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News - Component TestIC Tester Modules containing Digital, Power, and PMU Resources10 October 2012 - OpenATE announced two self-contained IC tester modules, each containing Digital, Power, and PMU resources. The new PE16A provides 16 programmable input or output channels, along with 2 PMU and 2 DPS resources. The new PEMU32 is a combo module with a high voltage PMU, a DPS, and a dynamic digital pin electronic card. Advantest establishes new Subsidiary Cloud Testing Service, Inc.05 October 2012 - Advantest established a new subsidiary to conduct sales of its CloudTesting Service, which provides test solutions utilizing IT and cloud computing technology. Fusing cutting-edge test technology with cloud computing, Advantest’s new CloudTestingTM Service represents a new concept in semiconductor test: on-demand test solutions tailored precisely to customer needs. Solar Array Simulator offers highest Bandwidth and Isolation Voltage27 September 2012 – AMETEK Programmable Power has expanded its Elgar TerraSAS line with the ETS Series Standalone Photovoltaic (PV) Simulator. The new Series includes three models for testing PV inverters across a wide spectrum of applications. For microgrids, energy storage, and inverter test applications, TerraSAS PV Simulators are specifically designed to emulate the dynamic electrical behavior of a terrestrial PV solar array. KLA-Tencor announces new Overlay Metrology System25 September 2012 - KLA-Tencor Corporation announced the Archer 500, a new overlay metrology system for chip manufacturers. Designed to address the complex overlay challenges associated with single- and multi-patterning lithography techniques at advanced design nodes, the Archer 500 measures and characterizes overlay error with improved precision, accuracy and measurement speed compared to its predecessor, the widely adopted Archer 300. Regenerative Battery Pack Test System24 September 2012 - The Chroma 17020 System is a high precision integrated solution specifically designed for secondary battery module and pack tests. Accurate source and measurement ensure the test quality that is suitable for performing exact, reliable testing crucial for battery module / pack incoming or outgoing inspection as well as capacity, performance, production and qualification testing. KLA-Tencor announces new Reticle Inspection Systems12 September 2012 - KLA-Tencor Corporation announced two new additions to the company's IC fab-based reticle inspection portfolio: the X5.2 and Teron 611 systems. As the latest offering in the successful 5XX product line, the new X5.2 applies its high performance to capture defects and pattern degradation on masks currently in production, with extended capability for the upcoming 20nm node. The Teron 611 is designed for the 20nm node and beyond, offering technology-enabling sensitivity to inspect masks at the leading edge of IC production. Kelvin Contactor Repair and Refreshment06 September 2012 - aps Solutions GmbH offers Kelvin Contactor repair and refreshment as an alternative to buying new. This budget friendly service is available for various types of Kelvin Contact sets with tungsten probes on a variety of Multitest handler platforms. More Articles ...
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