|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Boundary Scan Integration into Flying Probe Tester
27 January 2016 - JTAG/Boundary Scan test technology by GOEPEL electronic is now also available in the Flying Probe Tester (FPT) Condor MTS 500 from Digitaltest. The combination of both test methods results in a cost and time efficient platform for test of electronic assemblies in production.
NI Releases enhanced Version of VirtualBench All-in-One Instrument
26 January 2016 – National Instruments (NI) announced a new, high-performance model of VirtualBench. The software-based VirtualBench all-in-one instrument combines a mixed-signal oscilloscope, function generator, digital multimeter, programmable DC power supply and digital I/O. With 350 MHz of bandwidth, four analog channels and Ethernet connectivity, the new version of VirtualBench offers increased functionality for engineers characterizing and debugging new designs or automated test systems.
USB 3.1 Power Delivery Compliance Test Suite
25 January 2016 – Teledyne LeCroy announced the release of the Power Delivery Compliance Suite for the Voyager M310C SuperSpeed USB 3.1 protocol verification platform. Based on the Power Delivery (PD) Compliance Plan v1.0, this automated test suite, allows developers to verify functionality, error recovery, and compliance for PD chipsets and end-products.
World's First 50Gb Ethernet Test System
22 January 2016 – Spirent unveiled the world’s first 50Gb/s Higher Speed Ethernet test solution that will enable its customers to meet the growing needs of the cloud service provider (CSP) space. Spirent has successfully completed the industry’s first 50GbE interoperability test with a global leader in cloud services and infrastructure.
16-Bit Arbitrary Waveform Generators with 1.25 GS/s Sample Rate
21 January 2016 - Spectrum released two Arbitrary Waveform Generators (AWG's) that set new standards for speed, precision and size. The models offer one or two channels each capable of outputting electronic signals at rates of up to 1.25 Gigasamples/second (GS/s) with 16-bit vertical resolution. The combination makes these new AWG's ideal for generating high frequency signals up to 400 MHz with the best possible accuracy and fidelity.
Simultaneous Acquisition of high-speed Data and slower CANbus Signals
20 January 2016 - The new version of HBM's Perception software for ultra high-speed data acquisition also simultaneously acquires slower CANbus signals while simplifying handling with freely definable buttons (User Keys). Perception and Genesis high-speed data acquisition instruments are ideally suited for measuring at extremely high measuring rates and processing large quantities of data.
SIGLENT Technologies releases new Spectrum Analyzer Series
19 January 2016 - SIGLENT Technologies introduced its newest member of the X-Instrument family, the SSA3000X Series Spectrum Analyzer series. With its optional tracking generator (up to 3.2 GHz), bright and easy-to-read display, and high-accuracy / high-resolution measurement capability, the SSA3000 series spectrum analyzer is designed to test and analyze signals in the 9 kHz to 2.1 GHz / 3.2 GHz range. As the newest member of SIGLENT’s X-Instrument family the SSA3000X feaatures a 10.1-inch WVGA（1024x600) wide screen display and user-friendly interface.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI Anritsu AOI National Instruments Keysight Automotive Advantest EMC spectrum analyzer Aeroflex Keithley Inspection signal Generator Power supply Yokogawa signal analyzer AXI Teledyne LeCroy Multitest Handheld LeCroy calibration network analyzer Switching wireless USB TESEQ Semiconductor Test Semiconductor characterization probe
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