|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Test of DIMM Sockets with universal JTAG Hardware
12 July 2016 - JTAG Technologies announced a new family of hardware adapters specifically designed for testing of a variety of DIMM & SODIMM sockets (sizes and styles) using a JTAG/boundary-scan controller and supporting software. The problem of testing DIMM memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems.
Anritsu and Keycom sign Automotive Radar Test Collaboration
11 July 2016 - Anritsu and Keycom have signed a collaboration agreement based on which Anritsu becomes the exclusive distributor in EMEA of the Keycom Radar Test System developed for verification of automotive radars.
PXI Express High-Speed Source/Measure Unit
11 July 2016 – Keysight Technologies announced its first PXI Express source/measurement unit, the M9111A, purpose-built for design validation and production test of next-generation power amplifiers and front-end modules supporting cellular and wireless connectivity formats. The high-speed M9111A changes voltage, stabilizes and accurately measures micro-Amps, all in less than 1 ms. The PXIe entry achieves speeds 20 times faster than those for previous-generation, stand-alone Keysight SMUs at a fraction of the size.
NI launched new NI VeriStand Software
08 July 2016 – National Instruments (NI) released the latest version of its VeriStand software, which embedded software design and test engineers use to develop hardware-in-the-loop (HIL) test systems. Today’s engineers face increasingly compressed, shifting schedules and constantly changing requirements driven by the integration of new technologies. VeriStand and NI’s HIL systems are the most open and customizable platforms available on the market to help companies meet these changing demands and future proof their test systems.
Rohde & Schwarz appointed new President and CEO
07 July 2016 - As of July 1, 2016, Christian Leicher and Peter Riedel lead Rohde & Schwarz. Leicher, the new President and CEO, has been a member of the Executive Board since 2005. With his appointment as President and CEO, a managing partner is now taking the helm at Rohde & Schwarz. Riedel remains President and COO. He has worked successfully for Rohde & Schwarz for 25 years and joined the Executive Board two years ago.
Cost-Effective Testing of RF Semiconductors
07 July 2016 - Advantest introduced its Wave Scale generation of channel cards for the V93000 platform, which delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal ICs for wireless communications. Designed for highly parallel multi-site and in-site parallel testing, the new V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF semiconductors while creating a path for testing future 5G devices.
PCI Express 4.0 Test Solution supports Data Rates up to 16 GT/s
06 July 2016 - Tektronix announced a series of enhancements to its suite of PCI Express (PCIe) test solutions including support for the 16 GT/s data rate and the industry’s first automated transmitter and receiver test solutions supporting the PCIe 4.0 architecture. With the faster data rates for PCIe 4.0 technology come new test challenges such as major increases in channel loss, tightening of the total jitter budget and more complex link training and timing requirements.
More Articles ...
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
RSS FeedSubscribe to RSS Feed
© All about Test 2016