Geotest introduces new Manipulator Option and Receiver for Semiconductor Test System

05 July 2012 - The TS-900 Semiconductor Test System from Geotest is now available with a new manipulator option and handler compatible receiver. The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers. The manipulator's spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface.

The TS-900's new handler compatible receiver offers the flexibility to interface to virtually any device handler. In addition, compatibility is maintained with the TS-900's current receiver, allowing users to interchange load boards between the screw down and slide receiver configurations.

With a wide range of test capabilities for component, SoC and SiP test applications and supporting up to 512, 100 MHz channels with per-pin PMUs, the TS-900 includes a full-featured set of hardware and software capabilities for digital, mixed – signal and RF test applications.