|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Continuous Acquisition Stream Capability for PCIe Digitizers
28 April 2015 – Keysight Technologies introduced continuous simultaneous acquisition and readout (CSR) for its U5303A 12-bit PCIe digitizer. In addition, complete data recording software applications are available, such as digitizer streaming (application option CB0) and digital down-converter streaming (application option CB1).
Multipurpose Module for IC Failure Capture
28 April 2015 — Cascade Microtech introduced a new Multipurpose Electromigration (MPEM) module featuring an intuitive, full-featured test suite for predicting the lifetime and reliability of copper interconnects in modern integrated circuits. Cascade Microtech’s new MPEM module offers researchers a broadly capable tool with multiple electromigration (EM) test applications in one convenient, low-cost, high-performance system.
Voltmeter Mode for Handheld Cable and Antenna Analyzer
27 April 2015 – Anritsu introduces a Vector Voltmeter Mode (VVM) for its Microwave Site Master S820E – a handheld cable and antenna analyzer offering coverage up to 40 GHz – that allows the S820E to be used as a drop-in replacement for legacy Vector Voltmeter instruments. With the ability to provide full A/B and B/A ratio capability without additional and expensive VNA options, the S820E with the VVM provides field engineers and technicians with a compact, durable, cost-efficient single-instrument solution to make key field measurements to ensure the proper deployment, installation, and maintenance of wireless networks.
CAN FD and SENT Trigger and Analysis Options for Oscilloscopes
27 April 2015 - Yokogawa has added new trigger and analysis options to its DLM2000 (4-channel) and DLM4000 (8-channel) mixed-signal oscilloscopes (MSOs) for testing the latest generation of in-vehicle serial buses. The new options are specifically designed to address the measurement challenges posed by the CAN FD (CAN with Flexible Data Rate) and SENT (Single Edge Nibble Transmission) bus systems.
Debug and Hardware Validation Tools for Intel Broadwell-DE Microarchitecture
24 April 2015 – Engineers designing microserver and other hyperscale workload systems based on the new Intel microarchitecture codenamed Broadwell-DE will be able to quickly debug software and validate high-speed communications interconnects with ASSET InterTech’s SourcePoint and ScanWorks platforms. The first generation of the Intel Xeon Processor D family is based on the microarchitecture previously referred to as Broadwell-DE.
High Sensitivity Current Probes for Oscilloscopes
23 April 2015 – Teledyne LeCroy introduces the CP030A and CP031A high sensitivity current probes. These probes provide sensitivity down to 1 mA/div allowing users to measure current from the mA range up to a continuous current of 30Arms and peak current of 50A all with the same probe. The sensitivity of 1 mA/div combined with 1% DC and low frequency accuracy allows for more precise and accurate low current measurements on Teledyne LeCroy oscilloscopes.
40 GHz Frequency Option for Vector Signal Generator
22 April 2015 - Rohde & Schwarz has released a 40 GHz version of the R&S SGU100A RF upconverter. This version expands the frequency range of the R&S SGS100A vector signal generator from 12.75 GHz to 40 GHz, making it the smallest microwave device of its kind on the market for continuous signals between 80 MHz and 40 GHz. Though compact (two height units and ½ 19" rack width or one height unit and full 19" rack width ), the combination of the R&S SGS100A and the R&S SGU100A offers outstanding performance.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex EMC Inspection Keithley spectrum analyzer Keysight signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ Semiconductor Test characterization Semiconductor network analyzer probe wireless
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