|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Simultaneous Time Domain and Spectrum Analysis up to 1 GHz
06 March 2015 - Rohde & Schwarz added the R&S RTM-K18 spectrum analysis and spectrogram option to its R&S RTM oscilloscope family, making the R&S RTM the only oscilloscope in its class that can analyze the time domain while simultaneously analyzing the spectrum, logic and serial protocol. Interactions such as those that occur in electronic devices with RF components are quickly analyzed in a single measurement.
Automated System Test of Android Devices
05 March 2015 - JOT Automation, a supplier of test and production solutions, and Profilence, the novel test software provider, introduce an automated test solution for operators enabling a full system test coverage of all types of Android devices. JOT G3 with Profilence Tau speeds up the time-to-market and cuts total costs by testing the entire device in a reliable and repeatable environment.
Flying Probe Tester for large Format, high Layer-Count Backplanes
04 March 2015 - atg Luther & Maelzer, a company of Xcerra Corporation, announces the release and the first installations of the new A7-20 flying probe test system. Specifically designed for the demands of large format, high layer count backplanes, the A7-20 combines the flexibility typical for flying probe testers with accuracy and speed. The A7-20 significantly reduces test time and test cost.
Keysight Technologies introduces new Infiniium V-Series Oscilloscopes
03 March 2015 – Keysight Technologies announced the Infiniium V-Series oscilloscopes with models from 8 GHz to 33 GHz. The V-Series’ measurement accuracy leads the industry in three areas: lowest oscilloscope noise floor, lowest real-time oscilloscope jitter floor and highest number of effective bits. The V-Series offers a 12.5-Gbps hardware serial trigger (HWST) with a 160-bit sequence. Currently, this is the only HWST capable of finding 132-bit USB 3.1 (128b/132b) or 130-bit PCIe Gen 3 (128b/130b) symbols.
Module for Test of high-speed Interfaces
02 March 2015 - GOEPEL electronics introduces a universally adaptable tester which confirms the claims of various high-speed I/O (HSIO) interfaces. The ChipVORX module FXT-X3/HSIO4 allows testing at board level – from the inside, both in the lab and in production. It supports the interfaces GBit Ethernet, PCIe, USB 3.0 and SATA, with transfer rates in the gigabit range.
Rohde & Schwarz expanded R&S RTE Oscilloscope Family
27 February 2015 - Rohde & Schwarz announced new models of its R&S RTE oscilloscopes with two- and four-channels and with 1.5 GHz and 2 GHz bandwidth. The product family covers now a bandwidth range from 200 MHz to 2 GHz. Customers can utilize the full bandwidth of an instrument on all available channels simultaneously. The R&S RTE sets new standards in this product class with 5 Gsample/s sampling rate per channel and up to 200 Msample memory.
Motor Drive Analyzer based on high Resolution Oscilloscope
26 February 2015 – Teledyne LeCroy announces the MDA800 Series of Motor Drive Analyzers (MDAs) that combine three-phase power analyzer static (steady-state) calculations, unique dynamic three-phase power and mechanical motor analysis capabilities, and high bandwidth (1 GHz) embedded control system debug in a single instrument.
Agilent Oscilloscope JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Keysight Power supply LeCroy AXI Yokogawa Multitest Handheld calibration Switching Semiconductor Test TESEQ USB Teledyne LeCroy characterization network analyzer wireless Viscom Pico Technology
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