|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Fiber-Optically Isolated High Voltage Probe
25 January 2017 - Teledyne LeCroy announced the new HVFO high voltage fiber-optically isolated oscilloscope probe. The HVFO probe is optimized for measurement of small signals floating on a HV bus in power electronics designs. Optical isolation between the probe tip and the oscilloscope input reduces adverse loading of the device under test (DUT); and also reduces noise, distortion, ringing, overshoots, and transients on the measured signal.
Lock-in Amplifier with optional Quad-PID Feedback Loop
24 January 2017 - Zurich Instruments added the MF-PID option with 4 independent PID (proportional - integral - derivative) controllers to their MFLI, a 500 kHz / 5 MHz lock-in amplifier. The MF-PID option builds on class-leading specifications of the MFLI such as low input noise of 2.5nV/√Hz and a high dynamic reserve of 120 dB. Each controller is seamlessly integrated with the lock-in amplifier, using inputs from a multitude of internal measurement data and analog input signals. The maximum control loop bandwidth is 50 kHz.
High Resolution LXI Digitizers with up to 24 Channels
23 January 2017 - Spectrum GmbH released a range of high-speed 14- and 16-bit LXI-based digitizer products for applications where multiple electronic signals need to be acquired and analyzed. Twelve new instruments with up to 24, fully synchronized channels extend Spectrum's digitizerNETBOX family. The 16-bit ADC models offer sampling rates of either 130 MS/s or 250 MS/s, while the 14-bit units feature sampling rates of 500 MS/s.
Bluetooth 5 Test Solution
20 January 2017 - To coincide with Bluetooth Release 5, Rohde & Schwarz has expanded the functional range of its line of R&S CMW wideband radio communication testers to cover the new specification. The R&S CMW software encompasses all RF tests needed for development and production, including the new test cases for Bluetooth SIG precertification.
Bit Error Rate Test Solution for 100G-Ethernet Passive Optical Networks
19 January 2017 – Anritsu Corporation launched the Signal Quality Analyzer MP1800A Series 100G-EPON Test Solution. The newly developed 100G-EPON Application Software MX180014A and Signal Quality Analyzer MP1800A support BER measurements of OLT (Optical Line Terminal) and ONU (Optical Network Unit) for the latest 100G-EPON standard.
NI Automated Test Outlook Reviews Test Approaches Needed in Era of Smart Devices
18 January 2017 – National Instruments (NI) released its Automated Test Outlook 2017. The annual test and measurement report reviews the key technologies impacting automated test environments from reconfigurable test instrumentation to software-centric test platforms and ecosystems for next-generation device test.
EMI Receiver with a DANL of -171dBm/Hz at 1GHz
17 January 2017 - The very fast TDEMI eXtreme (TDEMI X) EMI receivers of GAUSS INSTRUMENTS feature a frequency range from DC to 40 GHz and a 645 MHz CISPR compliant real-time bandwidth, Multi-GHz Real-time Scanning and the lowest displayed average noise level at 40 GHz can now be equipped with an additional ultra-low noise pre-amplifier for the frequency range 30 MHz – 1 GHz. This novel pre-amp provides lowest noise figure and highest dynamic range - both at the same time.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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