|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Handler for testing advanced Memory ICs
11 December 2014 - Advantest Corporation introduced its new M6245 test handler, offering industry-leading productivity with minimal downtime by incorporating the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The M6245 handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.
USB Oscilloscope acquires more than 100,000 waveforms per second
11 December 2014 - Pico Technology improved its PicoScope 6 software for PC oscilloscopes and increased the continuous update rate to more than 100,000 waveforms per second. This is faster than any other PC oscilloscope, and beats many expensive benchtop oscilloscopes too. The new fast persistence mode is available on all Pico oscilloscopes from the PicoScope 3000 Series upwards.
B&K Precision updates Arbitrary/Function Waveform Generator Line
10 December 2014 - B&K Precision updated its 4075B Series of arbitrary/function waveform generators with higher frequency ranges, increased arbitrary memory, and a color LCD. The new 4075B Series offers six new models that directly replace the previous 4075 line with single- and dual-channel 30 MHz (4075B/4078B) and 50 MHz models (4076B/4079B) along with two additional single- and dual-channel 80 MHz models (4077B/4080B).
AOI for oversized PCBs
10 December 2014 - GOEPEL electronics offers a new variant of the inline AOI system AdvancedLine for the inspection of overlength PCBs. The longboard AOI system enables testing of assembled and soldered PCBs with a length of up 1,600mm. An adjustment for even longer PCBs is also possible due to the flexibility of the overall design. A suitable usage scenario is the quality control of lighting modules, which are used for cabin lighting of passenger aircrafts.
Tektronix releases Test Solution for MIPI M-PHY Specification v3.1
09 December 2014 - Tektronix announced the first physical layer transmitter characterization and debug solution for the MIPI M-PHY v3.1 specification recently approved by the MIPI Alliance. The new Tektronix solution includes support for MIPI M-PHY High Speed Gears 1, 2 and 3, PWM Mode (G0-G7), and SYS Mode and offers the industry’s lowest noise solution for MIPI M-PHY measurements when used with Tektronix MSO/DPO 70000DX oscilloscopes and P7600 series probes.
Prewired Rack for High-Power DC Applications up to 90 kW
09 December 2014 – Keysight Technologies introduced a rack system for high-power DC applications. The prewired N8900 Series rack system reduces system complexity and saves time for engineers designing and implementing high-power systems for challenging applications requiring up to 90 kW.
ESD Safety guaranteed Workbench System
08 December 2014 - Special protected areas are established in the electrical and electronics production industry in order to prevent damage to sensitive components as a result of electrostatic discharge (ESD). However, the applicable regulations there are not always heeded. The workbench system Primus One offered by ELABO eliminates multiple sources of error thanks to a means of self-control to protect against ESD and is the first system of its type to be awarded EPA certification.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel LTE PXI AOI Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Keysight Switching Semiconductor Test USB network analyzer Viscom wireless characterization probe SPI
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