|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Interference Hunting System makes locating Interferers easier
31 October 2014 - Anritsu introduces a revolutionary mobile interference hunting system that helps field engineers and technicians locate sources of interference more accurately, efficiently, and economically. Integrating an easy-to-use interface, fast setup times, and numerous features to effectively hunt a variety of signal types in multiple RF environments, the comprehensive solution provides wireless carriers, regulatory agencies, and broadcast and satellite operators with a tool that saves time and money.
High Voltage Capacitance-Voltage Test on Wafer-Level
31 October 2014 – Keithley Instruments introduced new enhancements to its Parametric Curve Tracer (PTC) configurations that incorporate high power SourceMeter Source Measure Unit (SMU) instruments. For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements.
Microlease appoints European CEO
30 October 2014 - Microlease announced the appointment of Peter Collingwood to the new position of Chief Executive Officer, EMEA, and Bina Khatwani as Finance Director, EMEA. Following these appointments, Nigel Brown, CEO and Paul Smith, Finance Director, take global roles.
New Tip Style for Test Probes improves Performance and Reliability
30 October 2014 - Everett Charles Technologies (ECT) launches the new I40 tip style. The innovative geometry of the I40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper. Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear.
Generate phase-coherent Signals up to 20 GHz on four RF Outputs
29 October 2014 - Rohde & Schwarz presented an extremely compact solution with up to four RF outputs for generating phase-coherent signals up to 20 GHz. This test solution is ideal for aerospace and defense applications, for example to test multichannel antenna systems such as phased array antennas. The basis of the system is the R&S SMW200A. Equipped with the R&S SMW-B90 phase coherence option, it can phase lock modulated or unmodulated signals.
Signal Analyzer with 510 MHz Bandwidth and lowest Phase Noise
29 October 2014 – Keysight Technologies announced the new flagship of its X-Series: the N9040B UXA signal analyzer. The UXA delivers industry-leading phase noise performance as well as 510-MHz analysis and real-time bandwidths. Combining these three capabilities with a large display and touch-driven interface, the UXA provides wider, deeper views of elusive wideband signals—known or unknown.
SiliconAid Solutions partners with Ridgetop Group on IEEE P1687 and IEEE 1149.1-2013 Standards
28 October 2014 - SiliconAid Solutions and Ridgetop Group announced they have continued and expanded their partnership to enable support for the evolving industrial testability standards. Together they have developed a system to embed Ridgetop Group’s SJ BIST board-level interconnection reliability monitor leveraging IEEE P1687 and IEEE 1149.1-2013 for intellectual property (IP). SJ BIST is a patented test IP product that detects interconnect faults between electronic devices, such as between integrated circuits (ICs) (including field programmable gate arrays [FPGAs] and systems-on-chip [SOCs]) and printed circuit boards (PCBs).
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI AOI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test Switching network analyzer SPI Viscom wireless USB characterization Pico Technology ASSET InterTech
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