|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
PXI Embedded Controller and high Bandwidth Chassis
11 March 2015 - National Instruments (NI) announced the NI PXIe-8880 controller, which is based on the Intel Xeon processor, and the NI PXIe-1085 chassis, which is the industry’s first chassis that uses PCI Express Gen 3 technology. The combination of the eight-core, server-class Intel Xeon processor E5-2618L v3 and full system bandwidth of 24 GB/s delivers breakthrough performance for computationally intensive and highly parallel applications such as wireless test, semiconductor test and 5G prototyping.
Automated Software Test for single and multi-core embedded Systems
10 March 2015 - iSYSTEM AG released a new version of iSYSTEM test API and test case editor testIDEA. In 2009, more determined than a simple functional testing tool for software developers, testIDEA today is a comprehensive and flexible tool for the software test of single and multi-core embedded systems.
RF Signal Generator Series for Frequencies up to 6.0 GHz
10 March 2015 – Tektronix introduced the TSG4100A series of signal generators. The TSG4100A series includes three models with carrier frequencies from DC to 2.0 GHz, 4.0 GHz and 6.0 GHz respectively. The instruments provide spur-free outputs with low phase noise (–113 dBc/Hz at 1 GHz), outstanding amplitude accuracy (<+/- 0.4 dB at 1 GHz, 0dBm CW signal from +16dBm to -100 dBm level range) and excellent frequency resolution (1 μHz at any frequency).
Compliance Testing of Dolby’s MS11 Multistream Decoder
09 March 2015 - Audio Precision announced the availability of their test package enabling Dolby MS11 compliance testing via APx Series audio analyzers. The Dolby MS11 Multistream Decoder provides TV, set-top box, and IC manufacturers with a single-package solution for decoding all premium broadcast audio formats.
Simultaneous Time Domain and Spectrum Analysis up to 1 GHz
06 March 2015 - Rohde & Schwarz added the R&S RTM-K18 spectrum analysis and spectrogram option to its R&S RTM oscilloscope family, making the R&S RTM the only oscilloscope in its class that can analyze the time domain while simultaneously analyzing the spectrum, logic and serial protocol. Interactions such as those that occur in electronic devices with RF components are quickly analyzed in a single measurement.
Automated System Test of Android Devices
05 March 2015 - JOT Automation, a supplier of test and production solutions, and Profilence, the novel test software provider, introduce an automated test solution for operators enabling a full system test coverage of all types of Android devices. JOT G3 with Profilence Tau speeds up the time-to-market and cuts total costs by testing the entire device in a reliable and repeatable environment.
Flying Probe Tester for large Format, high Layer-Count Backplanes
04 March 2015 - atg Luther & Maelzer, a company of Xcerra Corporation, announces the release and the first installations of the new A7-20 flying probe test system. Specifically designed for the demands of large format, high layer count backplanes, the A7-20 combines the flexibility typical for flying probe testers with accuracy and speed. The A7-20 significantly reduces test time and test cost.
Agilent Oscilloscope JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Keysight Power supply LeCroy AXI Yokogawa Multitest Handheld calibration Switching Semiconductor Test TESEQ USB Teledyne LeCroy characterization network analyzer wireless Viscom Pico Technology
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