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Readers Top 5 News of last 30 days
- 28 January 2015 - Free e-Learning for testing cellular Chipsets and Devices
- 03 February 2015 - Testing and Debugging highly complex heterogeneous multicore SoCs
- 05 February 2015 - Portable PCI Express 3.0 Protocol Analyzer for Storage Test
- 09 February 2015 - PXI/PCI Test Solution for CAN-FD Interfaces
- 09 February 2015 - BERT for high-speed digital Receiver Characterization
Latest Test and Measurement News
Motor Drive Analyzer based on high Resolution Oscilloscope
26 February 2015 – Teledyne LeCroy announces the MDA800 Series of Motor Drive Analyzers (MDAs) that combine three-phase power analyzer static (steady-state) calculations, unique dynamic three-phase power and mechanical motor analysis capabilities, and high bandwidth (1 GHz) embedded control system debug in a single instrument.
Optical Spectrum Analyzer covering wavelengths from 350 nm to 1200 nm
25 February 2015 - Yokogawa introduced a new version of its AQ6373 optical spectrum analyser incorporating a new monochromator with a sharp passband filter edge plus a number of new features including a double-speed measuring mode, a multipeak/bottom search function and a data-logging function. The new AQ6373B is designed for measurements in the short wavelength region, from 350 nm to 1200 nm, and is based on the same proven platform of the AQ6373.
Source/Measure Units offer Output up to 80W and 8A
24 February 2015 – Keysight Technologies announced the addition of two source/measure units (SMUs) to its N6700 Series modular power systems – the N6785A two-quadrant SMU for battery drain analysis and the N6786A two-quadrant SMU for functional test. Both SMUs provide power output up to 80 W. The two new SMUs expand the popular N6780A Series SMU family by offering up to four times more power than the previous models.
High Volume Test and Calibration of Barometric Sensors
24 February 2015 - Multitest introduced a new MEMS test and calibration solution for barometric sensors. InBaro provides a reliable multisite test and calibration for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with high temperature accuracy and stability.
RoodMicrotec appointed Martin Sallenhag as CTO
23 February 2015 - RoodMicrotec N.V. announced the appointment of Mr Martin Sallenhag MSc as Chief Technical Officer (CTO) as of 1 March 2015, succeeding Mr Norbert Wirth. Mr Wirth was CTO with RoodMicrotec since 2011; he sadly died at the end of 2014 after a long illness. Both the supervisory board, the management board and the employees are deeply saddened by Mr Wirth's death, and will miss his experience and knowledge.
Verification of TDD/FDD LTE Bands for mixed Carrier Aggregation
20 February 2015 - Rohde & Schwarz has successfully verified combining various frequency bands in mixed-mode TDD and FDD mixed carrier aggregation. During the test, the R&S CMW500 wideband radio communication tester from Rohde & Schwarz simulated an LTE network with simultaneous time division duplex (TDD) and frequency division duplex (FDD). The data was successfully transferred to the DUT on multiple aggregated carriers in different duplex modes.
Automated Final Testing of Mobile Devices
19 February 2015 - JOT Automation introduced the JOT G3 an all-in-one final tester for smartphones. It also enables fully automatic tests on wearables like smartwatches in a repeatable and reliable environment. JOT G3 executes multiple tests in a single platform. The solution with a compact footprint is capable of running all the required DUT interface tests on, for example, RF, electrics, mechanics, touch screen, buttons, audio, and plug-in connections.
More Articles...
- PCI and PXI Resistor Modules
- Wireless Test Set supports LTE-A Carrier Aggregation with 3CC, TDD, Uplink Measurements
- Multi-Instrument Capabilities for Teledyne LeCroy WaveSurfer 3000 Oscilloscopes
- Reliable and Maintenance-Free Fixtures for Board Testing
- Cobham Wireless and National Instruments Partner for Cellular and Connectivity Applications
- Signal Hound upgrades Software for USB-powered Spectrum Analyzers
- Audio Precision increases Multichannel Input Bandwidth
- BERT for high-speed digital Receiver Characterization
- Characterizing Displays and electronic Graphics Panels
- Complete eMBMS Test Solution
- PXI/PCI Test Solution for CAN-FD Interfaces
- Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells
- New Version of Automated Characterization Software for WLR and Power Semiconductor Testing
- Keysight Technologies enters Power Analyzer Market
- Cascade Microtech introduces new Version of Probe Station Control Software
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