|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
4 Channel 20 GHz USB Sampling Oscilloscope
22 October 2014 - With the new PicoScope 9341 20 GHz Sampling Oscilloscope, engineers can analyze two differential or four single-ended high-speed signals. The instrument is ideal for measuring skew and crosstalk between differential pairs on serial buses such as HDMI, SATA and PCIe, and for testing signal integrity at differential and single-ended transceiver ports. Data rates up to 40 Gb/s can be viewed, with 5th-harmonic characterization possible up to 8 Gb/s.
Frost & Sullivan: Proliferation of Wireless Technologies Stokes Demand for RF Electronic Test Equipment
21 October 2014 – Telecom operators’ increased adoption of wireless technology for mission-critical applications has revved up the global market for dynamic electronic general purpose (GP) test equipment. As the link between cloud networks and devices (mobile phones, tablets, notebooks) results in more complex devices under test (DUT), the need for radio frequency test equipment will only intensify.
Portable OTDR enables fast, precise optical-fibre Characterisation
21 October 2014 - The new Yokogawa AQ7280 portable OTDR (optical time-domain reflectometer) delivers the ideal combination of measurement automation, user-friendly operation and reliable performance to enable fast, precise optical-fibre characterisation in the field. The AQ7280 is based on a plug-in modular design that allows it to be configured for a wide range of network environments and topologies from FTTH to metro and core networks.
USB and LAN Power Sensors with widest Dynamic Range
20 October 2014 – Keysight Technologies introduced the U2040 X-Series wide dynamic range power sensors, consisting of four USB models for wireless and radar applications, and a dedicated LAN model for satellite testing. With the world’s widest dynamic range found in a power sensor and extremely high measurement speed, the U2040 X-Series makes fast, accurate and repeatable power measurements over a wide range of power levels, allowing engineers to improve productivity and lower cost of test.
PC-controlled VNAs with Coverage up to 40 GHz
20 October 2014 – Anritsu expands its ShockLine family of Vector Network Analyzers (VNAs) with the introduction of the MS46122A series. Incorporating Anritsu’s patented shock line VNA-on-a-chip technology, the MS46122A low-cost full-reversing 2-port VNAs are packaged in a very compact 1U chassis, and are optimized for ultra-cost-sensitive test applications in manufacturing, engineering, and education environments.
Advantest Opens VOICE 2015 Call for Papers
17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices and handler solutions. VOICE, the annual Advantest Developer Conference, will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions.
Background: This isn’t your Father’s JTAG anymore
Literally, IEEE Std. 1149.1 very well might have been your father’s JTAG, since it has been around since 1990. For now over 20 years, this standard has been in use throughout the world (BSDL wasn’t added until 1993). 1149.1 was revised in 2001 with only incremental improvements and no real major rewrites. That is until now. A new 1149.1-2013 and the upcoming release of IEEE Std. P1687, huge changes and unmistakable momentum are on the horizon promising to once again revolutionize the industry.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test Switching SPI wireless USB network analyzer Viscom characterization ASSET InterTech probe
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