|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Rohde & Schwarz introduces new Oscilloscope Family
27 February 2014 — Rohde & Schwarz presented on the Embedded World trade fair in Germany the new R&S RTE oscilloscope family. The instruments are available with bandwidths from 200 MHz to 1 GHz, with an acquisition rate of more than one million waveforms per second and ahighly accurate digital trigger system with virtually no trigger jitter. With a sampling rate of 5 Gsample per second and a maximum memory depth of 50 Msample per channel, the R&S RTE can accurately record the long signal sequences required when analyzing the data content of serial protocols such as I2C and CAN.
Aeroflex introduces Base Station RF Tester
27 February 2014— Aeroflex introduced a base station (BS) RF tester for all popular cellular and non-cellular wireless standards, including LTE/LTE-A and WiFi. Designed for production test of BS and associated RF components, the tester can be used for both RF design verification and production test on small cells, as well as replacing conventional rack-and-stack instruments for macro BS RF test.
Tool for automated Module Integration Testing of embedded Software
26 February 2014 - The new version 3.1 of TESSY from Hitex Development Tools, a tool for automated unit / module / integration testing of embedded software, features additional coverage measures and can also generate test cases from given values. With the additional coverage measures TESSY adheres better to the requirements of different standards with respect to functional safety.
Tektronix integrates six Instruments in one Oscilloscope
26 February 2014 – The new MDO3000 Series of Mixed Domain Oscilloscopes of Tektronix includes a spectrum analyzer, logic analyzer, protocol analyzer, arbitrary function generator and digital voltmeter - all in one instrument. The MDO3000 clears the design bench of costly, specialized equipment and provides the tools needed to test and debug virtually any embedded design. In addition the MDO3000 is completely customizable enabling customers to select the functionality and performance needed now and later.
Wireless Test Set enables Insights into LTE-Advanced Category 6 Chipsets
25 February 2014 – Agilent Technologies introduced the E7515A UXM wireless test set, a highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond. The UXM provides a broad range of capabilities that enable testing of the newest wireless device designs, delivering LTE-Advanced category 6 now and handling increasingly complex test cases in the future.
USB Oscilloscope with eight high-resolution Channels
25 February 2014 - The new 8-channel PC oscilloscope PicoScope 4824 from Pico Technology features eight high-resolution channels with 12-bit resolution, SuperSpeed USB 3.0 interface, and an integrated 14-bit arbitrary waveform generator (AWG). Like all PicoScopes, the 4824 is small, light, and highly portable; despite its high specification it is entirely powered via USB and does not require a bulky separate adaptor.
Full bi-directional Cat 6 LTE-A Mobile Handset Test Capability
24 February 2014 - Aeroflex announced that the 7100 Digital Radio Test Set provides LTE-A carrier aggregation testing at full Cat 6 data rates of 300 Mbps downlink and 50 Mbps uplink simultaneously for LTE-A in FDD mode, and now also supports carrier aggregation in TDD mode. The Cat 6 capability is available via an upgrade to the standard 7100 software and the use of a RF combiner, allowing users to maximize the potential of their existing test equipment investment.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI AOI LTE Anritsu National Instruments Advantest Aeroflex Inspection Keithley Automotive spectrum analyzer EMC LeCroy signal Generator signal analyzer AXI Yokogawa Power supply Multitest TESEQ Handheld calibration USB SPI Pico Technology ASSET InterTech Switching Viscom wireless characterization Corelis probe
© All about Test 2013