|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
NVMe Analysis Features for Storage Development and Test
04 June 2015 – Teledyne LeCroy released its new PCIe Protocol Suite 7.34 which adds extensive enhancements for PCIe-based storage analysis on the Summit PCI Express Protocol Analyzer product line. Protocol analyzers and exercisers are used by developers and validation engineers to directly record and examine data traffic on serial data communication links between devices and systems. This equipment enables SSD developers to reduce debug and test schedules, lower engineering development costs on new products and meet aggressive time-to-market requirements.
Optical Test System with Attenuation and Switch Modules
03 June 2015 - Yokogawa has expanded its AQ2200 Series Multi-Application Test System (MATS) with a range of optical attenuation and switch modules for applications involving GI50 multimode optical fibre. The modular AQ2200 Series is available with two different frame controller platforms with three or nine slots for connecting modules.
New Test Strategy for IoT Devices
02 June 2015 - Under the name JEDOS (JTAG Embedded Diagnostics Operating System), GOEPEL electronics introduces a new technology for embedded test of complex electronic designs. The new test strategy has been developed in particular for diagnostic testing of devices for the Internet of Things (IoT).
Remote Tools for Handheld Spectrum Analyzer
01 June 2015 – Anritsu introduces Web Remote Tools for its Spectrum Master MS2720T handheld spectrum analyzer that allows the instruments to be controlled from any web-enabled device, including laptops, tablets, and smart phones, over an Ethernet link. Web Remote Tools gives field technicians greater flexibility when conducting measurements and makes it more time- and cost-efficient to conduct RF spectrum monitoring, as well as test Remote Radio Heads (RRUs) and other inaccessible radio units at 3G and 4G base stations.
Platform for Wafer-Level Device Characterization
29 May 2015 – Keysight Technologies unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components. By efficiently controlling all components in a wafer-level measurement system (instruments and wafer probers alike), WaferPro Express reduces measurement setup complexity and provides a unified platform for efficient automated measurement and data management.
AC Power Source with 1/3 Phase or DC Output
28 May 2015 – Associated Power Technologies (APT) is adding smartCONFIG as a standard feature of their 400XAC Series of three phase AC power sources. This exclusive feature allows the 400XAC series to switch from 1 phase to 3 phase with the push of a button. The 400XAC series is ideal for both production and laboratory use because it provides a unique feature set at a competitive price point. One benefit of the 400XAC product family is that switching between output modes is made simple.
Semiconductor Circuit Analysis using Terahertz Technology
27 May 2015 – Advantest developed a technology utilizing short-pulse terahertz waves for analysis of electrical circuits. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz to 1THz), and characterization and location of failures in chip circuits (TDT/TDR). The new technology overcomes the technical obstacles and prohibitive cost of existing technologies, and will contribute significantly to the development and wider adoption of these leading-edge devices.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex EMC Keysight Inspection Keithley spectrum analyzer signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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