3-in-1 Semiconductor Test Clock Module for testing High-Speed ICs

13 July 2012 - Advantest Corporation announced the new T2000 LJC16 16-channel, low-jitter-clock module. The LJC16 module combines different digital clock and analog clock/sine-wave requirements in a single high-multi-site system. By using the new LJC16 module all necessary tests can be performed on one tool without needing multiple modules.

With the faster input/output (I/O) speeds of today’s digital and analog ICs, the clock requirements for testing these devices have become more stringent.  To achieve the highest manufacturing yields, testing advanced semiconductors requires the ability to:

• source low jitter below 500 femto-seconds,

• deliver gigahertz clocking speeds,

• provide programmable duty cycles and

• offer the highest performance sine wave inputs to analog-to-digital converters (ADCs).

“With this new three-in-one module, our T2000 platform becomes the most economical and capable system in the industry for testing high-speed digital and mixed-signal devices while offering cutting-edge jitter performance,” said Jay Sakamoto, senior vice president of Advantest’s Strategic Business Unit (SBU).  “This solution is much more cost effective and versatile than other offerings on today’s market, such as high-end testers burdened with multiple modules or incomplete test solutions without high-speed digital pins and low-jitter sources.”