|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Battery Analyzers simplify the testing Battery Backup Systems
08 September 2014 - The new Fluke 500 Series Battery Analyzers simplify the workflow of testing stationary batteries and battery banks through an intuitive user interface that provides quick, guided test setups ensuring technicians are capturing the correct data while visual and audio feedback cues reduce the risk of errors.
Everett Charles Technologies releases new Material for ZIP Probes
08 September 2014 - Everett Charles Technologies (ECT) releases the HyperCore material to the full ZIP product line. ZIP is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.
Impedance Analyzer with 1MHz to 300MHz Operating Frequency
05 September 2014 - Hioki launched the Impedance Analyzer IM7580, which can perform measurement at high frequencies of up to 300 MHz for measuring high-frequency electronic components. The instrument can significantly boost productivity for electronic component manufacturers thanks to its ability to test large volumes of components at measurement speeds as fast as 0.5 ms.
MEMS Testing and Metrology Workshop at SEMICON Europa 2014
05 September 2014 - In cooperation with SEMI, MEMUNITY organizes the 2014 MEMS Testing and Metrology Workshop at SEMICON Europa in Grenoble. Attendees can discuss needs, challenges, and trends in MEMS development, testing, and metrology at a high level expert event.
User-Extensible Frequency Domain Analysis for Real-Time Oscilloscopes
04 September 2014 – Keysight Technologies announced the availability of a frequency domain analysis (FDA) option, the industry’s first user-extensible spectrum frequency domain analysis application solution for real-time oscilloscopes. The FDA option extends the capabilities of Keysight Infiniium and InfiniiVision Series oscilloscopes by enabling engineers to acquire live signals from the oscilloscope and visualize them in the frequency domain as well as make key frequency domain measurements.
Mobile Measurement Data Display on Android Devices
03 September 2014 – IPETRONIK presents version 2.0 of its IPEmotion App with completely redesigned graphical interface. The app supports encrypted WiFi data transfer from IPETRONIK modules IPEhub2 and COMgate to any mobile Android device. IPETRONIK logger system users thus can monitor data acquisition online using a tablet or they can use the tablet as custom-configurable logger data display.
Patterning Control Solution for Sub-20nm Design Nodes
02 September 2014 - KLA-Tencor Corporation introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system and the K-T Analyzer 9.0 advanced data analysis system. These three new products support KLA-Tencor's unique 5D patterning control solution, which addresses five elements of patterning process control—the three geometrical dimensions of device structures, time-to-results and overall equipment efficiency.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator LeCroy Power supply signal analyzer AXI Yokogawa Multitest Handheld TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
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