|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
High Bandwidth Semiconductor Test Probes
01 September 2015 - Everett Charles Technologies (ECT) launched a new member of the versatile ZIP semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.
Capturing Functional Compliance Violations on DDR and LPDDR Memories
31 August 2015 – Keysight Technologiesintroduced a new software package for use with Keysight logic analyzers, the B4661A memory analysis software. The software offers the industry’s only functional-level compliance violation testing capability across DDR4 and LPDDR4 speed changes. The new B4661A memory analysis software has a performance analysis option that provides powerful new trace overview and navigation features.
Noise-Figure, Analog-Demodulation Measurement Applications for Signal Analyzer
28 August 2015 – Keysight announced the addition of its proven analog demodulation and noise figure measurement applications as software options to the UXA X-Series signal analyzer. Through the analyzer’s multi-touch user interface, the new software ensures intuitive and efficient operation for engineers creating advanced designs in aerospace, defense and wireless communications.
Very stable Cable Assemblies for VNA Testing
27 August 2015 - Aspen Electronics has signed an agreement to represent the specialist laboratory device company Nanjing Arance Electronics Co.,Ltd (Arance). The company produces a wide range of test and measurement products - of particular interest to test engineers will be the NAC series of cable assemblies. Arance’s NAC series highly flexible test assemblies have a rugged, lightweight construction that enables longer service life, reduced downtime, and lower operating costs over the life of the equipment.
Integrated Fader for LTE-Advanced 4x4 MIMO and 8x2 MIMO Tests
26 August 2015 – Anritsu has integrated channel fading simulation into its 4G LTE-Advanced Signalling Tester, the MD8430A. The new digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles. The MD8430A fading options can be combined with the MD8430A, cutting the need for investment in additional hardware to perform signalling tests under realistic radio frequency (RF) conditions.
Economical Line Impedance Stabilization Network for Pre-compliance Testing
25 August 2015 - Saelig Company announces the availability of the TBLC08 Line Impedance Stabilization Network (LISN) which enables measurements of line-conducted interference within the range of 9kHz to 30MHz, according to the CISPR16 or other standards, before any formal testing commences. The TBLC08 is designed especially for pre-compliance testing of single phase, AC-powered equipment with supply voltages up to maximum 260V.
Software for Multichannel Data Acquisition Systems
24 August 2015 – Keysight Technologies launched a new version of its U1092A AcqirisMAQS Multichannel Acquisition Software. This application, providing unique features for massively multichannel acquisition systems, evolved together with all Keysight’s latest technologies, including the newly introduced M9709A AXIe 8-bit high-speed digitizer.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight EMC Aeroflex Inspection spectrum analyzer Keithley signal Generator signal analyzer Power supply Multitest Yokogawa AXI Teledyne LeCroy LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test wireless Semiconductor network analyzer probe
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