|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Test Probe for Lead-Free Fine Pitch PCBA Test Applications
05 July 2016 - Everett Charles Technologies (ECT) introduces the LFRE-39 spring probe to complete its comprehensive portfolio of products for lead-free test applications. LFRE-39 features ECT’s LFRE plating and is designed to meet fine pitch requirements down to 39 mil (1.0 mm). The LFRE-39 fully meets the demanding requirements of high volume production in-circuit and functional test.
BERT Solution for Characterization of PAM-4 and NRZ Devices
04 July 2016 – Keysight Technologies introduced a M8040A high-performance BERT for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for the next generation of data center interconnects will benefit from simplified test setups and repeatable and accurate results.
Eye Diagrams Capabilities for Serial Trigger and Decode Solutions
01 July 2016 - Teledyne LeCroy expanded the Serial Data Analysis capabilities for its oscilloscope solutions by introducing as first oscilloscope manufacturer Eye Diagram capabilities in the new TDME Serial Bus options. Eye diagram mask testing and mask failure locator can be used to identify physical layer anomalies.
Cost-efficient RF Contactor Solution for FBGA, QFN and Wafer-Level Packages
30 June 2016 - Multitest introduced the ACE Contactor, which offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications. The ACE probe has a revolutionary new architecture, which provides exceptional electrical performance, both DC and RF.
Impedance Analyzer and LCR Meter measures from DC to 5 MHz
29. June 2016 - Zurich Instruments launched a new Mid-Frequency Impedance Analyzer and Precision LCR (MFIA) Meter. The MFIA measures in the frequency range from DC to 5 MHz. Based on the Zurich Instruments' Mid-Frequency (MF) platform, which was successfully introduced in 2015, the MFIA offers 0.05% basic accuracy and a measurement range spanning 1 mΩ to 10 GΩ. It is optimized for testing discrete components, dielectrics, solar cell and semiconductors, as well as bio-impedance monitoring and microfluidic applications.
Simplified Troubleshooting on highly complex SoCs
28 June 2016 – With highly complex automotive microcontrollers ‒ such as Infineon’s AURIX family or the PowerArchitecture-based SPC58E series from STMicroelectronics ‒ very large amounts of trace data accrue in a very short period of time, especially when the data are recorded through a high bandwidth trace interface like Aurora. PLS’ UDE 4.6.2 with unique search function supports the rapid analysis of very large amounts of trace data.
Advantest ships 800th V93000 Port Scale RF Tester
27 June 2016 – Advantest has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu Changjiang Electronics Technology Co. Ltd. (JCET), a leading Chinese semiconductor packaging assembly and test company in the Jiangsu Province of China. The newly installed system is equipped with a Pin Scale 1600 digital card, Port Scale RF subsystem and MB-AV8+ analog card to meet JCET’s needs in testing RF-based system-on-chip (SoC) devices and 3G/4G/LTE RF transceivers for mobile phone applications.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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