|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Easy-to-Use Vision Sensor for Color Applications
22 July 2014 - Cognex Corporation introduced the Checker 4G7C, an easy-to-use color vision sensor that distinguishes parts by color. Checker 4G7C delivers 376 x 240 inspection resolution with Ethernet support for industrial protocols and high-intensity white LED illumination for the detection and inspection of parts and features at up to 800 parts per minute.
RF Conformance Test System for Vehicle-to-Vvehicle Applications
21 July 2014 — The new R&S TS-ITS100 of Rohde & Schwarz is the first fully automated test system for standard-compliant testing of RF components in line with IEEE 802.11p. These components are used for vehicle-to-vehicle communications and intelligent transport systems (ITS). Thanks to its compact size, the RF conformance test system can be used throughout the entire value chain – from R&D to precompliance and compliance testing.
Agilent enhances CXA Signal Analyzer with additional Functionality
21 July 2014 – Agilent announced enhancements to the N9000A CXA X-Series signal analyzer that broaden its use in RF and microwave applications. The CXA platform now supports the Windows 7 operating system, giving it better performance and stability. Additional enhancements include RF CXA phase noise that now provides up to a 10 dB performance improvement, enhancing test result accuracy. Also, there is now an extension to the analyzer’s operating temperature range for guaranteed performance between 0°C to 55°C.
1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing
18 July 2014 – Advantest introduced a new T2000 1.6GDM digital module, designed to improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform. The 1.6-Gbit-per-second module incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing, in which the tester communicates directly with the devices under test (DUTs) in each IC’s protocol language. A powerful EDA-Link, called FTA-Elink, connects the design simulator to the T2000 test platform directly.
Lead Resistance Calculator App eliminates Test Errors
18 July 2014 - Seaward offers a user friendly App to help PAT professionals carry out earth continuity testing efficiently and accurately. The new Lead Resistance Calculator App for android devices provides a fast and simple means of determining the acceptable resistance of appliance cables and leads, eliminating the need for test engineers to use look up tables or calculate resistance values manually.
High Voltage Differential Probes for Oscilloscopes
17 July 2014 - Teledyne LeCroy introduced the HVD High Voltage Differential probe series delivering high common-mode rejection ratio (CMRR) across a broad frequency range. The new HVD differential probes are safe, easy to use and ideally suited for a variety of power electronics measurements. The wide 1500Vp-p differential voltage range and large offset capability provides maximum flexibility for capturing gate drive and control signals floating on a 1000 Vdc bus. This performance combined with 1% DC and low frequency gain accuracy means the HVD differential probes enable high precision, high voltage measurements.
Wireless Test Set supports 4x4 True MIMO
17 July 2014 – Agilent announced that its EXM wireless test set now supports 4x4 True MIMO capability for WLAN design and validation, with up to four TRXs testing multiple-input, multiple-output antenna characteristics simultaneously. Other new features for the EXM include WLAN combined measurements that support transmitter beamforming test for device calibration testing, and independent source and analyzers for parallel receiver and transmitter testing to further speed up and optimize WLAN device manufacturing.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator LeCroy signal analyzer Power supply AXI Yokogawa Handheld Multitest TESEQ Switching calibration SPI Semiconductor Test wireless Viscom USB characterization Pico Technology Corelis ASSET InterTech
© All about Test 2014