|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component Test
Functional and Capacity testing of e-bike Batteries16 April 2014 – batteryuniversity.eu introduced the ATGF 1500 multifunction battery test equipment for rechargeable batteries and battery chargers. The tester is tailored to meet the needs of electric bicycle (e bike) specialized dealers and is available from batteryuniversity.eu starting May, 2014. The easy-to-use ATGF 1500 is suitable for almost all e bike rechargeable battery systems used by the e bike manufacturers Derby Cycle, Gazelle, Simplon and ZEG.
LTX-Credence launches new Tester for Low Cost RF Devices15 April 2014 - LTX-Credence announced the second generation X-Series PAx test system, the PAx-ac. The PAx-ac is specifically designed to deliver the lowest cost of test for high performance, high volume manufacturing of RF front end mobility devices designed for the 802.11ac 160MHz and LTE Advanced modulation standards. PAx-ac test system was developed to address the test challenges presented by the latest generation of advanced front end RF devices used in 4G and 5G applications.
Interview: We offer Test Hardware and Test IP on a Subscription ModelAdvantest introduced in September 2013 a new revolutionary semiconductor test solution named CloudTesting. The new concept is targeted for silicon validation and debugging and offered only as a service. All-about-Test talked to Mr. Manabu Kimura, President and Representative Director of Cloud Testing Service, Inc. asubsidiary of Advantest, about the success of this new business model.
Network Analyzer for Active Device Tests with 8.5 GHz07 April 2014 – Agilent Technologies expanded its flexible PNA-X family of network analyzers with an 8.5 GHz model that more economically supports lower-frequency devices used in wireless communication applications (e.g., handsets, base stations, WLAN and other mobile communication devices). With low-noise amplifier tests there are typically multiple test stations, such as small signal gain/match, distortions and noise figure; the PNA-X integrates these test stations into one.
High-Volume Testing of Ultra-Fast SerDes Applications04 April 2014 - Advantest Corporation introduced its newest digital channel card, the Pin Scale Serial Link (PSSL) card, for at-speed characterization and volume production of today’s high-speed semiconductors. PSSL is the fastest fully integrated automated test equipment (ATE) instrument on the market, capable of data rates up to 16 Gbps.
SEMI expects 2014 Fab Equipment Spending to Increase 20-30 Percent03 April 2014 - The latest release of the SEMI World Fab Forecast reveals a 20 to 30 percent projected increase in fab equipment spending in 2014. The uptick to 30 percent depends on specific fab projects in the Europe/Mideast and Asia regions, as detailed in the report. For 2014, the report identified over 190 fab projects spending on construction and/or equipment and over such 250 projects in 2015 (including Discretes, LED, Analog and Logic fabs).
CAMTEK announces Semiconductor Inspection and Metrology Platform02 April 2014 – Camtek started the customer evaluation of its next generation Semiconductor Inspection and Metrology platform designed for the Advanced Packaging market. The new systems deliver unparalleled 2D and 3D inspection and metrology capabilities for wafers, both before and after testing, along the bumping process or after dicing. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |