News - Component Test

Contactors for Testing Wafer Level Chip Scale Packages

08 March 2018 - Multitest introduced the Gemini Kelvin 050 for 0.5mm pitch contacting for packages with continuously shrinking dies, which are needed for smaller, lower current, and faster end-user devices. The Gemini Kelvin contactor is very versatile and can be configured for: single site test, strip test, and multisite WLCSP test.

The Gemini Kelvin contactors offer a wide range of electrical test performance coverage with dual probe bandwidth from DC to 17 GHz @ 0.3 mm pitch. All Gemini Kelvin probes have super-sharp tips for reliable contacting with a life of ≥500K insertions. With 100% correlation of test measures between the lab and production test, time to market - high volume test is significantly reduced. Due to the ease of maintenance, long life, and high yields associated with the Gemini Kelvin, it is a great choice for reducing the cost of test and increasing throughput as measured by the number of good parts yielded.

Senior Product Manager Bert Brost says "Gemini Kelvin is true Kelvin contacting used for low resistance test measurements requirements. Along with Gemini Kelvin being the ideal solution for accurate low voltage measures, Gemini Kelvin has the dual probe bandwidth for testing high speed analog and mixed signal devices. For example, Gemini Kelvin is the right choice for high resolution test measurements of 18 bit DAC/ADC with sampling rate of up to ≥ 100k s/S. One method of testing amplifiers involves applying one or two spectrally pure input signals and measuring the power at the harmonics. Unlike other Kelvin contacting solutions, the Gemini Kelvin has the bandwidth for minimum distortion of harmonic content."

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