|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Test and Debug Environment for Infineon’s XMC4700/XMC4800 SoCs
01 July 2015 – PLS Programmierbare Logik & Systeme presents Version 4.4.5 of its Universal Debug Engine (UDE). The UDE 4.4.5 provides developers with an optimized testing and debugging environment for Infineon’s new XMC4700/XMC4800 microcontrollers. The 32-bit SoCs, which are based on an ARM Cortex-M4 processor with Floating Point Unit (FPU), were specifically developed for use in industrial applications.
Compact Boundary Scan Production Tester
30 June 2015 - GOEPEL electronics presenteds the JULIET Series2, the latest generation Boundary Scan production test platform. The compact desktop system includes fully integrated Boundary Scan test hardware, power supply and an interchangeable adapter system for flexible UUT (Unit Under Test) contact. The new JULIET (JTAG UnLimIted Tester) is particularly suitable for production testing in the low and mid volume range as well as for repair.
Ultra fast Flying Probe Tester for big PCBs with 16 Test Heads
29 June 2015 - atg Luther & Maelzer releaseds the flying probe tester A8-16a, which combines the speed of the 16 probe system A8-16 with the automation of the A7a. The A8-16a addresses the test and productivity requirements of big or complex server boards or production panels up to 24.4” x 24.0” with huge test point numbers.
Decode and analyze TCG Security and PTM Messaging
26 June 2015 – Teledyne LeCroy has extended the decoding and analysis capabilities on their PCI Express Summit protocol analyzer product family to support the new Trusted Computing Group (TCG) security and Precision Time Measurement (PTM) messaging features, utilized in Internet of Things (IoT) and PCIe SSD storage technologies.
Up to 500 Times faster Spurious Search with Vector Network Analyzer
25 June 2015 – Keysight announced a new capability that adds a high-performance spectrum analyzer to its PNA and PNA-X Series microwave vector network analyzers (VNAs). This industry-first capability reduces test times by a factor of 10 to 500 times. Incorporating this functionality into a VNA simplifies system connections and saves time by putting high-speed spurious measurements in the instrument used to characterize S-parameters, compression and distortion in satellite equipment, defense electronics and commercial wireless devices.
WCDMA Network Test System emulates up to 24 Cells
24 June 2015 – Cobham Wireless has announced the latest version of the TM500 WCDMA network test system, with expanded capability to emulate four cells and hundreds of mobile terminals from a single benchtop unit. Combining six TM500 units into a rack-mount cabinet enables the network operator or infrastructure vendor to validate real data applications usage on a WCDMA network of 24 cells – supporting thousands of terminals – in a controlled laboratory environment.
Teradyne acquires Pioneer of Collaborative Robots
23 June 2015 - Teradyne announced that it will acquire privately held company Universal Robots, a Danish pioneer of collaborative robots, for $285 million net of cash acquired plus $65 million if certain performance targets are met extending through 2018. The acquisition has been approved by the Board of Directors of each company and is expected to close in the second quarter of 2015 subject to customary closing conditions and regulatory approval.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight Aeroflex EMC Inspection spectrum analyzer Keithley signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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