|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
MCPS Data Acquisition Software supports Rigol DAQ System M300
27 January 2015 – The MCPS (Multi Channel Process System) PC Software of CAD Computer now supports the new Data-Acquisition System M300 from Rigol, which includes a 6 ½ digit DMM and can extend up to 128 measurement channels. Rigol Technologies EU now extend its product portfolio with this complete and easy to use Test-Solution for Data Acquisition and Data Logging. MCPS can be installed on standard Windows PCs (minimum WindowsXP SP3) within one minuteand provides an easy and fast way to configure a measurement.
Electrical Performance and Characterization Test Software to Streamline eDP 1.4 Testing
27 January 2015 – Keysight Technologies introduced test support for the eDP 1.4 (embedded DisplayPort) specification. Keysight N6469A eDP 1.4 electrical performance and characterization test software allows developers using eDP technology to eliminate guesswork and streamline their testing by using application software specifically designed for their needs.
High-Performance Benchtop DC Electronic Load Series
26 January 2015 - B&K Precision announced a new 8600 Series programmable DC electronic loads. The new series includes three models of 150 W - 250 W DC electronic loads that can sink current up to 60 A at wide voltage ranges up to 500 V. All models provide fast transient operation speeds up to 25 kHz along with built-in battery and LED test mode functions, making these high-performance DC loads suitable for testing and evaluating a variety of DC sources such as DC power supplies, DC-DC converters, batteries, LED drivers, and photovoltaic arrays.
Test and Programming Strategies for Bay Trail Processors from Intel
23 January 2015 - GOEPEL electronics announces the development of specific model libraries for testing and programming of Intel Bay Trail processors, which are part of the Intel Atom family. The libraries called VarioTAP models allow flexible execution of processor emulation tests using the native debug port. Users are now able to use the processor as an instrument for hardware design validation of prototypes as well as programming of Flash devices.
LXI Digitizers with up to 500 MS/s Sample Rate and 16 Bit Resolution
22 January 2015 - Spectrum has expanded its range of digitizerNETBOX products by adding nine new models. Featuring state-of-the-art ADC technology the new units are capable of sampling signals at rates of up to 500 MS/s with 14 bit resolution and 250 MS/s with 16 bit resolution. The products can be easily integrated with any PC, Laptop or even the company network and, as the products come complete with software, they can capture, store and analyse signals virtually straight out of the box.
Test and Analysis Tools for embedded Software
22 January 2015 -With the iC5500 and related software packages iSYSTEM completes its set of software development tools for single and multi-core software development, analysis, test automation and certification. iSYSTEM’s Software and Blue Box Technology stand for fast and easy single and multi-core processor hardware access via any kind of debug interface and can be used for developing, debugging or testing embedded software on a real hardware.
Lead Free Long Travel Probes
21 January 2015 - Everett Charles Technologies (ECT) extended the probe offerings (LFRE probes) for lead free PCB in-circuit and functional test applications to include long-travel probes (LFLT probes). ECT LFLT probes have almost twice the compliance as standard length probes. The new long-travel probes meet the need for reliable contact solutions for lead free dual-stage in-circuit test fixtures.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI LTE AOI Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld Keysight calibration Semiconductor Test TESEQ Switching USB network analyzer Viscom wireless characterization probe SPI
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