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Readers Top 5 News of last 30 days
- 03 April 2018 - Test of LTE Cat-M1 and NB-IoT Devices
- 28 March 2018 - WLAN Signaling Tester for IEEE 802.11ax
- 26 March 2018 - High Speed Probe Card with Data Rates up to 6 Gbps
- 26 March 2018 - Optical Spectrum Analyzer for use in Production
- 30 March 2018 - General Purpose Digitizers with Sampling Rate up to 125 MS/s
Latest Test and Measurement News
Lock-in in Amplifier based Amplitude and Frequency Modulation and Demodulation
25 April 2018 - All Zurich Instruments lock-in amplifiers can be equipped with amplitude and frequency modulation capabilities with the new AM/FM Modulation Option. This option enables coherent generation and detection of signals with multiple frequency components, such as amplitude- and frequency-modulated signals. Up to three frequencies can be coherently combined to generate fully configurable AM signals.
Merger between HBM and Brüel & Kjær
24 April 2018 - The companies Hottinger Baldwin Messtechnik GmbH (HBM) and Brüel & Kjær Sound and Vibration A/S (BKSV), both owned by UK-based Spectris plc, will merge their businesses. The merger will become effective on January 1st, 2019. Preparation activities ahead of this will take place through the remainder of 2018.
Monitoring of CAN FD Automotive Serial Bus
23 April 2018 - Yokogawa Europe introduced a new CAN FD monitoring module for its ScopeCorder family of portable data-acquisition and recording instruments. The new 720242 plug-in module is compatible with the DL850EV (Vehicle Edition) instrument and the new DL350 ScopeCorder fitted with the /VE option. The new module provides support for higher-speed testing to meet future automotive requirements.
Differential High-Voltage Probes for Oscilloscopes
20 April 2018 – Teledyne LeCroy introduced its HVD3000A series of high-voltage differential probes—the 1-kV safety-rated HVD310XA, the 2-kV safety-rated HVD3206A and the 6-kV safety-rated HVD3605A. The probes feature a high common-mode rejection ratio (CMRRs) over a broad frequency range. These new probes serve the complete spectrum of power-electronics applications while providing 1% gain accuracy, a differential-voltage range of up to 1500 V (DC + peak AC), and high offset ranges.
Over-the-Air Test Chamber for 5G Antennas and Transceivers
19 April 2018 - With the new R&S ATS1000 of Rohde & Schwarz all-in-one antenna test system, active and passive antennas as well as transceivers for future fifth generation (5G) mobile networks can be tested in a compact, moveable shielded RF test chamber. This enables far-field antenna characterizations and initial RF measurements for 3GPP 5G NR in the millimeter wavelength range.
Teledyne LeCroy launched new Oscilloscope Models
18 April 2018 - Teledyne LeCroy announced the WaveSurfer 3000z oscilloscopes, which expand the existing WaveSurfer 3000 bandwidth range above and below that of earlier models, while also bolstering functionality for power-electronics testing. All WaveSurfer 3000z oscilloscopes feature a large 10.1" capacitive touch screen, a vast set of debug and analysis tools, multi-instrument capabilities, feature/option upgrades, and support for a wider probe range. The WaveSurfer 3000z comes in five models with bandwidths from 100 MHz to 1 GHz and sample rates up to 4 GS/s.
Signal Analyzer supports new 3GPP 5G Standards
17 April 2018 - Anritsu announces the launch of 5 new 5G measurement software options for its MS2850A Signal Analyzer. The five new software options are compliant with the 3GPP 5G standards (5G NR hereafter) and used for measuring the RF Tx characteristics of next-generation 5G base stations and mobile terminals.
More Articles ...
- Yamaha enters Solder Paste Inspection Market
- Test Asset Optimization Services reduces Test Cost
- High-precision Frequency-selective Power Sensor
- High Throughput Manufacturing Test of 400G Modules
- Stackable USB Digital Storage Oscilloscope
- High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
- Test Application Framework with new Tools and Backup Capabilities
- Affordable Mixed Signal Oscilloscopes with 1 GSa/s Sampling Rate
- Test of LTE Cat-M1 and NB-IoT Devices
- General Purpose Digitizers with Sampling Rate up to 125 MS/s
- Testing Service for CMOS Image Sensor Wafers
- WLAN Signaling Tester for IEEE 802.11ax
- Optical Spectrum Analyzer for use in Production
- High Speed Probe Card with Data Rates up to 6 Gbps
- Shorten Validation Cycles for 400G PAM4 Designs
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