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News - Component TestAutomated Test Solution for Silicon Photonics Wafer21 September 2021 - Keysight announced the new NX5402A Silicon Photonics Test System integrated with Keysight PathWave Semiconductor Test software technology (part of Keysight PathWave Test software), which enables semiconductor manufacturers to speed delivery of silicon photonics wafer production with stable and repeatable test capabilities. Silicon photonics is one of the key emerging technologies addressing growing internet traffic and demand for higher data rate. Silicon photonics' primary applications are in the data center market, driven by big data and cloud applications, but it is expected to be used in other areas, including healthcare, automotive Light Detection and Ranging (LiDAR), optical computing and quantum computing. According to a recent market research report by Yole Développement, the overall silicon photonics market will reach US$3.9 billion in 2025. As a result, many manufacturers are considering silicon photonics fabrication. However, there has not been any commercially available silicon photonics testing equipment for mass production using fully automated wafer probers. In addition, silicon photonics testing requires a variety of sensitive and accurate measurements. Companies and system integrators are pursuing system optimization and maintenance due to complex and inefficient communications with multiple vendors. "Ahead of the growing market demand for silicon photonics, Keysight is excited to announce the first test solution for silicon photonics volume production market," said Shinji Terasawa, vice president and general manager of Keysight's Wafer Test Solutions group. "Our NX5402A test system is the first solution that combines Keysight's expertise in electrical and optical measurement with Keysight's fiber alignment and positioning system integrated by PathWave Semiconductor Test software." Keysight's new NX5402A Silicon Photonics test system delivers the following key customer benefits:
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