|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
National Instruments' European Calibration Lab received 17025 Accreditation
05 November 2014 - National Instruments announced that the calibration laboratory located at the Hungary service center in Debrecen has recently received 17025 Accreditation by the American Association for Laboratory Accreditation (A2LA). This accreditation assures quality in the calibration processes and demonstrates proven adherence to global standards for our calibration and testing laboratories.
Oscilloscope Probes for High-Voltage Signal Measurements
05 November 2014 – Keysight Technologies introduced 200-, 300- and 500-MHz, high-voltage probing solutions with a wider input range, higher common-mode rejection ratio and optimized accessories. The probes are ideal for testing today’s switching power supplies or power devices and for measuring motor drives and vehicle buses.
XJTAG releases Boundary Scan for Teradyne TestStation
04 November 2014 – XJTAG announced the release of the XJLink2-CFM and XJLink2-CFMx. The new modules provide Teradyne users with integrated access to XJTAG’s powerful test and programming tools, operating under the control of the TestStation test program. With a JTAG solution installed internally to the TestStation In-Circuit Test System, the complexity and recurring cost impact of fixture-based test can be significantly reduced, while improving overall test coverage.
Current Transducers measure from 100 A up to 2000A DC, AC or pulsed
04 November 2014 - LEM announced the new range of LF xx10 transducers for non-intrusive and isolated nominal measurements of DC, AC and pulsed currents from 100 A to 2000 A with 4 new series: LF 210-S, LF 310-S, LF 510-S, LF 1010-S. A fifth, the LF 2010-S will be available in February 2015.
Fast Power Measurement Option for PXI RF Digitizer
03 November 2014 - Cobham Wireless, formerly Aeroflex wireless business unit, introduced a new measurement option that allows users to perform power measurements more quickly, directly reducing test times in power servo applications. Option 194 (Fast Power Measurement) on the PXI 3030 series RF digitizer results in a 57% reduction in servo loop time when applied to an LTE signal.
New Post Reflow AOI System from OMRON
03 November 2014 - OMRON launched with the VT-S730 a new Post Reflow AOI system and completes the existing "VT-S Series". In addition to the color highlight 3D solder shape reconstruction technology, this new machine is now equipped with a specific phase shift inspection technology that makes it a highly efficient inspection system.
Interference Hunting System makes locating Interferers easier
31 October 2014 - Anritsu introduces a revolutionary mobile interference hunting system that helps field engineers and technicians locate sources of interference more accurately, efficiently, and economically. Integrating an easy-to-use interface, fast setup times, and numerous features to effectively hunt a variety of signal types in multiple RF environments, the comprehensive solution provides wireless carriers, regulatory agencies, and broadcast and satellite operators with a tool that saves time and money.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI LTE AOI Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test Switching Viscom wireless characterization network analyzer SPI USB probe Pico Technology
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