send test patterns for execution, modify them and retrieve results and failure information directly instead of going through multiple format conversions. Testing of High-Res Audio ICs16 May 2019 - Advantest introduced its GPWGD high-resolution module featuring the industry’s highest analog-performance digitizer, which supports testing of high-resolution audio digital-to-analog converters (DACs) embedded in power-management ICs (PMICs) as well as stand-alone high-resolution audio devices. Dynamic Power Device Analyzer15 May 2019 - Keysight Technologies announced a new dynamic power device analyzer with double-pulse tester (PD1500A) to deliver reliable, repeatable measurements of wide-bandgap (WBG) semiconductors, while ensuring the safety of the measurement hardware and the professionals performing the tests. Multi-Site Testing of 5G-NR mmWave Devices up to 70 GHz13 May 2019 - Advantest extended its V93000 system to cost-efficiently test the next generation of 5G-NR radio frequency devices and modules on a single scalable platform. The new V93000 Wave Scale Millimeter solution has the high multi-site parallelism and versatility needed for multi-band millimeter-wave (mmWave) frequencies. aps Solutions signs Distribution and Service Agreement with Everbeing International05 April 2019 - aps Solutions GmbH (“APS”) announces a distributor and service agreement with Everbeing International Corp. („EBI“), a Taiwanese Analytical Probe Station manufacturer, focused on high precision and affordable probing solutions. The exclusive sales and service territories are D-A-CH (Germany, Austria and Switzerland) and the countries of Scandinavia. X-ray Inspection Systems for the Semicon Industry03 April 2019 - YXLON International, a division of the Swiss Comet Group, launched a range of X-ray inspection systems dedicated to the Semicon industry. These systems offer advanced automated 2D and 3D inspection of bumps and filled vias to locate, identify and measure failures, including non-wetted bumps, voiding and misalignments to the highest standard. In terms of resolution these systems are among the best on the worldwide market. aps Solutions sells Chip contacting Technology of ProbeAce in Europe and Israel19 March 2019 - aps Solutions GmbH (“APS”) announced signing a Memorandum Of Understanding (MOU) with ProbeACE („PA“), an innovative Japanese Probe Card manufacturer, for exclusive Distribution of PA’s contactor technologies in EU and Israel. ProbeAce recently announced their “Fine-Pitch Area-Array Probe-Unit”, a Contactor solution, which is focusing on the increasing market of IoT (Internet of Things) devices as the versatile multi-connection technology as well as FOWLP (Fan-Out Wafer Level Package) package testing. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |