|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Software for Instrument Control, Data Logging, Test Automation
25 July 2016 – Keysight Technologies launched the latest release of its popular BenchVue software; an intuitive, easy-to-use platform for the PC. BenchVue provides multiple-instrument measurement applications, data capture and solution applications, without the need for instrument programming. Today’s bench-instrument users continue to demand a faster, simpler way to accomplish their most common tasks. Keysight’s new BenchVue 3.5 accomplishes that task by further enhancing test automation for basic sequences.
IPC compliant THT Solder Joint Inspection of Automotive Connectors
22 July 2016 - The X-ray inspection system X Line 3·D from GOEPEL electronic enables reliable inspection of THT and Pin-in-Paste solder joints in compliance with the IPC quality standard through a unique combination of 3D X-ray (AXI) and 2D AOI inspection. That is particularly important for automotive assemblies which are subject to strict quality requirements.
All-in-One Base Station Simulator for LTE-Advanced Devices
21 July 2016 – Anritsu Corporation launched the newest Signalling Tester MD8475B for verifying the performance of User Equipment (UE) using cellular communication standards, including the latest LTE-Advanced specifications from 3GPP. The newly developed signalling tester supports both 4CC CA and 2x2 MIMO technologies.
Arbitrary Waveform Generator supports HDMI 2.0 Receiver Compliance Testing
20 July 2016 – Keysight Technologies announced that the M8195A 65 GSa/s arbitrary waveform generator (AWG) supports an integrated HDMI 2.0 receiver compliance test solution. The N5990A automated compliance and device characterization test software offers the broadest HDMI 2.0 test coverage in the market and now allows fast and reliable HDMI 2.0 testing with the M8195A AWG.
Faster structural and functional Test on Prototype and Production Circuit Boards
20 July 2016 – The newly enhanced processor-controlled test (PCT) tool on ASSET InterTech’s ScanWorks platform can perform structural and functional test, as well as diagnostics, in one pass and still achieve the high test speeds required on manufacturing lines. The PCT tool can test a circuit board without bringing up its BIOS or UEFI firmware and enables extensive diagnostics to bit-level of memory.
Protocol Analyzer supporting Bluetooth 5
19 July 2016 – Teledyne LeCroy announced their newest wideband Bluetooth protocol analyzer, the Sodera LE analyzer. Sodera LE is positioned to drive Internet of Things (IoT) development with full support of Bluetooth 5 as announced by the Bluetooth Special Interest Group last month.
High Precision PXI Source Measure Unit
18 July 2016 – National Instruments launched the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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