|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
NI announces new Software-Designed Instruments
11 September 2014 – National Instruments announced a range of new software-designed instrument: 8-channel oscilloscope, RF vector signal analyzer, frequency digitizer and a high-speed serial instrument. Two years ago, NI introduced the first software-designed instrument, the vector signal transceiver.
Frost & Sullivan: PXI Lowers Cost and Time to Market
11 September 2014 - Original equipment manufacturers (OEM) across industries are adopting PCI extensions for instrumentation (PXI)-based instrumentation as its measurement speed, small footprint, low power consumption, and flexibility reduce the time to market and overall cost of tests. In particular, companies in the wireless communications space are turning to these solutions to satisfy new test requirements for radio frequency (RF) wireless technologies. A new analysis from Frost & Sullivan, PXI Market to Change the Face of the Test and Measurement Industry, finds that the market earned revenues of $563.3 million in 2013 and estimates this to reach $1.75 billion by 2020.
Femto/Picoammeters and Electrometers for Materials Research
10 September 2014 – Keysight Technologies introduced the B2980A Series of femto/picoammeters and electrometers, the world’s first graphical picoammeters and electrometers to confidently measure down to 0.01 fA which is 0.01 x 10E-15 A, and up to 10 petaohms (PΩ) which is 10 x 10E15 ohms. Since AC power line noise can be difficult to eliminate when making low-level measurements, both instruements are available in battery powered versions. All B2980A series products have a 4.3” liquid crystal display that supports a variety of viewing modes (numeric, trend chart and histogram), which eliminates the need to perform data analysis on a PC.
GOEPEL electronic aims to establish Boundary Scan technology in Asia
10 September 2014 - GOEPEL electronic announces another strategic partnership in the Asian region, by the inclusion of the Chinese technology company Pansino Solutions, into the GATE Alliance Program (GOEPEL Associated Technical Experts). The main focus of the cooperation is special application development and practical implementation of new JTAG/Boundary Scan solutions as well as their integration into existing test systems.
High-Voltage Insulation Testing and Analysis
09 September 2014 - The new TANDO 700 of OMICRON is a precise measuring and analysis system for dissipation/power factor (Tan Delta) and capacitance of insulation in high-voltage (HV) equipment. Due to its compact and lightweight design, TANDO 700 can be easily transported for use in many different test areas. The system provides reliable measurement accuracy even in heavy interference environments, including power plants, substations and unscreened test labs.
Anritsu received Global Field RF Testing Leadership Award from Frost & Sullivan
09 September 2014 – Anritsu has received the 2014 Frost & Sullivan Customer Value Leadership Award in the Global Field RF Testing market, recognizing Anritsu’s position as a preeminent supplier of test solutions used in the deployment, installation, and maintenance of wireless networks. Frost & Sullivan, a leading global research organization, cited Anritsu’s focus on innovation and customer centricity, as well its industry-leading portfolio of handheld field solutions in presenting Anritsu with the award.
Battery Analyzers simplify the testing Battery Backup Systems
08 September 2014 - The new Fluke 500 Series Battery Analyzers simplify the workflow of testing stationary batteries and battery banks through an intuitive user interface that provides quick, guided test setups ensuring technicians are capturing the correct data while visual and audio feedback cues reduce the risk of errors.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator LeCroy Power supply signal analyzer AXI Yokogawa Multitest Handheld TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
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