|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Compact Digital Storage Oscilloscopes
21 August 2014 - GW Instek introduced a new-generation of digital oscilloscopes. The GDS-200/300 series oscilloscopes are equipped with USB storage function and can be positioned in portrait and landscape display. The recharging-battery design makes the series easy to operate for field operations. The GDS-200/300 series are applicable in laboratories, R&D, large electric system tests, power product tests, motor tests, solar power battery inspection and repair, and maintenance personnel who are always on field assignments.
DC Power Supplies for High Voltage and Solar Array Applications
20 August 2014 - B&K Precision introduced three new models of high power programmable DC power supplies, models PVS10005, PVS60085, and PVS60085MR. The new PVS Series delivers output power up to 5.1 kW with excellent regulation, low noise, and fast transient response times. All models provide a unique built-in solar array simulator (SAS) function to generate photovoltaic I-V curves.
HiL Simulation Platform for multi-processor Systems
20 August 2014 - SCALEXIO, dSPACE’s latest hardware-in-the-loop (HIL) technology, is now even more powerful with its new extension for a multi-processor (MP) simulation platform. With the MP extension, users can connect several SCALEXIO multi-core processing units to create powerful simulation platforms for real-time computation. This makes it possible to develop embedded systems that require computationally intensive, high-fidelity simulation models to handle validation and verification tasks for the ever-growing complexity in vehicle systems.
AC Power Sources with 500 to 4000 VA Output
19 August 2014 – Keysight Technologies (Agilent Technologies) introduced a family of basic AC power sources that deliver stable, reliable power for testing electronic devices during design and manufacturing. The new Keysight AC6800 Series includes four models from 500 to 4000 VA output power, all with the quality and capability required for basic testing.
Tool Qualification Packages for various Architectures and Cross Compilers
18 August 2014 – PLS Programmierbare Logik & Systeme and Razorcat present a whole range of optimized Tool Qualification Packages (TQPs) for the TESSY test platform for various architectures and cross compilers. These TQPs will in future allow embedded system developers even easier and more reliable automated testing of application software written in the programming language C.
Engineering Test Station for Solid-State Drives (SSDs)
18 August 2014 – Advantest introduced the next product in its MPT3000 family for testing advanced solid-state drives (SSDs) by launching the flexible MPT3000ES engineering station. While using the same high-performance electronics and powerful software as the original MPT3000 unit, the new station features a small footprint configured to test up to eight SSDs in parallel. The system’s small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
Device Capacitance Analyzer for Power Circuit Design
15 August 2014 – Agilent Technologies / Keysight Technologies introduced the industry’s first power device capacitance analyzer that automatically characterizes power device junction capacitances using real operating voltages. With the increasing use of power devices fabricated from emerging materials like SiC and GaN, switching power supplies are now operating at increasingly higher frequencies. As a result, accurate device capacitance characterization is more important than ever.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI LTE PXI Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator LeCroy Power supply signal analyzer AXI Yokogawa Multitest Handheld TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
© All about Test 2014