|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Pick and Place Handler for small Packages below 3 x 3 mm
10 November 2016 - Multitest expanded the package range for both pick and place handler platforms - the MT9510 and MT2168 - to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT2168 exceed the typical ranges of competitive pick and place systems.
Oscilloscope Probe for Millivolt Signals
09 November 2016 - The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes' frontend are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1 mV/div, e.g. for power integrity measurements on integrated circuits and components.
PXI Oscilloscope featuring 14 Bits Resolution and 1 GS/s Sample Rate
08 November 2016 – National Instruments (NI) announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.
Continuous-Sweep Signal Analysis of Frequencies up to 110 GHz
07 November 2016 – Keysight Technologies announced an industry-leading breakthrough in spectrum and signal analysis at millimeter-wave frequencies. The Keysight N9041B UXA X-Series signal analyzer is the first to provide frequency coverage to 110 GHz with a maximum analysis bandwidth of up to 5 GHz. The N9041B UXA features an advanced front-end circuitry that achieves low loss and efficient mixing, providing a displayed average noise level (DANL) as low as –150 dBm/Hz when characterizing wideband modulated signals in the millimeter-wave band.
Test Probes for Signals up to 18 Gb/s
04 November 2016 - Pico Technology launched a new family of high-performance microwave and gigabit test probes. The PicoConnect passive probes allow cost-effective fingertip browsing of broadband signals or data streams out to 9 GHz or 18 Gb/s. These include the now ubiquitous USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards.
Wafer-Level Parametric Test Solution for Power Semiconductors
04 November 2016 -- Tektronix introduced the Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down.
SAS 4.0 Protocol Analyzer Platform
03 November 2016 – Teledyne LeCroy announced the world’s first Serial Attached SCSI 4.0 (SAS) Protocol Analyzer platform supporting protocol testing and debugging of the emerging 24Gb/s SAS standard. The Sierra T244 analyzer platform leverages Teledyne LeCroy's cutting-edge TAP4 probe technology to provide early-adopters with visibility into the next-generation SAS 4.0 protocol.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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