|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
AR Europe announces partnership with 3ctest
22 May 2015 - 3ctest, a manufacturers of EMC instrumentation appointed AR Europe as their exclusive distribution partner in Europe for their pulsed EMI products. This new agreement follows 3ctest’s decision to expand its market outside of China. The extensive expertise and knowledge together with strong brand recognition and established distribution network makes AR Europe an ideal partner for 3ctest.
USB Vector Signal Generator for Frequencies up to 2.5 GHz
21 May 2015 — Signal Hound announced new vector signal generator (VSG) that breaks price barriers. It is USB-powered, weighs just 130 grams, and fits into a shirt pocket. The Signal Hound VSG25A costs just $495 and features a frequency range of 100 MHz to 2.5 GHz, output amplitude from -40 dBm to +10 dBm, and 100 MHz of modulation bandwidth.
4-port Broadband VNA System with Frequency Coverage from 70 kHz to 110 GHz
20 May 2015 – Anritsu introduces the VectorStar ME7838A4 4-port broadband vector network analyzer (VNA) system that features the world’s widest differential broadband sweep from 70 kHz to 110/125 GHz and utilizes the smallest mmWave modules to conduct highly stable and fast measurements when characterizing differential devices. The new ME7838A4 allows to conduct differential measurements with great confidence in next-generation communications system designs.
Keysight Technologies adds versatile Performance Options to it’s Power Supplies
19 May 2015 – Keysight Technologies introduced four performance options for its small, flexible and market-leading-fast Advanced Power System (APS) N6900 Series DC power supplies. In conjunction with the power supply’s VersaPower architecture, the new options boost test-system versatility and make it easy for test engineers to tune power supply capability. The N6900 options enable engineers to meet their ATE testing needs without paying for more capability than they require.
Teradyne launched new ETS-800 Test System
19 May 2015 - Teradyne announced the availability of the ETS-800 test system designed to further drive down the cost of test in the linear, power and automotive markets. The system introduction coincides with the availability of a suite of instruments to address the requirements of the analog test market. System shipments began in the third quarter of 2014 and are in production at multiple customers. The platform delivers high test cell throughput for complex analog devices through a combination of unique ETS-800 capabilities.
New Technology for IoT Test and Debug
18 May 2015 – Teledyne LeCroy announces ProVIDE, a new, patent pending, technology created for IoT and embedded developers. IoT devices bring multiple technologies into SoCs designs, and since these technologies are defined more and more by embedded software, there is an increasing need for effective ways to develop, test and debug software and hardware interaction. ProVIDE, Protocol View for Integrated Debug Environments combines two important test and debug methods – software IDE and Protocol Analysis.
Pick-and-Place Handler offers one Insertion Multi-Temperature Testing
15 May 2015 - The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites. The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex EMC Inspection Keithley spectrum analyzer Keysight signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ Semiconductor Test characterization Semiconductor network analyzer probe wireless
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