|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Characterizing Displays and electronic Graphics Panels
12 February 2015 – Instrument Systems presents the new imaging photometer and colorimeter LumiCam 1300 Advanced. It has been designed for the highest accuracy when analyzing the characteristics of displays and electronic panel graphics. The innovative camera concept of the LumiCam 1300 Advanced is based on six filters. Alongside the four optical filters used in the LumiCam 1300 Color, the new camera has been expanded by two filters.
Complete eMBMS Test Solution
11 February 2015 – Anritsu released a protocol test solution for Enhanced Multicast Broadcast Multimedia Service (eMBMS). The new solution is already helping mobile chipset and device makers accelerate the development of products that can receive LTE broadcast services. EXPWAY’s e-Cast Broadcast Multicast Service Center (BM-SC) Server has been integrated with Anritsu’s MD8430A LTE signaling tester and Rapid Test Designer (RTD) test environment to create a complete test solution.
PXI/PCI Test Solution for CAN-FD Interfaces
10 February 2015 - GOEPEL electronics will introduce an extension of its multi bus controllers Serie 61 to the CAN-FD interface PXI/PCI-6153 FD at the embedded world show in Nuremberg, taking place on 24 to 26 February. The communication interface supports the latest Bosch standards. As a further highlight new interfaces supporting the SENT protocol will be presented, which are ideal for calibration and the endurance test of sensors with SENT interface.
Cost-efficient and flexible Solution for Managing Power Dissipation at Test Cells
10 February 2015 - The Multitest ATC option for the MT2168 pick-and-place handler offers a cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production.
New Version of Automated Characterization Software for WLR and Power Semiconductor Testing
09 February 2014 - Keithley released a new version of its Automated Characterization Suite (ACS) software with more support for the development and characterization of semiconductor power devices and wafer level reliability (WLR) testing. Also ACS now supports the Model 2657A High Power Source Measure Unit (SMU) Instrument's ability to source or sink up to 3,000V and the new 10kV Model 2290 Power Supply.
Keysight Technologies enters Power Analyzer Market
09 February 2015 - Keysight Technologies introduced the first power analyzer that combines accurate power measurements and touch-driven oscilloscope visualization capability in a single instrument. The Keysight IntegraVision power analyzers are ideal for R&D engineers who want to quickly and interactively measure AC and DC power consumption, power conversion efficiency, operational response to stimulus and common AC power parameters such as frequency, phase and harmonics. The instrument features 0.05 percent basic accuracy, 16-bit resolution, 5 MS/s sample rate and 2 MHz bandwidth.
Cascade Microtech introduces new Version of Probe Station Control Software
06 February 2015 - Cascade Microtech announced Velox 2.0, the latest version of probe station control software. Combining the ease of Nucleus with the power of ProberBench, Velox 2.0 delivers new levels of test and measurement efficiency to accelerate time to job completion.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Keysight Multitest Handheld calibration Semiconductor Test Switching TESEQ USB Teledyne LeCroy characterization wireless network analyzer Viscom Pico Technology
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