|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
OTA Power Measurement for 5G and Wireless Gigabit
14 December 2016 - The R&S NRPM OTA power measurement solution of Rohde & Schwarz is the first solution for measuring transmit power over the air interface for 5G and wireless gigabit components. It enables users working in development and production to calibrate the output power of the antenna on a DUT and to test the DUT's beamforming function.
High Dynamic Spectrum Measurements for Microwave and Millimeter-Wave Bands
13 December 2016 – Anritsu Corporation introduced the MS2840A-051 Noise Floor Reduction and MS2840A-019 2dB Step Attenuator for Millimeter-wave options for the Signal Analyzer MS2840A series. These latest releases are ideal for accurate measurements aimed at improving the performance of wireless equipment and signal sources, as well as for improving phase noise, which is the key to upgrading the measurement resolution of microwave and mm-Wave radar and sensors.
High Multi-Site Test of Pressure Sensors
12 December 2016 - Xcerra recently shipped a complete test cell for pressure test, which combines the new InPressure HD module for high pin count pressure test up to 16 bar with an LTX-Credence Diamondx tester, a Multitest InStrip test handler, Xcerra test interfaces and a third party pressure supply unit. In addition to the hardware, Xcerra developed the test program and provided full integration and validation services.
100 MHz DSO with 7" Widescreen Display and Standard LAN
09 December 2016 - B&K Precision replaced their former 2190D bench digital storage oscilloscope (DSO) with the model 2190E. Offering the same measurement capabilities of the previous 2190D, the 2190E continues to add more features to the entry-level 100 MHz DSO. New upgrades include a higher resolution display and standard LAN interface at no additional cost.
Pick-and-Place IC Handler for High-Volume Production and Device Characterization
08 December 2016 – Advantest Corporation introduced its M4872 pick-and-place handler to improve productivity in testing system-on-chip (SoC) devices in high-volume manufacturing (HVM) and device characterization pre-production environments. This helps users to keep pace with the rapidly changing SoC market and quickly adapt to changes in device technology.
Battery-Drain Analysis Solution
07 December 2016 – Keysight Technologies launched a battery-drain analysis solution that delivers insight into critical applications for the energy, automotive and medical device industries. Keysight is the only company that offers this integrated solution for accurate battery-drain analysis and provides the needed testing information required to manage the wide dynamic-current-range utilized by these devices.
Testing the transmission Quality of high-speed Link Cables
06 December 2016 - The GCAT Gigabit Cable Tester from GOEPEL electronic is a new tool for evaluation of the transmission quality of serial high-speed cables. Thereby production losses can be reduced. Previously available cable testers often only execute a simple connection test (Go / NoGo Test). Thanks to the modular adapter principle, any cable type can be tested. The integrated FPGA (Field Programmable Gate Array) and its test mechanisms are specifically designed for a BERT (Bit Error Rate Test).
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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