|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Interview: We offer Test Hardware and Test IP on a Subscription Model
Advantest introduced in September 2013 a new revolutionary semiconductor test solution named CloudTesting. The new concept is targeted for silicon validation and debugging and offered only as a service. All-about-Test talked to Mr. Manabu Kimura, President and Representative Director of Cloud Testing Service, Inc. asubsidiary of Advantest, about the success of this new business model.
Finding Faults in paired metallic Cables
09 April 2014 - Offering compatibility with virtually all types of paired metallic cables, comprehensive dual-channel operation, auto set up for instant use and excellent near-end fault location performance, as well as internal storage for up to 100 traces, the new TDR2000/3 time domain reflectometer from Megger is the ideal choice for rapidly, reliably and conveniently locating cable faults in telecommunications and street lighting systems.
MVG and AR Europe form EMC Systems Partnership
08 April 2014 - MICROWAVE VISION Group (MVG) and AR agreed on a EMC Systems Partnership. This new agreement will allow both companies to offer quality EMC turnkey systems based upon their combined expertise and product portfolio throughout the UK, Benelux and Germany.
Conformance Test System achieves GCF Validation for LTE-A Mobile Terminal Certification
08 April 2014 - Anritsu announced that the ME7873L RF Conformance Test System has become the world’s first GCF-approved mobile test system to achieve more than 80% of test cases approved for LTE-Advanced Carrier Aggregation. Conformance Test systems must obtain GCF approval for at least 80% of test cases as a condition of them being accepted for use in terminal certification by GCF.
Market Research: Expansive Increase of Smartphone Use creates Need for Mobile Data Monitoring Solutions
07 April 2014 – Over the next five to ten years, data traffic is expected to increase exponentially due to the growing adoption of smartphones globally. This amplified volume of data will place considerable strain on the networks of communication service providers (SPs) and their information management systems, thereby stoking demand for mobile data monitoring systems.
Network Analyzer for Active Device Tests with 8.5 GHz
07 April 2014 – Agilent Technologies expanded its flexible PNA-X family of network analyzers with an 8.5 GHz model that more economically supports lower-frequency devices used in wireless communication applications (e.g., handsets, base stations, WLAN and other mobile communication devices). With low-noise amplifier tests there are typically multiple test stations, such as small signal gain/match, distortions and noise figure; the PNA-X integrates these test stations into one.
High-Volume Testing of Ultra-Fast SerDes Applications
04 April 2014 - Advantest Corporation introduced its newest digital channel card, the Pin Scale Serial Link (PSSL) card, for at-speed characterization and volume production of today’s high-speed semiconductors. PSSL is the fastest fully integrated automated test equipment (ATE) instrument on the market, capable of data rates up to 16 Gbps.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI LTE AOI Anritsu National Instruments Advantest Aeroflex Inspection Automotive Keithley EMC spectrum analyzer LeCroy signal Generator signal analyzer AXI Yokogawa Power supply Multitest Handheld TESEQ calibration SPI Switching USB Semiconductor Test wireless Pico Technology ASSET InterTech characterization Viscom Corelis
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