News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance

General T&M

Frequency Hopping Module for Signal Generator Platform

izt-s100fhs31 August 2012 – IZT announces the addition of a frequency hopping module to its signal generator platform IZT S1000, which combines 31 virtual signal generators in one platform for testing radio receivers and for creating complex mixed signal RF scenarios. Frequency hopping spread spectrum (FHSS) is used in military communications, Bluetooth and consumer devices in the unregulated 2.4 GHz band.

With this method the carrier frequency is rapidly changed across a wide range of frequency channels. If the hopping sequence is chosen properly, frequency hopping provides additional security to the communication and protection against jamming, which makes frequency hopping especially suitable for military communication systems.

The IZT S1000-FHS frequency hopping module is designed to reduce interference, increase transmission security and enhance the efficient use of available bandwidth in communications and wireless connectivity. Utilizing the full profile functionality of the IZT S1000, the frequency hopping module IZT S1000-FHS efficiently generates hopping networks with a hop rate of >2,000 hops per second. Content comes from an analogue modulation tool or from the user as narrow band I/Q data. One hopper requires one virtual signal generator (VSG) and can hop within a range of 120MHz. Two VSGs have a 240MHz spread. The overall bandwidth required for frequency hopping is much wider than that required to transmit the same information using only one carrier frequency. Within the impressive 120MHz instantaneous bandwidth of the IZT S1000, the user can continuously change the center frequency of each VSG.

The option IZT S1000-FSC allows users to add more hoppers. The IZT S1000-FHS module is available now.

www.izt-labs.de


Upcoming Events

ETS - IEEE European Test Symposium
Avignon (France)
27 to 31 May 2013
Automotive Testing Expo Europe 2013
Stuttgart (Germany)
04 to 06 June 2013
LOPE-C 2013
Munich (Germany)
11 to 13 June 2013

Tag Cloud

Social Media

linkedin_follow_420x50px
 
twitter_follow_420x50px