|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Rugged Compact Vision System for USB3 Vision Cameras
08 October 2014 – National Instruments announced a compact solution for high-speed vision applications. The NI CVS-1459RT is a small, rugged vision system with a quad-core Intel Atom processor and two dedicated USB 3.0 ports for USB3 Vision cameras. The NI CVS-1459RT is programmed with either LabVIEW system design software or Vision Builder for Automated Inspection (AI).
Dual Attenuator Module for optical Test System
07 October 2014 - Yokogawa Meters & Instruments Corporation announced the release of the AQ2200-342 Dual Attenuator module for the AQ2200 multi-application test system. The AQ2200-342 is ideal for the production line testing and inspection of optical transceivers, optical amplifiers, and transmission systems that are essential components of optical communications networks.
Entry-level Mixed Signal Oscilloscope with 1 GSa/s
07 October 2014 - Fanless operation, 1MPts of memory depth and a 1 GSa/s realtime sampling rate - these are the key features of the new R&S HMO1002 mixed signal oscilloscope from Rohde & Schwarz. With a vertical sensitivity of 1 mV/div and integrated 128 Kpoint FFT, the instrument offers features that are exceptional in the three-figure price segment.
Motor Drive Power Analyzer Software for Oscilloscopes
06 October 2014 - Teledyne LeCroy announces three-phase Motor Drive Power Analyzer software for its HDO8000 oscilloscopes. The HDO8000 mixed-signal oscilloscopes, with 8 input channels, 12-bit resolution, and up to 1 GHz bandwidth, are the perfect solution for motor drive embedded control and power section debug. With the addition of three-phase power analyzer capability and motor speed and torque integration, the complete drive system can be more quickly and easily validated and debugged, and extensive drive and motor power and efficiency measurements may be performed.
Boston Semi Equipment creates independent ATE Organization
06 October 2014 Boston Semi Equipment (BSE) has combined all of its automated test equipment (ATE) businesses under the Boston Semi Equipment brand name. Effective immediately, the Test Advantage Hardware and MVTS Technologies businesses will operate using the Boston Semi Equipment name. This follows the company's announcement in July that it was integrating all sales and service for ATE, Prober and Test Handler products into the Boston Semi Equipment field sales organization.
Full Two-Port 26.5 GHz Vector Network Analyzers fit in just one PXI Slot
03 October 2014 – Keysight Technologies announced a series of one-slot PXI vector network analyzers that cover 300 kHz up to 26.5 GHz. The new analyzers offer the best PXI VNA performance on key specifications such as speed, trace noise, stability and dynamic range. This enables the PXI VNAs to perform fast, accurate measurements and reduce the cost-of-test by enabling simultaneous characterization of many devices – two-port or multi-port – using a single PXI chassis.
Advantest launches System for Semiconductor Packaging Inspection
03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor packaging. The system is based on advances in Terahertz (THz) technology pioneered by Advantest. The TS9000 Mold Thickness Analysis (MTA) System is a new metrology tool that performs non-destructive analysis of the thickness of semiconductor packaging.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test Switching network analyzer SPI wireless USB characterization Viscom Pico Technology ASSET InterTech
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