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Readers Top 5 News of last 30 days
- 15 November 2018 - Switching Current Measurement for Memory Test Systems
- 21 November 2018 - Imaging Automotive Radome Tester
- 16 November 2018 - 5G NR OTA Measurement Solution
- 19 November 2018 - Digitizers with ultra-long Signal Averaging Capabilities
- 20 November 2018 - Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
Latest Test and Measurement News
Stand-alone AOI System with 3D Camera Module
14 December 2018 - The stand-alone AOI system "Basic Line" of Goepel electronic can now be equipped with a new 3D camera module. This allows cost-effective 3D measurement and 2D inspection even for SMD manufacturers with small batch sizes. The 3D ViewZ camera module combines 3D measurement technology based on structured light with angled-view inspection from 360 possible angles, allowing maximum fault detection even in difficult-to-view component situations.
Parametric Testing for Developing and Manufacturing Next-Generation ICs
13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs.
New Features and Functionality for NI LabVIEW NXG
12 December 2018 – National Instruments (NI) announced a new release of LabVIEW NXG, demonstrating continued investment in the next generation of LabVIEW engineering system design software. The newest version of LabVIEW NXG includes new fast, flexible and web-ready features and simplifies the most time-consuming tasks in automated test and automated measurement applications.
All-in-One 400GbE PAM4 BER Measurements
11 December 2018 - Anritsu released a 64-Gbaud PAM4 Pulse Pattern Generator (PPG) and 32-Gbaud PAM4 Error Detector (ED). This PAM4 BERT supports 400GbE testing when these modules are installed in the Anritsu Signal Quality Analyzer-R MP1900A series to implement a bit-error-rate test solution with best-in-class signal level quality and excellent Rx sensitivity for next-generation broadband communication systems.
Dual-Channel, Multi-Function Arbitrary Waveform Generators
10 December 2018 – Teledyne LeCroy announced a family of High Definition arbitrary waveform generators (AWGs). The dual-channel AWGs are branded T3AWG3252 (250 MHz) and T3AWG3352 (350 MHz) and offer 16 bits of vertical voltage resolution, an output voltage window of up to ±24 V, and waveform memory of up to 1 GS/channel.
E-Mobility Tester offers combination of high and low voltage test
07 December 2018 - WEETECH introduced the new W 484 PLUS test system, which combines an HV relay switching matrix with a cost-effective transistor switching matrix. Complex barriers can be avoided by monitoring the supplied energy. The compact W 484 PLUS high voltage tester tests high voltage cable harnesses and components used in electric or hybrid vehicles with up to 4,300 Vdc or 3,000 Vac.
Digital Oscilloscopes featuring 7 Measurement Functions
06 December 2018 - RIGOL Technologies announces an addition to its UltraVision II family of oscilloscopes with the introduction of the New MSO5000 Series Digital Oscilloscope. The MSO5000 Series offers bandwidth from 70MHz to 350MHz, 8GSa/sec sample rate, 500,000 wfms/sec waveform capture rate, and up to 200M Record Length. System performance, signal resolution and memory depth of the MSO5000 Series is unmatched in its class.
More Articles ...
- JTAG/Boundary Scan Controller for Industrial Production Use
- Test of High-Voltage Semiconductors
- Test Solution for Radiation Measurements on 5G Devices
- Test Handler offers PCB Exchange within less than four Seconds
- Isolated High Voltage 4-Ch 200MHz Oscilloscope
- Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY
- Pattern Conversion Software for Cloud-Based Semiconductor Testing
- Arbitrary Function Generator Series with 16 Bit Resolution
- New Data Acquisition System automates and rapidly validates Designs
- Counter Quantum Analyzer for Parallel Readout of 10 Qubits
- Imaging Automotive Radome Tester
- Cellular Vehicle-to-Everything and Advanced Automotive Ethernet Test Solutions
- Digitizers with ultra-long Signal Averaging Capabilities
- 5G NR OTA Measurement Solution
- Switching Current Measurement for Memory Test Systems
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