This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - General T&M

PXI Embedded Controller and high Bandwidth Chassis

NI PXIe 108511 March 2015 - National Instruments (NI) announced the NI PXIe-8880 controller, which is based on the Intel Xeon processor, and the NI PXIe-1085 chassis, which is the industry’s first chassis that uses PCI Express Gen 3 technology. The combination of the eight-core, server-class Intel Xeon processor E5-2618L v3 and full system bandwidth of 24 GB/s delivers breakthrough performance for computationally intensive and highly parallel applications such as wireless test, semiconductor test and 5G prototyping.

Customers can take advantage of the flexibility of the PXI platform to replace previous generation controllers with the NI PXIe-8880 and see up to double the performance in their test and measurement applications.

“Over the past two decades, we have witnessed a gradual shift from traditional instrumentation in favor of the PXI platform for automated test,” said Jessy Cavazos, industry manager for measurement and instrumentation at Frost & Sullivan. “With the addition of Intel Xeon processor technology, we expect the adoption of PXI to only increase for high-performance applications.”

NI collaborated with Intel to deliver the server-class power of Intel Xeon processors to the test and measurement market. The embedded controller features eight cores, up to 24 GB of DDR4 memory and 24 lanes of PCI Express Gen 3 connectivity to the backplane. This provides engineers and scientists with up to twice the processing power and bandwidth compared to previous generation controllers. In addition, the new 18-slot chassis incorporates PCI Express Gen 3 technology with eight lanes per slot for a matched total system bandwidth of 24 GB/s, so any test and measurement system can scale well into the future.

www.ni.com/



Related Articles:

No related articles found


Upcoming Events

Embedded World 2024
Nuremberg (Germany)
09 to 11 April
Control 2024
Stuttgart (Germany)
23 to 26 April
Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June

  More events...
  See our Trade Show Calendar
  Click here