|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
2D and 3D Semiconductor Inspection and Metrology Platform
06 August 2014 – Camtek launched its next generation Semiconductor Inspection and Metrology platform. The Eagle product line is designed to support the fast growing Advanced Packaging market using cutting edge technologies, both software and hardware, that deliver unparalleled 2D and 3D inspection and metrology capabilities on the same platform.
All-In-One Transport Tester to support multiple Communications Protocols
05 August 2014 – Anritsu launched the new MT1000A Network Master Pro, a new generation of all-in-one optical network field testers which support the multiple communications protocols used in today’s converged telecom networks. The MT1000A Network Master Pro, a portable, compact and user-friendly all-in-one transport tester, is aimed at technicians who install and maintain mobile-access, fixed-access, metro and core transmission telecoms networks.
Automated APCO P25 Transmitter Compliance Testing
05 August 2014 – Tektronix announced a cost-effective compliance transmitter test solution for the Project 25 (P25) Common Air Interface (CAI) Phase 1 and Phase 2 standard. The new software gives RF test engineers and safety agencies the convenience of push-button measurements with automated pass/fail reporting and runs on Tektronix spectrum analyzers , all Tektronix Windows-based oscilloscopes, and on SignalVu-PC linked with the MDO4000B Mixed Domain Oscilloscope Series.
Arbitrary/Function Generators for Signals up to 30 MHz
04 August 2014 - The new Yokogawa FG400 Series is a range of arbitrary/function generators that combine intuitive operation with comprehensive sweep and modulation facilities. The instruments allow the creation of basic, application specific and arbitrary waveforms, and feature isolated output channels which allows their use in the development of floating circuits in power electronics applications.
Keysight Technologies begins Operations
04 August 2014 – The electronic measurement business of Agilent Technologies has begun operating under the Keysight name. It will remain a wholly owned subsidiary of Agilent Technologies until early November when the separation is expected to be completed and Keysight begins trading on the NYSE under the symbol KEYS.
Accurate Test Solution for USB 3.1 Receivers
01 August 2014 – Agilent announced a highly accurate test solution for characterizing USB 3.1 receivers. Using the Agilent USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets.
Yokogawa enhanced Mixed Signal Oscilloscopes
01 August 2014 - Yokogawa enhanced its DLM2000 mixed-signal oscilloscope with longer memory capabilities and a number of firmware improvements. In the new version, the length of the acquisition memory has been increased up to 62.5 Mpoints in the standard unit and up to 250 Mpoints with the extended memory option. This means that, with the maximum memory installed (/M3 option), in single-shot mode, a 10 kHz signal lasting for more than one hour can be captured.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator LeCroy signal analyzer Power supply AXI Yokogawa Handheld Multitest TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
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