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Readers Top 5 News of last 30 days
News - Component TestMemory Tester for advanced DRAMs and NAND Flash Devices17 December 2021 – Advantest announced the newest cost-efficient, high-volume memory tester in its industry-leading T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices. The T5835can handle 768 devices simultaneously for final package-level testing. Test Solution for NAND/Nonvolatile Flash Memory ICs08 December 2021 – Advantest Corporation introduced a new high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering highly accurate timing, repeatability and failure detection. With data-transfer speeds that are more than five times faster than its predecessor, the new T5221 system is designed to improve production efficiencies while reducing test costs for wafer sorting, built-in self-testing (BIST) and wafer-level burn-in (WLBI). Probe Card Technology for PIC Wafer Level Testing22 November 2021 - Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the test ecosystem is still under development. Jenoptik provides an essential component for novel PIC wafer level tests with the opto-electronic UFO Probe Card. RoodMicrotec uses this technology and benefits from a fast and simple integration, high flexibility, and state-of-the-art test technology. Software-Based Functional Test for complex SoCs19 November 2021 – Advantest Corporation launched its new Link Scale family of digital channel cards for the V93000 platform, enabling software-based functional testing and USB/PCI Express (PCIe) SCAN testing of advanced semiconductors. The new cards address testing challenges that require these interfaces to run in full protocol mode, adding system-like test capabilities to the V93000. Advantest acquires R&D Altanova04 November 2021 – Advantest announced that it has entered into an agreement to acquire US based R&D Altanova, Inc. R&D Altanova is a supplier of consumable test interface boards, substrates and interconnects for high-end applications, offering simulation, design, layout, fabrication and assembly of test interface boards which are used by testing equipment in the testing of advanced integrated circuits. Dynamic Parametric Test Solution for Semiconductor Production05 October 2021 – Advantest and PDF Solutions have launched their first jointly developed offering since forming a partnership in July 2020. The new Advantest Cloud Solutions (ACS) Dynamic Parametric Test (DPT) powered by PDF Exensio solution is already being used in production by a large integrated device manufacturer. ACS is a highly secure single scalable data platform enabling an open solution ecosystem that helps customers address the most pressing challenges of the Smart Manufacturing era. Parametric Test System speeds Semiconductor Chip Production23 September 2021 - Tektronix released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most. New options made available for the first time with the KTE V7.1 release include a new parallel test capability and a unique high-voltage capacitance test option for emerging power and wide bandgap applications. KTE V7.1 improves test times more than 10 percent versus KTE V5.8, which means engineers can reduce downtime and make chips faster. More Articles ...
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