|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
USB Oscilloscope Software with enhanced serial Bus Decoding and Analysis
03 July 2015 - The latest version of PicoScope software from Pico Technology now has decoding and analysis of sixteen protocols included as standard. When used with the deep memory included in most PicoScope oscilloscopes, this new software release creates an extremely powerful debugging and troubleshooting tool at no extra cost to PicoScope owners.
Validation of 600 Mbps LTE-A using 256 QAM with Carrier Aggregation
02 July 2015 – Cobham Wireless has announced that the TM500 network test system now includes support for 256 QAM modulation – one of the key features of LTE-Advanced (LTE-A, also known as 4G) which is being introduced in 3GPP Release 12. The use of this modulation scheme in combination with carrier aggregation (CA) in the downlink, boosts data rates up to 600 Mbps and allows network operators to improve spectrum efficiency for mobile terminal devices under favourable operating conditions.
PCI Express Protocol Exerciser for L1 Substate Validation
01 July 2015 – Keysight Technologies introduced the U4305B PCI Express protocol exerciser for engineers developing PCIe Gen3 systems. The U4305B exerciser offers a broad range of PCIe test tools for validating Gen1, Gen2 and Gen3 operation for all lane widths up to x16. The tools address PCIe developers’ needs, including providing ways to test new technologies like NVMe (Non-Volatile Memory Express) and L1 substate operation.
Test and Debug Environment for Infineon’s XMC4700/XMC4800 SoCs
01 July 2015 – PLS Programmierbare Logik & Systeme presents Version 4.4.5 of its Universal Debug Engine (UDE). The UDE 4.4.5 provides developers with an optimized testing and debugging environment for Infineon’s new XMC4700/XMC4800 microcontrollers. The 32-bit SoCs, which are based on an ARM Cortex-M4 processor with Floating Point Unit (FPU), were specifically developed for use in industrial applications.
Compact Boundary Scan Production Tester
30 June 2015 - GOEPEL electronics presenteds the JULIET Series2, the latest generation Boundary Scan production test platform. The compact desktop system includes fully integrated Boundary Scan test hardware, power supply and an interchangeable adapter system for flexible UUT (Unit Under Test) contact. The new JULIET (JTAG UnLimIted Tester) is particularly suitable for production testing in the low and mid volume range as well as for repair.
Ultra fast Flying Probe Tester for big PCBs with 16 Test Heads
29 June 2015 - atg Luther & Maelzer releaseds the flying probe tester A8-16a, which combines the speed of the 16 probe system A8-16 with the automation of the A7a. The A8-16a addresses the test and productivity requirements of big or complex server boards or production panels up to 24.4” x 24.0” with huge test point numbers.
Decode and analyze TCG Security and PTM Messaging
26 June 2015 – Teledyne LeCroy has extended the decoding and analysis capabilities on their PCI Express Summit protocol analyzer product family to support the new Trusted Computing Group (TCG) security and Precision Time Measurement (PTM) messaging features, utilized in Internet of Things (IoT) and PCIe SSD storage technologies.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight Aeroflex EMC Inspection spectrum analyzer Keithley signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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