|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Desktop Tester supports Embedded System Access
10 May 2013 - GOEPEL electronic presents a number of new features for its desktop tester series JULIET. The systems now support all Embedded System Access (ESA) technologies for high-speed in-system programming of Flash, PLD and MCU as well as structural and functional at-speed board test. In addition to traditional Boundary Scan, test strategies such as Processor Emulation and Chip Embedded Instruments based on VarioTAP and ChipVORX technologies are supported.
Test and Debug Solution for Texas Instruments’ Hercules MCU Platform
09 May 2013 - With their Universal Debug Engine (UDE) 4.0.4, PLS Programmierbare Logik & Systeme have introduced an optimized test and debug solution for Texas Instruments‘ Hercules microcontroller platform which has been developed especially for security-critical applications in compliance with IEC 61508 SIL-3 or ISO 26262 ASIL D.
Free Data Acquisition Software and ActiveX Controls Library
08 May 2013 - ADLINK Technology announces free download availability of AD-Logger, its ready-to-run data capture application, and DAQBench, providing ActiveX controls for creating professional instrumentation applications using ActiveX development environments. Having placed hundreds of data acquisition modules on the market, ADLINK has developed a variety of data acquisition and development tools for reducing development time and providing complete data logging solutions.
Vector Signal Generator for complex multichannel Scenarios
08 May 2013 - The new R&S SMW200A high-end vector signal generator from Rohde & Schwarz combines maximum flexibility, outstanding performance and intuitive operation for generating complex, digitally modulated signals of high quality. Thanks to versatile configuration options, its range of applications extends from single-path vector signal generator to multichannel MIMO receiver tester. The new R&S SMW200A combines a baseband generator, RF generator and MIMO fading simulator in a single instrument.
802.11ac Standards and MIMO Technology to drive Global RF Test Equipment Market
07 May 2013 – The deployment of progressively more complex telecommunication techniques, including 802.11ac, together with the adoption of advanced multiple-input, multiple-output (MIMO) technologies will fuel the global radio frequency (RF) testing market, says Frost & Sullivan. The new analysis finds that the market earned revenues of $3.02 billion in 2011 and estimates this to reach $4.20 billion in 2016.
Agilent Oscilloscope JTAG Boundary Scan Tektronix Goepel PXI AOI Anritsu LTE National Instruments Inspection Keithley LeCroy Advantest Aeroflex spectrum analyzer Automotive EMC signal analyzer signal Generator Multitest Yokogawa AXI TESEQ calibration Power supply Switching Handheld GAO Tek Corelis Geotest characterization USB ASSET InterTech probe Battery Test Viscom
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