|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Rohde & Schwarz adds PIM Analyzer to its mobile Network Testing Portfolio
22 November 2016 - The network performance for LTE and LTE-Advanced in particular is negatively affected by passive intermodulation (PIM). Communication Components Inc. (CCI) has developed the PiMPro Tower Series, providing mobile network operators and their service providers with an ideal solution for PIM testing during the installation and maintenance of base stations. The PIM analyzer is now available exclusively from Rohde & Schwarz. The T&M expert offers single-source test solutions extending over the entire lifecycle of a mobile network.
NI Releases released new Version of HIL Software
21 November 2016 – National Instruments (NI) released VeriStand 2016, the latest version of its software used by embedded software test engineers to build and run hardware-in-the-loop (HIL) verification systems. Today’s engineers face increasingly compressed, shifting schedules and constantly changing requirements driven by the emergence of the connected car and autonomous vehicles. VeriStand and NI’s HIL systems are open and customizable platforms to help companies meet these changing demands and future-proof their test systems.
Network and Spectrum Analysis up to 1.5 THz
18 November 2016 – Keysight Technologies announced that it has collaborated with Virginia Diodes, Inc. (VDI) to create a 1.5 THz measurement solution for Chalmers University of Technology, a leading research university located in Gothenburg, Sweden. Already up and running in Chalmers’ national laboratory for terahertz characterization, this industry-first solution provides network and spectrum analysis capabilities for research on new materials, devices, and circuits for applications at micro-, millimeter- and sub-millimeter-wave frequencies.
BBU Emulation Capability for LTE RRHs
17 November 2016 – Anritsu Company expands its industry leading CPRI test portfolio with the introduction of a BBU Emulation capability for its BTS Master MT8220T that saves significant time and cost when verifying LTE cell site operation. The BTS Master MT8220T with BBU Emulation provides wireless technicians, engineers and contractors with all the necessary tools to validate that a RRH (Remote Radio Head) is installed properly and functional, before the Base Band Unit (BBU) is commissioned.
Combination of 3D and 2D Inspection
16 November 2016 - Mek (Marantz Electronics) launched GTAz, its newest and most advanced optical head available on the company’s PowerSpector and SpectorBOX range of AOI machines. The GTAz delivers true Stereoscopic imaging using its 9 high speed (90 Fps) cameras operating in full 24 bit color. This new generation optical head removes the need for expensive capture cards utilising Thunderbolt2 20GBs transfer speeds and full frame transfer.
IPTE introduced Shuttle Test Handler
15 November 2016 - IPTE completed its test handler product portfolio with a manual Shuttle Test Handler (STH). The shuttle allows the operator to remove/insert PCBs while another one is being tested. A set of carriers is used to hold the PCB in position. This enables odd-form PCBs to be tested. The STH is equipped with a pneumatic press-unit of 1.500 N with a moving lower fixture. This results in no moving wires for top side contacting. Transfer blocks can be used to transfer measurement signals from top to bottom.
JTAG/Boundary Scan available for Flying Prober Testers from TAKAYA
14 November 2016 - GÖPEL electronic and SYSTECH Europe have developed a JTAG/Boundary Scan integration for the APT-1400F TAKAYA Flying Probe Testers (FPT). The solution is based on complete integration of the Boundary Scan hardware SCANFLEX and the software SYSTEM CASCON. A cost-effective and time-efficient platform for testing electrical assemblies during production is therefore offered in combination with the Flying Probe Tester from TAKAYA.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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