|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Digital Predistortion simplifies Evaluation of Envelope Tracking Amplifiers
20 February 2014 - The new R&S SMW-K541 digital predistortion option from Rohde & Schwarz allows users to import predistortion coefficient tables directly into the R&S SMW200A. The signal generator uses these delta values to adjust the baseband signal in realtime. The option greatly reduces test times since predistorted waveforms no longer have to be tediously recalculated and imported into the generator.
ASSET announces support for ARM64 bit Architecture
20 February 2014 - At the upcoming Embedded World Exhibition and Conference from February 26-28 in Nuremberg, Germany, ASSET InterTech (Hall 4, Stand 4-100) will be announcing support for ARM64 bit architecture. Arium SourcePoint debugger from ASSET will support the ARM Cortex-A57 and Cortex - 53 processor architectures. The ARM Cortex- A57 is ARM’s highest performing processor, designed to further extend the capabilities of future mobile and enterprise computing applications including compute intensive 64-bit applications such as high-end computer, tablet and server products.
High Accuracy PCB Analyzer for PCB Manufacturing Test
19 February 2014 – Agilent Technologies introduced the E5063A PCB Analyzer for printed circuit board impedance test in manufacturing. The solution offers technology breakthroughs in accuracy and repeatability and reproducibility (R&R). The analyzer also provides a dedicated user interface with broader language support, and more robustness against electrostatic discharge for PCB manufacturing environments.
AR Europe expanded the European Sales Team
19 February 2014 - AR Europe has re-organised and expanded the European sales team. Tim Hague was appointed as the European Technical Sales Manager last year in order to support distributors and sales associates in systems based projects. In January Rob Hersom and Michel Sauvage both joined the AR UK and AR France sales teams as Technical Sales Engineers to serve the local customer base.
Aeroflex improves Phase Noise Performance of Signal Generators
18 February 2014 - Aeroflex has enhanced its S-Series signal generators (SGA and SGD) with improved phase noise and better RF level accuracy. At a carrier frequency of 1 GHz, phase noise is now improved by 6 dB at frequency offsets from 100 kHz to 1 MHz, giving a figure of typically -140 dBc/Hz between these offsets. The S-Series does this while maintaining its industry-leading frequency settling time of 100 µs.
SuperSpeed USB 10 Gbps (USB 3.1) Protocol Analyzer
18 February 2014 - Teledyne LeCroy introduced the Voyager M310, a comprehensive protocol analyzer exerciser platform for testing next generation SuperSpeed USB 10 Gbps (USB 3.1) systems. Fully backward compatible with legacy USB links, the Voyager M310 is designed to provide 100% faithful capture of 10 Gbps bus and protocol traffic for USB 3.1 devices and systems. This multifunction test platform also offers an integrated host and device traffic generation option allowing developers to emulate faulty link conditions, verify protocol compliance and improve product reliability.
Simplified Indoor Small Cell and Distributed Antenna System (DAS) Testing
17 February 2014 - RANAdvisor TrueSite is a tablet-based solution from JDSU that enables installation and troubleshooting of indoor cell site and DAS deployments. With TrueSite, a single user can quickly identify missing and/or faulty antennas, macro ingress issues, and network performance problems in real-time with data gathered from smartphones and a receiver — all from a convenient portable messenger bag.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI AOI LTE Anritsu National Instruments Advantest Aeroflex Inspection Keithley Automotive spectrum analyzer EMC LeCroy signal Generator signal analyzer AXI Yokogawa Power supply Multitest TESEQ Handheld calibration USB SPI Pico Technology ASSET InterTech Switching Viscom wireless characterization Corelis probe
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