|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
USB and LAN Diode Sensors for fast and accurate Power Measurements
18 March 2015 - Rohde & Schwarz has enhanced its sensor portfolio with the new R&S NRPxxS and R&S NRPxxSN USB three-path diode power sensors. The new models offer even more flexibility. In addition to the well-established USB sensors, new sensors that support LAN are now available. LAN is the ideal choice for remotely controlled applications over large distances. The completely redesigned sensors offer unprecedented measurement speed and measurement accuracy, even at low levels.
Overlay and Films Process Control Solutions for advanced IC Processes
17 March 2015 - KLA-Tencor Corporation introduced two advanced metrology systems that support the development and production of 16nm and below IC devices: Archer 500LCM and SpectraFilm LD10. The Archer 500LCM overlay metrology system provides accurate overlay error feedback through all stages of the yield ramp, helping chipmakers resolve overlay issues associated with innovative patterning techniques, such as multi-patterning and spacer pitch splitting.
OTA Performance Testing
16 March 2015 - Bluetest recently added air interface testing for Bluetooth and TD-SCDMA and completes its line-up of supported wireless standards enabled by the Rohde & Schwarz CMW500 Wideband Radio Communication Tester. The easy to use Bluetest Measurement Suite software controls the R&S CMW500 Wideband Radio Communication Tester as well as the Reverberation Test System (RTS) producing fast and accurate Over the Air (OTA) measurements of the wireless device under test.
Network Tester to support LTE-A Release 11 CoMP
16 March 2015 – Cobham Wireless, formerly Aeroflex wireless business unit, announced that the TM500 network tester family now also supports Coordinated Multipoint transmission/reception (CoMP), a major feature of 3GPP LTE-A Release 11. The TM500 already supports key LTE-A features such as carrier aggregation of two and three component carriers, TDD/FDD carrier aggregation, and eICIC.
Cooperation for Test and Validation of IoT Devices
13 March 2015 - GOEPEL electronics and the Colorado-based software technology company KOZIO enter into a strategic cooperation. The aim of the partnership is to develop new embedded tools. A particular focus will be on real-time solutions for validation and production test of complex microprocessor controlled designs, which is notably relevant for the Internet of Things (IoT).
Multi-channel Data Acquisition System with unique Phase Coherency
12 March 2015 – Keysight Technologies developed a highly dense, 64 synchronous multichannel data acquisition system. The system is composed of eight M9703A AXIe high-speed digitizers in a 14-slot chassis and was developed for an enterprise leader in satellite telecommunication systems, where its main requirement was multichannel synchronization and FPGA programming capability.
PXI Embedded Controller and high Bandwidth Chassis
11 March 2015 - National Instruments (NI) announced the NI PXIe-8880 controller, which is based on the Intel Xeon processor, and the NI PXIe-1085 chassis, which is the industry’s first chassis that uses PCI Express Gen 3 technology. The combination of the eight-core, server-class Intel Xeon processor E5-2618L v3 and full system bandwidth of 24 GB/s delivers breakthrough performance for computationally intensive and highly parallel applications such as wireless test, semiconductor test and 5G prototyping.
Agilent Oscilloscope JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Power supply Keysight LeCroy AXI Yokogawa Multitest Handheld calibration Switching Semiconductor Test TESEQ USB Teledyne LeCroy characterization network analyzer wireless Viscom Pico Technology
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