|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Combination of 3D and 2D Inspection
16 November 2016 - Mek (Marantz Electronics) launched GTAz, its newest and most advanced optical head available on the company’s PowerSpector and SpectorBOX range of AOI machines. The GTAz delivers true Stereoscopic imaging using its 9 high speed (90 Fps) cameras operating in full 24 bit color. This new generation optical head removes the need for expensive capture cards utilising Thunderbolt2 20GBs transfer speeds and full frame transfer.
IPTE introduced Shuttle Test Handler
15 November 2016 - IPTE completed its test handler product portfolio with a manual Shuttle Test Handler (STH). The shuttle allows the operator to remove/insert PCBs while another one is being tested. A set of carriers is used to hold the PCB in position. This enables odd-form PCBs to be tested. The STH is equipped with a pneumatic press-unit of 1.500 N with a moving lower fixture. This results in no moving wires for top side contacting. Transfer blocks can be used to transfer measurement signals from top to bottom.
JTAG/Boundary Scan available for Flying Prober Testers from TAKAYA
14 November 2016 - GÖPEL electronic and SYSTECH Europe have developed a JTAG/Boundary Scan integration for the APT-1400F TAKAYA Flying Probe Testers (FPT). The solution is based on complete integration of the Boundary Scan hardware SCANFLEX and the software SYSTEM CASCON. A cost-effective and time-efficient platform for testing electrical assemblies during production is therefore offered in combination with the Flying Probe Tester from TAKAYA.
Debugging of complex 100G Datacenter Interconnects
11 November 2016 – Tektronix released a new 100G link training tool for use with its DPO70000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing datacenter market. The expanded analysis software for DPO70000SX series oscilloscopes helps engineers to debug complex high-speed Ethernet communications links.
Pick and Place Handler for small Packages below 3 x 3 mm
10 November 2016 - Multitest expanded the package range for both pick and place handler platforms - the MT9510 and MT2168 - to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT2168 exceed the typical ranges of competitive pick and place systems.
Oscilloscope Probe for Millivolt Signals
09 November 2016 - The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes' frontend are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1 mV/div, e.g. for power integrity measurements on integrated circuits and components.
PXI Oscilloscope featuring 14 Bits Resolution and 1 GS/s Sample Rate
08 November 2016 – National Instruments (NI) announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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