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Wednesday, 22 February 2012 13:28 |
LPDDR3 Compliance Test Application
22 February 2012 – Agilent Technologies introduced the industry’s most comprehensive compliance test application for systems using low-power double-data-rate 3 memory. In addition to accelerating the turn-on and debug of LPDDR3-based systems, the tool offers great flexibility to engineers working with nonstandard operating speeds and voltages, giving them an efficient way to characterize their LPDDR3 designs.
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Wednesday, 22 February 2012 08:24 |
 Easy Diagnosis of Television Network Faults
22 February 2012 – GAO Tek Inc. is offering a high performance digital signal level meter. With a handheld design, high accuracy and automatic channel power test, the meter is intended for analog and digital television network construction and maintenance. Using spectrum and channel scanning functions, network faults can be easily diagnosed and analyzed using this single instrument.
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Tuesday, 21 February 2012 07:40 |
Increase Test Pad Lifetime by up to 100 Percent
21 February 2012 - Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its proprietary DuraPad surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors.
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Monday, 20 February 2012 12:33 |
Embedded Development and Test Tools support Power Measurement
20 February 2012 - iSYSTEM introduced the iSYSTEM IO module as an add-on for the iC5000 embedded software debug and test platform. It provides the capability to drive and measure digital and analog signals. Input signals can be asynchronously read by iSYSTEMs integrated development environment (IDE) winIDEA or by external applications and scripts using iSYSTEMs open and public "isystem.connect" interface, a generic application programming interface (API).
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