|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
News about Component Test
Advantest announces new Memory Test System
06 June 2012 - Advantest Corporation announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components. The system will be launched at Advantest’s corporate exhibition, ADVANTEST EXPO 2012, to be held on June 6th - 7th in Tokyo.
A New Solution for Commodity DRAM Test Cost Reduction
Dynamic random access memory (DRAM) is the most commonly used type of commodity memory device for servers and client PCs, and is also used extensively in mobile applications. Solid bit growth in DDR3-SDRAM and DDR4-SDRAM, the dominant types of PC memory, augurs continuing market expansion. Meanwhile, the low-power requirements of smart phones and tablets underpin forecasts of rapidly growing demand for LPDDR2-SDRAM and LPDDR3-SDRAM. Yet the ongoing commodification of DRAM is driving down prices and forcing chipmakers to seek greater COT (cost of test) savings on their volume production lines. Backend DRAM test is commonly subdivided into memory core test and at-speed test. Advantest’s new T5811 memory test system offers a dramatic contribution to lower COT by focusing on core test.
ETH Technology Dramatically Reduces COT
Advantest’s Enhanced Test Head (ETH) technology, a proprietary BOST configuration, holds down the cost of the tester mainframe by locating virtually all tester functionality on the motherboard in close proximity to the DUTs. ETH technology also enables upgradability via a simple switch-out of the Enhanced Test Module (ETM) component, allowing users to add functionality and improve test speed at will—contributing to significant COT reduction in the future as well as in the present.
90% Lower Power Consumption, 2/3rds Smaller Footprint
The T5811 lowers power consumption by 90% and floor-space requirements by two-thirds, compared to previous testers, by utilizing Advantest’s proprietary ETH technology to locate virtually all tester functionality on the motherboard.
Simple Test Program Creation
The T5811 runs Advantest’s “Future Suite” tester OS, allowing operators to utilize the extensive library of program data created for T5xxx series test systems, regardless of whether BOST configuration is utilized.
Target devices: LPDDR2/3-SDRAM, DDR3-SDRAM and DDR4-SDRAM cores
Parallel test capacity: 512 (x8 I/O)
Maximum test speed: 600MHz / 1.2Gbpswww.advantest.com
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
© All about Test 2016