|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Clamshell BGA Test Socket with Bluetooth Temperature Monitoring
13 July 2015 - Ironwood Electronics introduced a new BGA socket addressing high performance requirements for testing BGA devices with smart features. The contactor is a stamped spring pin with 17 gram actuation force per ball and cycle life of 500,000 insertions. The self inductance of the contactor is 0.98 nH, insertion loss < 1 dB at 21.9 GHz. The current capacity of each contactor is 4 amps at 30C temperature rise. Socket temperature range is -55C to +180C. Socket also features a floating guide for precise ball to pin alignment. BGA socket also features Bluetooth electronic module integrated into the top portion of the socket (compression plate).
BGA Interposer for Probing DDR4 x16 Designs with a Logic Analyzer
10 July 2015 – Keysight Technologies introduced a BGA (ball grid array) interposer solution for testing DDR4 x16 DRAM (dynamic random access memory) designs with a logic analyzer. Using the Keysight W4636A DDR4 x16 BGA interposer solution, engineers can quickly and accurately capture address and command signals, and a subset of data signals, for debugging designs and performing functional validation measurements for data rates up to 2,400 Mb/s.
Lowering Cost of Test by Reuse of Test Interfaces
09 July 2015 - Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboards from other handling equipment for applications on the MT9510.
Anritsu and Bluetest continue OTA Collaboration
08 July 2015 – Following the successful launch of world’s first LTE 3CC Carrier Aggregation OTA measurement solution in December last year, Bluetest and Anritsu now take the next step together with the integration of the brand new Anritsu Radio Communication Analyzer MT8821C and Bluetest’s recently released 5th generation OTA Reverberation Test System RTS65.
Double-sided THT AOI Inspection
08 July 2015 - GOEPEL electronics expanded the configuration options for the AOI system THT-Line for double-sided inspection of THT assemblies. Besides the accumulating roller conveyor for work piece carriers now also tape transport is available, due to constantly increasing demand. That allows, for instance, inspection of selective solder joints on assemblies which are transported without work piece carrier in the manufacturing process.
IMD Measurements on Amplifier Designs
07 July 2015 – Anritsu introduces Intermodulation Distortion (IMD) options for its VectorStar platform that expand the measurement capability of the VNA family to meet the needs of design and production engineers who must conduct highly accurate and efficient IMD measurements on their amplifier designs. Included in the enhancements is the new IMDView software that creates an advanced, easy to use graphical user interface (GUI) that simplifies complex IMD measurements and allows for more thorough IMD evaluation.
Signal Generator with DAB/DMB Support
06 July 2015 – IZT expands its comprehensive support for Digital Audio Broadcast (DAB) applications adding new features to its high performance S1000 signal generator family. IZT introduced the DAB ContentServer Embedded Edition for the S1000. The new option integrates DAB, DAB+ and DMB multiplexing and makes the functionality of the DAB ContentServer directly available on the S1000 signal generator.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight Aeroflex EMC Inspection spectrum analyzer Keithley signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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