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Readers Top 5 News of last 30 days
News - Component TestNew high performance Impedance Measurements13 May 2022 - Rohde & Schwarz extended its LCR meters with a completely new family of high performance instruments to cover AC components operating from 4 Hz to 10 MHz. The R&S LCX family of LCR meters serves all established impedance measurements plus specialized measurements for selected component types and provides both, the high accuracy required in R&D, and the high speed needed in production test and quality assurance. High Performance Impedance Measurements04 May 2022 - Rohde & Schwarz launched a new LCR meter family of high performance general purpose impedance testers covering a wide range of applications. With its supported frequency range from 4 Hz to 10 MHz, the R&S LCX is suitable not only for the vast majority of devices operating at conventional 50 or 60 Hz domestic power frequencies or 400 Hz for aircraft, but also for everything from low frequency seismic sensors to high power communication circuits operating at several Megahertz. Low Compliance Voltage Ohmmeter30 March 2022 - Saelig Company introduced the AltoNovus OR-01 OhmRanger-LCV Low Compliance Voltage Ohmmeter, an accurate, affordable, portable meter which can measure a wide range of resistances simply and quickly. Individually factory-calibrated, this meter measures resistances from greater than 100Mohms down to 10 Ohms. Additional built-in features include a signal-to-noise measurement, which indicates how much noise, variation, and AC elements are in the signal, as well as maximum and minimum current samples during the reading. Higher resistances (lower currents) are more susceptible to noise errors. LIV Test Systems for Laser Diodes10 March 2022 – Instrument Systems will be showcasing its extensive test portfolio of IR emitters and VCSELs. New product developments in the fields of spectroradiometers of the CAS series and the VTC near-/far-field cameras serve the fast-growing market for laser diode production in the short-wave infrared range of 900 to 1700 nm. Laser diodes can be optically characterized in detail with the appropriate LIV test equipment – additionally consisting of integrating spheres, photodiodes, source-measure-units (SMUs) and temperature controllers. The software application SpecWin Pro supports the characterization of laser diodes by integrating and precisely synchronizing all measuring instruments, as well as numerical and graphical analysis of the data. 16-Channel PXI Device Power Supply17 January 2021 - Marvin Test Solutions released the new GX3116e, 16-Channel Device Power Supply (DPS) / Source Measure Unit (SMU). The GX3116e DPS is a high density, flexible multichannel semiconductor device power supply solution. True 4-quadrant operation, isolated outputs, ganging capabilities for higher current, and extensive health monitoring and alarms make this the ideal solution for a multitude of semiconductor test applications. Testing CIS Devices Used in high-resolution Smart Phones11 January 2022 – Advantest started shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). When integrated on the proven T2000 ISS platform, the new T2000 IP Engine 4 (Image Processing Engine 4) system provides the optimal means of evaluating the latest high-resolution, high-speed CIS devices used in advanced smart phone cameras. Parallel Parametric Test System offers cost-effective Wafer Test10 January 2022 – Keysight Technologies announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing. It features a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource. More Articles ...
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