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News - General T&MEconomical, programmable 5½-Digit Digital Multimeter18 September 2012 - Keithley Instruments expands its digital multimeter (DMM) product line with an economical new offering. The Model 2110 5½-digit Dual-Display Digital Multimeter is optimized for a variety of general-purpose system and bench design applications. When compared with leading 5½-digit DMMs, the Model 2110 offers superior throughput (up to 10x faster), accuracy (up to 2x better DC voltage accuracy), a lower purchase price, and greater integration flexibility. 6 GHz Solid state Switching Matrix17 September 2012 – Pickering Interfaces is expanding its range of 6 Ghz solid state switching modules with the introduction of the first RF solid state matrix in PXI, the 40-884. The module provides a 4x4 matrix which occupies 3 slots of a 3U PXI chassis. The design provides excellent input VSWR to greater than 6 GHz and features high port to port isolation to ensure that input and output signals do not interfere with each other. NI unveils Industry’s fastest PXI Embedded Controller14 September 2012 – National Instruments introduced the NI PXIe-8135, which features the quad-core 3rd generation Intel Core i7 processor and USB 3.0 connectivity, making it the industry’s fastest PXI embedded controller. The NI PXIe-8135 helps engineers achieve shorter test times and increase automated test throughput, further advancing PXI instrumentation for high-performance test, measurement and control applications. Accelerate Large-Scale Active Antenna Calibration and Testing13 September 2012 – Agilent Technologies introduced the industry’s widest-bandwidth real-time digital downconverter option on the M9703A AXIe eight-channel high-speed digitizer. The new DDC functionality enables faster, more flexible measurements in high-channel-count applications. NI TestStand 2012 increases Automated Test Throughput and Flexibility12 September 2012 – National Instruments introduced NI TestStand 2012, the latest version of its automated test management software. With its new modular process architecture, NI TestStand 2012 helps engineers increase the flexibility and throughput of their automated test systems. The new modular framework makes test setup easier, expands test and reporting flexibility, and makes it possible for engineers to simultaneously test and report during parallel testing. Agilent Technologies announces Hardware Upgrade for ENA Network Analyzers11 September 2012 – Agilent Technologies announced the latest upgrade of the company’s E5071C ENA series network analyzer’s digital hardware. The measurement cycle time of the new hardware is two times faster than that of any other competitive RF network analyzer. High-speed differential Probe for high-voltage Oscilloscope Measurements10 September 2012 - The Yokogawa Model 701927 is a new high-speed differential probe for high-voltage floating signal measurements using the company’s DLM2000 Series of mixed-signal oscilloscopes and other instruments equipped with the Yokogawa probe interface. The 701927 has a 3 dB bandwidth of DC to 150 MHz, and can measure differential or common-mode voltages up to ±1400 V (DC plus AC peak) or 1000 V RMS. More Articles ...
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