|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
PXI-based Semiconductor Tester
13 January 2015 – Marvin Test Solutions announced the TS-960, the newest version of its successful TS-900 semiconductor test platform. The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE.
Associated Research announces 3-year Standard Warranty on Select Models
12 January 2015 – Associated Research is now providing a standard 3-year warranty on the electrical safety compliance testers OMNIA II Series & LINECHEK II. This guarantees these new AR instruments to be free from defects in workmanship for a period of up to 3 years from the date of shipment.
Software for testing Switching Power Supplies
12 January 2014 – Rigol Technologies EU GmbH has released a new PC Software, which enables users to perform standard measurements on switching power supplies. This software, in combination with Rigol oscilloscopes (series DS/MSO2000A, DS4000 or DS6000) allows customers to set up small test systems, which represent a reasonably priced alternative for measuring switching power supply parameters during the development phase.
High-Speed 5 GS/s PCIe Digitizer Cards
09 January 2015 - Spectrum added nine new models to its series of PCIe based M4i digitizers with real-time sampling rates up to 5 GS/s. The high bandwidth allows to measure signals, edges and pulses down into the sub nanosecond realm. Available with one, two or four channels, the new cards can replace conventional test instruments such as digital oscilloscopes and spectrum analyzers.
DEKRA expands its EMC and wireless testing Capabilities
08 January 2015 - DEKRA strategically expanded its product testing business in Asia. The expert organisation has signed an agreement for acquisition of the QuieTek Corporation in Taipei, Taiwan. This purchase compliments DEKRA’s service portfolio and further strengthens DEKRA’s position in testing of electrical and electronic products and components.
CAN FD Interface Module for Prototyping and HIL
08 January 2015 - With its latest software release 2014-B, dSPACE is now offering a new plug-on device – the DS4342 CAN FD Interface Module. This module includes the new CAN FD communication standard, which can be used with existing systems for rapid control prototyping (RCP) and hardware-in-the-loop (HIL) applications. The DS4342 uses FPGA technology to support current CAN FD features and to easily address future requirements.
I/Q Data Recorder with 100 Msample/s Data Rate
07 January 2015 - Rohde & Schwarz enhanced its R&S IQR100 digital I/Q data recorder with a new firmware update providing a data rate of nearly 100 Msample/s instead of the original 66 Msample/s. In addition the capacity of the exchangeable memory pack has been increased from 1 Tbyte to 2 Tbyte.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI LTE AOI Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld Keysight calibration Semiconductor Test TESEQ Switching USB network analyzer Viscom wireless characterization probe SPI
© All about Test 2014