|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
High-speed LXI Digitizers with 8 GSamples On-Board-Memory
08 May 2015 - For applications where fast electronic signals in the GHz range need to be remotely acquired and analyzed, Spectrum has extended its popular digitizerNETBOX series of LXI based instruments and released eight new models. Available with two, four or eight fully synchronous channels, the new units feature sampling rates up to 5 GS/s, bandwidth in excess of 1.5 GHz and on-board acquisition memory up to 8 GSamples.
USB 2.0 and Power Delivery Protocol Analyzer
07 May 2015 – Teledyne LeCroy continues to add support for the new USB Type-C and Power Delivery 2.0 standards with introduction of the Mercury T2C USB Power Delivery and USB 2.0 Protocol Analyzer. The Mercury T2C joins the Teledyne LeCroy USB Voyager M310C, which together provide the USB development community with extensive levels of capability for test, validation and compliance of the emerging USB standards. The USB Type-C and USB Power Delivery 2.0 standards introduce entirely new USB cables and connectors expected to significantly improve user experience.
SMH Technologies introduces first PXI In-System Programmer
06 May 2015 - SMH Technologies developed the new universal programmer FRPXIA3. FlashRunner FRPXIA3 based on FlashRunner technology, the extremely fast and reliable programming system for Flash-based microcontroller and serial memories is the first in the world programming solution for PXI system with fully hardware and software ATE integration and Multi-target parallel programming channels.
Boundary Scan Analyzer supports Intel Microarchitecture Codenamed Skylake
05 May 2015 - Keysight announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel microarchitecture codenamed Skylake. The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT).
Probe Family for RF Signal Testing of PCBAs
05 May 2015 - Everett Charles Technologies (ECT) launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion.
Software optimizes automated testing using Network Analyzers
04 May 2015 - The new R&S ZNrun software from Rohde & Schwarz assists users in configuring measurements specifically for multiport DUTs using Rohde & Schwarz vector network analyzers (VNA). The user selects the VNA and any additional test equipment for example an R&S ZNB vector network analyzer and an R&S ZN-Z84 switch matrix and sets the parameters to be measured on the DUT. Based on this information, the R&S ZNrun software takes over communications with the test equipment, makes all of the settings, and executes and controls the test sequence. This procedure simplifies in particular the time-consuming characterization of multiport components.
High-Density PXI Reed Relay Matrix
04 May 2015 - Pickering Interfaces introduced an improved high-density PXI reed relay matrix module. This new model 40-533B is available as either a 64x4 or 64x2 matrix, and features 1 pole or 2 pole versions, up to 1A 150VDC/100VAC 15W hot switching and support for Pickering’s Diagnostic Test Tools – BIRST and eBIRST.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex EMC Inspection Keithley spectrum analyzer Keysight signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ Semiconductor Test characterization Semiconductor network analyzer probe wireless
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