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Readers Top 5 News of last 30 days
News - Component TestAdvantest acquires R&D Altanova04 November 2021 – Advantest announced that it has entered into an agreement to acquire US based R&D Altanova, Inc. R&D Altanova is a supplier of consumable test interface boards, substrates and interconnects for high-end applications, offering simulation, design, layout, fabrication and assembly of test interface boards which are used by testing equipment in the testing of advanced integrated circuits. Dynamic Parametric Test Solution for Semiconductor Production05 October 2021 – Advantest and PDF Solutions have launched their first jointly developed offering since forming a partnership in July 2020. The new Advantest Cloud Solutions (ACS) Dynamic Parametric Test (DPT) powered by PDF Exensio solution is already being used in production by a large integrated device manufacturer. ACS is a highly secure single scalable data platform enabling an open solution ecosystem that helps customers address the most pressing challenges of the Smart Manufacturing era. Parametric Test System speeds Semiconductor Chip Production23 September 2021 - Tektronix released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most. New options made available for the first time with the KTE V7.1 release include a new parallel test capability and a unique high-voltage capacitance test option for emerging power and wide bandgap applications. KTE V7.1 improves test times more than 10 percent versus KTE V5.8, which means engineers can reduce downtime and make chips faster. Automated Test Solution for Silicon Photonics Wafer21 September 2021 - Keysight announced the new NX5402A Silicon Photonics Test System integrated with Keysight PathWave Semiconductor Test software technology (part of Keysight PathWave Test software), which enables semiconductor manufacturers to speed delivery of silicon photonics wafer production with stable and repeatable test capabilities. Metrology Platform for Semiconductor Manufacturing Processes21 July 2021 – Atonarp, a manufacturer of molecular sensing and diagnostics products for the semiconductor, healthcare, and pharma industries, announced Aston, an innovative in-situ semiconductor metrology platform with an integrated plasma ionization source. Aston is a major evolution in metrology for semiconductor production processes, enabling in-situ molecular process control and allowing existing fabs to run more efficiently, driving higher output. Advantest broadens Activities in India19 July 2021 – Advantest will rebrand its subsidiary in Chennai, Tamil Nadu, India under the corporate mantle and will expand its support of customer initiatives in the region as investments continue to grow. Effective June 18, 2021, w2bi Mobile Technologies Pvt. Ltd. (WMTI), became Advantest India Private Limited (AIN), a wholly owned subsidiary of Advantest America, Inc. The name change will allow Advantest to promote its brand and naming convention across subsidiaries and around the globe. Innovative Methodologies for High-Speed Scan and Software-Based Functional Testing25 June 2021 - Advantest Corporation is pilot testing a next-generation solution for performing both high-speed scan testing and software-driven functional device testing on the V93000 platform by leveraging the existing high-speed serial I/O interfaces on advanced integrated circuits (ICs). This novel approach can correlate scan testing results between established and new test routines, boot up and execute on-chip test software and achieve a seamless end-to-end data flow in conjunction with Advantest’s partners in electronic design automation (EDA). More Articles ...
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