|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Modular Top Down AOI
06 November 2015 - Mek (Marantz Business Electronics), has recently launched new additions to its SpectorBOX AOI systems. These include a massive 5 inch camera clearance that enables complete single pass inspection of virtually any assembly. The Mek SpectorBOX modular AOI systems have long been optimized for the inspection of THT components to identify defects such as presence/absence, wrong polarity, color, type, and bent pins. And now, the unique top clearance of 130mm (5.12”) allows the Top-Down SpectorBOX to inspect virtually any completed electronic and electro-mechanical assembly - even when the tallest of components are present.
Ultra-Wide Bandwidth 5G Backhaul Signal Analysis
05 November 2015 – Tektronix announced the implementation of SignalVu software on its family of DPO70000SX ATI Performance Oscilloscopes. This will allow researchers and others engaged in developing next generation wide- and ultra-wide bandwidth technologies such as 5G, cellular backhaul and radar to perform RF modulation measurements with unprecedented margins of error.
Full-surface 3D X-ray Inspection
05 November 2015 – Viscom presents on produtronica in Munich/Germany the new 3D AXI system X7058 which was specially developed for an ultra-fast, in-line 3D X-ray inspection of electronic assemblies. With this system, the entire electronic assembly is 100 percent 3D-inspected. The new system is of particular interest for EMS companies which need to produce and inspect complex, high-value electronic assemblies at the highest quality efficiently and at low cost.
Three new Modules for Yokogawa ScopeCorder
04 November 2015 - Yokogawa added three new products to the range of plug-in measurement modules for its DL850E/DL850EV ScopeCorder family of portable multi-channel data-acquisition recorders. The total number of modules available is now 19. The new units are the 720211 high-speed (100 MS/s) 12-bit isolation module, the 720243 SENT monitor module (available only for the DL850EV Vehicle Edition ScopeCorder) and the 720254 4-channel 1 MS/s 16-bit isolation module.
Screw-in Test Probe for Cable Harness Testing
03 November 2015 - The new P53/G from Peak Test Services is a series of screw-in threaded test probes designed for use in test modules for cable harness testing. The new compact probe has a total length of only 25.2 mm inclusive of receptacle. It is designed for use at 2.54 mm centres, has a continuity resistance of 20 milliohms, and operates at currents up to 5 A. Full travel distance is 4.5 mm, working travel distance is 3.5 mm, and working travel spring force is 1.5 N.
Design, Verification and Debugging of MIPI D-PHY based Interfaces
02 November 2015 - A new option from Rohde & Schwarz permits R&S RTO oscilloscopes to trigger on DSI- and CSI-2 specific protocol data (display and camera) and to decode the acquired waveforms into readable protocol content. The R&S RTO-K42 software option supports developers during the design, verification and debugging of modules with MIPI D-PHY based interfaces. These interfaces are mainly used in cameras and displays in smartphones and tablets as well as in other electronic devices.
Tunable Laser Sources for Testing of Optical Components
30 October 2015 - Keysight Technologies introduced the 81607A, 81608A and 81609A tunable laser sources, a range of modules for the Keysight 8164B lightwave measurement system. The new modules extend the product family that debuted in March 2015 with the Keysight 81606A tunable laser source, an instrument with unmatched sub-picometer tuning repeatability and best-in-class wavelength accuracy that is maintained even in full-speed, two-way sweeps.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI Anritsu AOI National Instruments Keysight Automotive Advantest EMC Aeroflex Keithley spectrum analyzer Inspection signal Generator Power supply signal analyzer Yokogawa AXI Multitest Teledyne LeCroy LeCroy Handheld calibration network analyzer Switching USB TESEQ wireless characterization Semiconductor Test Semiconductor probe
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