|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Component TestIncrease Test Pad Lifetime by up to 100 Percent21 February 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its proprietary DuraPad surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors. Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. DuraPad brings substantial cost of test savings to high-volume production sites of array packages and WLSCPs. Multitest has performed extensive pad wear analyses to understand the actual issues with established surface coatings and to be able to provide the DuraPad solution. The company’s unique product portfolio of handlers, contactors and boards, enabled the engineers to apply Multitest’s comprehensive knowledge of the mechanical interactions. The results were presented at BiTS 2010 and 2011. The papers are available for download from the company's website. www.multitest.comRelated Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |