|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Software optimizes automated testing using Network Analyzers
04 May 2015 - The new R&S ZNrun software from Rohde & Schwarz assists users in configuring measurements specifically for multiport DUTs using Rohde & Schwarz vector network analyzers (VNA). The user selects the VNA and any additional test equipment for example an R&S ZNB vector network analyzer and an R&S ZN-Z84 switch matrix and sets the parameters to be measured on the DUT. Based on this information, the R&S ZNrun software takes over communications with the test equipment, makes all of the settings, and executes and controls the test sequence. This procedure simplifies in particular the time-consuming characterization of multiport components.
High-Density PXI Reed Relay Matrix
04 May 2015 - Pickering Interfaces introduced an improved high-density PXI reed relay matrix module. This new model 40-533B is available as either a 64x4 or 64x2 matrix, and features 1 pole or 2 pole versions, up to 1A 150VDC/100VAC 15W hot switching and support for Pickering’s Diagnostic Test Tools – BIRST and eBIRST.
Immunity Test in Frequency Range from 15 Hz to 150 kHz
30 April 2015 - Teseq offers a testing system that meets the new requirements for immunity testing to low-frequency disturbances in the frequency range of 15 Hz to 150 kHz. The NSG 4060 complies with current testing standards, including EN 61326-3-1, IEC 61850-3, IEC 60255-22-7, IEC 60533/IEC 60945, IEC 61000-4-16 and IEC 61000-4-19.
300 VA AC Source with Power Line Disturbance Simulator
30 April 2015 - B&K Precision introduced a new AC power source, the model 9801, expanding its AC power supply offerings. This compact 19" half-rack single-phase AC source outputs up to 300 VA and measures AC power characteristics. Users can operate the AC source in a 0-300 V continuous sweep range or 150 V/300 V auto-switching range with adjustable start and stop phase angle control. With a built-in power line disturbance (PLD) simulator, list, sweep, and dimmer mode, the 9801 is suitable for simulating various AC power conditions and provides a complete solution for manufacturing, R&D, and pre-compliance testing applications.
Vi TECHNOLOGY strengthens support in Germany
29 April 2015 - Vi TECHNOLOGY, a provider of inspection solutions for PCB assembly, announced the establishment of Vi TECHNOLOGY GmbH, a wholly-owned subsidiary in Germany. The Vi TECHNOLOGY German Applications and Training Center opened in October 2014 in close proximity to Munich, has already proven to be a strong base to serve the company's German speaking customers.
Flexible Test-Handler for In-Circuit and Functional Test
29 April 2015 - In-Circuit- or functional test as well as programming processes can be inline automated with IPTE’s new Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time.
Continuous Acquisition Stream Capability for PCIe Digitizers
28 April 2015 – Keysight Technologies introduced continuous simultaneous acquisition and readout (CSR) for its U5303A 12-bit PCIe digitizer. In addition, complete data recording software applications are available, such as digitizer streaming (application option CB0) and digital down-converter streaming (application option CB1).
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley EMC spectrum analyzer signal Generator Keysight signal analyzer Power supply AXI LeCroy Yokogawa Multitest Handheld Teledyne LeCroy calibration Switching TESEQ Semiconductor Test USB characterization Semiconductor network analyzer wireless probe
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