|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Pick-and-Place IC Handler for High-Volume Production and Device Characterization
08 December 2016 – Advantest Corporation introduced its M4872 pick-and-place handler to improve productivity in testing system-on-chip (SoC) devices in high-volume manufacturing (HVM) and device characterization pre-production environments. This helps users to keep pace with the rapidly changing SoC market and quickly adapt to changes in device technology.
Battery-Drain Analysis Solution
07 December 2016 – Keysight Technologies launched a battery-drain analysis solution that delivers insight into critical applications for the energy, automotive and medical device industries. Keysight is the only company that offers this integrated solution for accurate battery-drain analysis and provides the needed testing information required to manage the wide dynamic-current-range utilized by these devices.
Testing the transmission Quality of high-speed Link Cables
06 December 2016 - The GCAT Gigabit Cable Tester from GOEPEL electronic is a new tool for evaluation of the transmission quality of serial high-speed cables. Thereby production losses can be reduced. Previously available cable testers often only execute a simple connection test (Go / NoGo Test). Thanks to the modular adapter principle, any cable type can be tested. The integrated FPGA (Field Programmable Gate Array) and its test mechanisms are specifically designed for a BERT (Bit Error Rate Test).
Volume and Surface Resistivity Measurements
05 December 2016 – Tektronix unveiled a complete solution for performing high resistivity measurements in compliance with accepted industry standards including ASTM D257 and IEC 60093. Designed for use with the Keithley Model 6517B Electrometer and Model 8009 Resistivity Chamber, the new Model KICKSTARTFL-HRMA application automates volume and surface resistivity measurements for more accurate and repeatable results without the need for custom programming.
New 5, 10 and 18 Slot PXIe Chassis
02 December 2016 – Keysight Technologies announced three new PXIe chassis with different sizes and performance characteristics. The new chassis include 1) Keysight’s industry-leading 10-slot Gen 3 chassis, designed for high-performance, benchtop and R&D applications; 2) Keysight’s cost-effective 5-slot Gen 1 chassis; and 3) Keysight’s redesigned 18-slot Gen 2 chassis, with improved power supply and new features which improve system integration.
OTDR Module for Remote Fibre Test Systems
01 December 2016 - The new AQ7277B from Yokogawa Europe is a high-performance optical time-domain reflectometer (OTDR) module for use with remote fibre-test systems (RFTS). An RFTS is a test system designed to improve the efficiency of operation and maintenance management of optical fibre lines installed at a fibre-optic cable termination station by constantly monitoring individual fibres in the cable using the OTDR technology for continuous measurements.
Test Solution for Remote Keyless Entry Systems
30 November 2016 - Rohde & Schwarz developed an universal solution for testing vehicle keys and the associated electronic control units with their various wireless technologies. Thanks to the modular and scalable approach, the versatile test system can be used to test at the printed board and device level in all product phases - from development to product qualification to mass production.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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