|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Radio Communication Analyzer supports LTE-Advanced Testing
23 June 2015 – Anritsu launched the new Radio Communication Analyzer MT8821C for research and development testing of mobile devices (User Equipment, UE). As well as supporting LTE-Advanced, the all-in-one MT8821C operates as network simulator supporting LTE, W-CDMA/HSPA, GSM/GPRS/EGPRS, TD-SCDMA/HSPA, and CDMA2000 1X/1x EVDO technologies to run RF TRX tests in compliance with the 3GPP and 3GPP2 standards, as well as parametric tests.
3D AOI for small-batch Production
22 June 2015 - GOEPEL electronics launched a stand-alone AOI system with 3D measurement module. BasicLine•3D allows shadow-free, three-dimensional inspection of printed circuit boards in small and medium-sized batches. Thanks to the innovative measurement technology, the AOI system with manual loading is given an enhancement to the orthogonal camera and rotating angled-view module.
NI opened Wireless Innovation Lab for 5G Research
19 June 2015 – NI (National Instruments) announced the opening of the new Wireless Innovation Lab at its Austin headquarters. In the lab, NI supports ongoing collaborations with top academic and industry research groups participating in its RF/Communications Lead User program. Researchers at Intel, Lund University, Nokia Networks, NYU Wireless, Samsung, The University of Texas at Austin and TU Dresden are driving significant advances in the development of next-generation wireless systems and furthering research in 5G.
Test Module for Magnetic Rotation Sensors
18 June 2015 - Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module allows for x and y axis testing of magnetic sensors on a flexible and well-established pick and place handler platform. The MRS module, which was originally available for only the MT9928, now also supports test and calibration of sensors in packages which are typically handled on pick and place handlers.
Keysight Technologies Extends Duration of Instrument Service, Warranties for New and Out-of-Production Models
17 June 2015 – Keysight Technologies announced that it has extended the available service period beyond the industry standard for many of its popular instruments that are no longer in production. The new Extended Service Period (ESP) program addresses a frequent request from customers who need to keep crucial test equipment operating over the life of multi-decade programs. In addition, Keysight is now offering multi-year Warranty Assurance plans that enable end users to lock in peak instrument performance for up to 10 years.
FFT Analyzer for low Frequency electromagnetic Fields
17 June 2015 – Narda Safety Test Solutions has launched a new FFT analyzer for low frequency electromagnetic fields. The EHP-50F measures and analyzes electric and magnetic field strengths in the frequency range 1 Hz to 400 kHz and evaluates the results in accordance with current human safety standards.
Teradyne offers Real-time and Offline Test Data Analysis Software
16 June 2015 - Teradyne announced that it entered into an OEM agreement to provide an integrated, advanced analysis capability for Teradyne's entire line of semiconductor test equipment. Under the terms of the agreement, Teradyne will integrate special versions of Galaxy's Examinator and Examinator-Pro software as an option to its Semiconductor Test platforms.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Keysight EMC Inspection Keithley spectrum analyzer signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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