|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
eBook explains extrem fast In-system Flash Programming via IJTAG
29 July 2015 – New faster methods for the in-system programming of onboard flash as well as I2C and SPI memory are explained in a new eBook published by ASSET InterTech. Advanced programming methods based on the IEEE 1687 Internal JTAG (IJTAG) standard and embedded programming engines in an onboard FPGA can accelerate programming speeds by a factor of 1,000, shortening the process from tens of minutes to a second or less.
Boundary Scan Test for non scanable Partitions
28 July 2015 - GOEPEL electronics presents with CION-LX Module/FXT48A a new Boundary Scan module. It offers a wide function range and dynamics for test of analog, digital and mixed signals. The module is an easy, safe and low cost solution to extend the Boundary Scan technology to non scanable partitions. The CION-LX Module/FXT48A has 48 single-ended and 6 differential channels covering a voltage range between 0,9V and 3,6V.
Safety-Rated High Voltage Differential Oscilloscope Probes for 2kV and 8kV
27 July 2015 – Teledyne LeCroy introduced two new additions to the HVD3000 series of high voltage differential probes — the 2 kV safety-rated HVD3206 and the 8.4 kV safety-rated HVD3605. Like the existing 1 kV safety-rated HVD310x probes, these new probes provide excellent performance by offering the best gain accuracy, widest differential voltage range, high offset range and exceptional common-mode rejection ratio (CMRR).
Wireless Test Set supports new WLAN 802.11ah and 802.11af
24 July 2015 – Keysight Technologies announced new WLAN 802.11ah and 802.11af capabilities for the EXM wireless test set. The EXM now supports more Internet-of-Things (IoT) wireless devices and formats in the design validation and manufacturing stages of product development. In addition, the technologies expand the test set’s existing broad multi-format coverage of wireless connectivity, cellular formats and development.
CETECOM increased EMC Test Capacities for Large Objects
23 July 2015 – CETECOM has upgraded its electromagnetic compatibility (EMC) test capacities to accommodate the growing customer demand for handling large objects. At CETECOM’s Saarbruecken facility, the expanded test chamber now allow large electrical cabinets, medical instruments and other large-volume objects to be accurately and efficiently evaluated. The integrated rotating platform with a high-capacity 63 A electrical motor accommodates heavy test objects with a mass up to 6 tons. Devices up to 4 meters wide can now be tested in this spacious new chamber.
Handling System for Ceramic Substrate Boards
22 July 2015 - IPTE expanded its EasyLine board handler portfolio with new S-size modules for hybrid products. Following modules are available: Single and Dual Lane Conveyer, Portal-unit and several traversers, Turning, Magazine-handler (loader and unloader) and magazine-buffer for up to eight magazines, Sorting-modules for defective and for recirculation fixed ceramic substrate carriers, Manual (optical) inspection, Conveyor for ionic cleaning, Special oven-emergency-buffers for magazines allowing the emptying of the oven in case of a malfunction at that part of the production line.
Linking Inspection Data of AOI, SPI, and AXI Systems
21 July 2015 - GOEPEL electronics launched PILOT Connect – a system for linking all test data of automatic optical, solder paste and X-ray inspection. The uniform interface centrally creates and administers the machine and operating data of the connected systems and collects all the test data in one verification and repair space. This allows a secure assessment of the errors, optimises the production process and reduces production costs.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight Aeroflex EMC Inspection spectrum analyzer Keithley signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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