|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Test Probes for Signals up to 18 Gb/s
04 November 2016 - Pico Technology launched a new family of high-performance microwave and gigabit test probes. The PicoConnect passive probes allow cost-effective fingertip browsing of broadband signals or data streams out to 9 GHz or 18 Gb/s. These include the now ubiquitous USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards.
Wafer-Level Parametric Test Solution for Power Semiconductors
04 November 2016 -- Tektronix introduced the Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down.
SAS 4.0 Protocol Analyzer Platform
03 November 2016 – Teledyne LeCroy announced the world’s first Serial Attached SCSI 4.0 (SAS) Protocol Analyzer platform supporting protocol testing and debugging of the emerging 24Gb/s SAS standard. The Sierra T244 analyzer platform leverages Teledyne LeCroy's cutting-edge TAP4 probe technology to provide early-adopters with visibility into the next-generation SAS 4.0 protocol.
Dual Channel 13.6GHz Microwave Signal Generator
02 November 2016 - Saelig announces the SynthHD PRO - a temperature-compensated, dual-channel, software-tunable RF signal generator and frequency sweeper, controlled and powered via a USB port on a device running Windows or Android software. The SynthHD PRO's dual, independent 54 MHz to 13.6 GHz channels can be configured to run at two different frequencies, or at the same frequency with different phases. This allows its use in antenna beam steering applications or quadrature signal generation commonly used in image-reject frequency conversion.
Preview of mmWave 802.11ad Wireless Test Solution
02 November 2016 – National Instruments (NI) announced a technology preview of its new 802.11ad, or WiGig, test solution. This demonstration of a new 802.11ad test solution is based on NI’s wideband mmWave transceiver technology used by automotive and wireless infrastructure researchers to prototype advanced radar and 5G systems. It consists of a vector signal generator and vector signal analyzer operating at 55 to 68 GHz with more than 2 GHz of instantaneous bandwidth.
Front Haul Solution conducts RF and Fiber Tests
01 November 2016 – Anritsu Company presented a comprehensive front haul test solution that more efficiently ensures the proper installation and operation of high-speed LTE networks. With the new CPRI RF module installed in the Anritsu Network Master Pro MT1000A, wireless carrier engineers and technicians responsible for optical fiber testing, and solving interference and PIM issues have a single handheld solution for accurate and efficient LTE CPRI testing and verification of the latest generation of tower mounted radios (Remote Radio Heads, RRH).
Testing of Laser Diodes with a Spectroradiometer
31 October 2016 - Instrument Systems demonstrates its new high resolution CAS 140CT-HR spectroradiometer at at electronica from November 8 – 11, 2016 on booth 443 in hall A1. Based on the well-established CAS 140CT spectroradiometer, the CAS 140CT-HR is optimized for light measurement tasks for particularly narrow band emitters, e.g. laser diodes. Rendering measurement results with high spectral resolution and at the same time short testing times, it is perfectly suited for sophisticated measurement tasks in production and laboratory environments.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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