LTX-Credence introduces Unison Test Program Development Environment

16 April 2012 - LTX-Credence Corporation announced Unison, its next-generation software platform for semiconductor testing. Unison features cutting edge productivity tools that accelerate our customers' time-to-market for their next generation products. Unison is currently available for the Diamond test platform and will be available on other test systems later this year.

Unison provides the users significant value by using innovative technology features such as:

•A common graphical test programming environment for Diamond, X-Series, and future product offerings enabling easy migration of devices and test IP across tester platforms,

•Fast test program development to address the critical time-to-market demands of the consumer electronics market,

•Powerful test program development tools to streamline the validation process of complex system-on-chip and system-in-package devices,

•Highly flexible test program structure to allow a single test program to serve an entire device family across wafer sort, final test, and different site counts,

•Protection of legacy test program investment by being able to run legacy test programs in the Unison software environment.

"Unison is the first truly cross-platform software environment in the ATE industry. A test program developed in the Unison environment can run on our X-Series, Diamond and future products. This capability enables engineers to develop test programs for a diverse set of end markets by using a single programming environment," commented Steve Wigley, vice president of marketing. "Additionally, legacy test programs previously written in either the X-Series or Diamond programming environments will run on Unison without modification. This allows customers to benefit from the improvements that Unison offers without having to rewrite test programs that have already been certified and released to volume production."

Unison is currently available for the Diamond test platform and will be available on other test systems later this year.