|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
High-Voltage Insulation Testing and Analysis
09 September 2014 - The new TANDO 700 of OMICRON is a precise measuring and analysis system for dissipation/power factor (Tan Delta) and capacitance of insulation in high-voltage (HV) equipment. Due to its compact and lightweight design, TANDO 700 can be easily transported for use in many different test areas. The system provides reliable measurement accuracy even in heavy interference environments, including power plants, substations and unscreened test labs.
Anritsu received Global Field RF Testing Leadership Award from Frost & Sullivan
09 September 2014 – Anritsu has received the 2014 Frost & Sullivan Customer Value Leadership Award in the Global Field RF Testing market, recognizing Anritsu’s position as a preeminent supplier of test solutions used in the deployment, installation, and maintenance of wireless networks. Frost & Sullivan, a leading global research organization, cited Anritsu’s focus on innovation and customer centricity, as well its industry-leading portfolio of handheld field solutions in presenting Anritsu with the award.
Battery Analyzers simplify the testing Battery Backup Systems
08 September 2014 - The new Fluke 500 Series Battery Analyzers simplify the workflow of testing stationary batteries and battery banks through an intuitive user interface that provides quick, guided test setups ensuring technicians are capturing the correct data while visual and audio feedback cues reduce the risk of errors.
Everett Charles Technologies releases new Material for ZIP Probes
08 September 2014 - Everett Charles Technologies (ECT) releases the HyperCore material to the full ZIP product line. ZIP is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.
Impedance Analyzer with 1MHz to 300MHz Operating Frequency
05 September 2014 - Hioki launched the Impedance Analyzer IM7580, which can perform measurement at high frequencies of up to 300 MHz for measuring high-frequency electronic components. The instrument can significantly boost productivity for electronic component manufacturers thanks to its ability to test large volumes of components at measurement speeds as fast as 0.5 ms.
MEMS Testing and Metrology Workshop at SEMICON Europa 2014
05 September 2014 - In cooperation with SEMI, MEMUNITY organizes the 2014 MEMS Testing and Metrology Workshop at SEMICON Europa in Grenoble. Attendees can discuss needs, challenges, and trends in MEMS development, testing, and metrology at a high level expert event.
User-Extensible Frequency Domain Analysis for Real-Time Oscilloscopes
04 September 2014 – Keysight Technologies announced the availability of a frequency domain analysis (FDA) option, the industry’s first user-extensible spectrum frequency domain analysis application solution for real-time oscilloscopes. The FDA option extends the capabilities of Keysight Infiniium and InfiniiVision Series oscilloscopes by enabling engineers to acquire live signals from the oscilloscope and visualize them in the frequency domain as well as make key frequency domain measurements.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer LeCroy Power supply AXI Yokogawa Multitest Handheld TESEQ calibration Switching Semiconductor Test SPI wireless USB Viscom ASSET InterTech characterization probe Pico Technology
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