|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Five essential Instruments in a single Device
15 July 2014 – National Instruments (NI) announced VirtualBench, an all-in-one instrument that integrates a mixed-signal oscilloscope, function generator, digital multimeter, programmable DC power supply and digital I/O. Users interact with VirtualBench through software applications that run on PCs or iPads. The device provides the most common functionality affordably and opens up new possibilities for how engineers can use benchtop instruments.
Transfer Measurement Data from Test Tools to Smart Phones and the Cloud
15 July 2014 - Maintenance technicians make better, faster decisions when they have field access to maintenance records and when they can review measurements in real time with team members and supervisors. Yet records are usually kept back in the office and team members are rarely in the same place at the same time. The Fluke Connect system solves these problems while increasing the safety of technicians working with energized equipment.
CAN Flexible Data (FD) Rate Serial Trigger and Decode Solution
14 July 2014 - Teledyne LeCroy introduced the industry's first CAN Flexible Data (FD) Rate trigger and decode solution, adding to their existing suite of automotive test tools for CAN, LIN, FlexRay, SENT, MOST and BroadR Reach. The CAN FD trigger and decode solution enables designers using this new standard to gain unprecedented insight in to their systems, correlating physical layer signals and protocol layer data on a single display. The CAN FD trigger can isolate Frame IDs, specific data packets, remote frames and error frames.
Automatic Fixture Removal Option for Network Analyzer
14 July 2014 – Agilent announced a powerful new automatic fixture removal (AFR) option for its PNA Series network analyzers. Previously available only in Agilent’s Physical Layer Test System (PLTS) software, the error-correction technique offers a fast and easy way to accurately measure non-coaxial devices, saving engineers time and money.
In-line AOI System with 1 Top-Down and 4 Side Angle Cameras
11 July 2014 - Nordson YESTECH introduced the FX-940 AOI In-line PCB inspection system. The new FX-940 offers the latest multi-dimensional technology for the inspection of solder defects, lead defects / lifted leads, component presence and position, correct part / polarity, through-hole parts, and co-planarity of chips, BGAs and other height sensitive devices.
Modular DLS Test Platform for Field Technicians
11 July 2014 - JDSU expands its portfolio with the OneExpert DSL modular field test platform. With its powerful user-friendly capabilities, OneExpert DSL enables technicians of any skill level to install and maintain broadband networks and to locate copper faults so they can find and fix problems the first time out. OneExpert DSL is an intuitive, cloud-enhanced integrated tool for outside plant and in-home networks that provides detailed analysis for both physical- and application-layer-related problems.
Teradyne and Test Insight partner to Shorten IC Design Cycle Times
10 July 2014 - Teradyne and Test Insight released new pattern conversion solutions for UltraFLEX digital instruments to reduce design to test cycle times and expedite Silicon debug and characterization. The new solutions include the ability to compile hundreds of patterns in parallel using Linux-based Load Share Facilities (LSF) as well as the ability to produce binary IG-XL pattern files directly from electronic design automation (EDA) output formats.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator LeCroy signal analyzer Power supply AXI Yokogawa Handheld Multitest TESEQ Switching calibration SPI Semiconductor Test wireless Viscom USB characterization Pico Technology Corelis ASSET InterTech
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