|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Self-Test Tools for Switching Systems
01 April 2015 - Pickering Interfaces, a provider of modular signal switching and instrumentation for use in electronic test and simulation, introduced their latest diagnostic test tools - eBIRST Switching System Test Tools. The eBIRST tools, designed specifically for Pickering Interfaces PXI, PCI or LXI (Ethernet) products, simplify switching system fault finding by quickly testing the system and identifying the faulty relays. Once identified, the tools then display a graphical representation of the switching system’s PCB assembly, highlighting the relays that need to be replaced.
USB 3.1 End-to-End Test Suite
01 April 2015 – Teledyne LeCroy introduces the QPHY-USB3.1-Tx-Rx package for automated USB 3.1 transmitter (Tx) and receiver (Rx) compliance testing, characterization, and debug, creating a unique and comprehensive USB 3.1 test suite. With the new test package, USB 3.1 testing can be performed on both Gen1 (5 Gb/s) and Gen2 (10 Gb/s) devices under test according to the latest USB 3.1 specifications.
Comprehensive Handheld Cable Test Solution
31 March 2015 – Keysight introduced two cable test options for its FieldFox handheld analyzers, making them the industry’s most comprehensive handheld solution for cable testing. The new Time Domain Reflectometry (TDR) cable measurement option enables TDR measurements for the cable and antenna analyzer. The new Extended Range Transmission Analysis option adds capabilities for measuring in-situ, long lossy microwave cables.
Optical Modulation Analyzer for 400G Communications Testing
31 March 2015 – Tektronix launched a new 45 GHz optical modulation analyzer (OMA) capable of supporting the latest 100G and next-gen 400G communications standards. With support for single-carrier or multi-carrier systems, the analyzer is tightly integrated with the recently announced Tektronix DPO70000SX 70 GHz ATI Performance Oscilloscope to provide multi-channel, high sample rate, low noise digitization of complex modulation signaling for testing coherent optical transmitters, transmission systems, and receivers.
Inline AXOI system communicates with ASYS OIC Software
30 March 2015 - The high-end 3D X-ray inspection system X-Line 3D from GOEPEL electronics now features a link to the OIC System (Overall Inline Communication) of ASYS Automatisierungssysteme. The OIC system visualizes the electronics production line and displays status, product and production process in real time. In parallel, all relevant production relevant data and availabilities are truthfully documented.
Flying Probe Tester for Substrates down to 10 µm
30 March 2015 - atg Luther & Maelzer introduced a flying probe system for substrate test. The first system was deliverd to a major customer in Korea. The S3 10µm Substrate Tester is the first system of a new atg Luther & Maelzer product line. It meets the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.
Compact, autonomous Scanner simplifies mobile Network Optimization
27 March 2015 - The new R&S TSMA mobile network scanner from Rohde & Schwarz can execute drive tests without an external PC. The compact 1200-gram scanner makes it easier to collect in-the-field measurement data required for mobile network optimization. It supports all current and future wireless standards in all bands and achieves very high measurement rates.
Agilent Oscilloscope JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator Keysight signal analyzer Power supply AXI LeCroy Yokogawa Multitest Handheld calibration Switching Semiconductor Test USB TESEQ Teledyne LeCroy characterization network analyzer wireless Viscom Pico Technology
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