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• New Family of compact RF, Microwave Power Sensors/Meters

  News - General T&M

  Created: Tuesday, 24 January 2012 08:09

  New Family of compact RF, Microwave Power Sensors/Meters 24 January 2012 – Tektronix introduced a family of compact RF and microwave power sensors/meters that feature the industry’s fastest measurement speed, cover a wide frequency range, and provide...

• Virtual Testing Brings ECUs to Life Virtual

  News - Board test

  Created: Monday, 23 January 2012 15:46

  Virtual Testing Brings ECUs to Life Virtual 23 January 2012 - To increase the safety and reliability of electronic control units (ECUs), the automotive industry is turning to realistic early simulation. The tool for this is the new dSPACE Offline Simulat...

• Complete Debug and Test solution for Infineon’s new TriCore Multicore Architecture

  News - General T&M

  Created: Monday, 23 January 2012 13:41

  Complete Debug and Test solution for Infineon’s new TriCore Multicore Architecture 23 January 2012 - PLS Programmierbare Logik & Systeme introduces its Universal Debug Engine (UDE) 3.1.7., the first debugger solution for the new 32-bit multicore ar...

• Fully-Autonomous Defect Review SEM for Chip Production

  News - Component Test

  Created: Monday, 23 January 2012 07:35

  Fully-Autonomous Defect Review SEM for Chip Production 23 January 2012 - Applied Materials launches the Applied SEMVision G5 system – the first tool that enables chipmakers to image and analyze 20nm yield-limiting defects in a production environment wi...

• Semiconductor In-Situ Process Monitoring of Wafer Temperature

  News - Component Test

  Created: Friday, 20 January 2012 11:29

  Semiconductor In-Situ Process Monitoring of Wafer Temperature 20 January 2012 - KLA-Tencor Corporation introduced new additions to its SensArray portfolio of advanced wireless temperature monitoring wafers. The portfolio implements time-based, in-situ te...

• DDS Function Generator with Arbitrary Waveform Function

  News - General T&M

  Created: Friday, 20 January 2012 07:20

  DDS Function Generator with Arbitrary Waveform Function 20 January 2012 – GAO Tek Inc. is offering its DDS function generator with arbitrary waveform function. It is designed for use in such applications as communication equipment and electronic compon...

• Handheld Oscilloscopes with advanced Displays for Industrial Applications

  News - General T&M

  Created: Thursday, 19 January 2012 12:55

  Handheld Oscilloscopes with advanced Displays for Industrial Applications 19 January 2012 – Agilent Technologies announced the addition of two new oscilloscopes to its portfolio of handheld instruments. The 100-MHz U1610A and 200-MHz U1620A – the fir...

• QuadTech acquired by Chroma Systems Solutions

  News - General T&M

  Created: Thursday, 19 January 2012 08:16

  QuadTech acquired by Chroma Systems Solutions 19 January 2012 - Chroma Systems Solutions, Inc. (CSS) announced the acquisition of primary assets of Massachusetts-based QuadTech, Inc., a provider of electrical safety test equipment and systems. CSS, locat...

• High-Speed Inter-Chip Compliance Test Software for Real-Time Oscilloscopes

  News - Board test

  Created: Wednesday, 18 January 2012 11:55

  High-Speed Inter-Chip Compliance Test Software for Real-Time Oscilloscopes 18 January 2012 – Agilent Technologies announced the first commercially available High-Speed Inter-Chip (HSIC) compliance test software for real-time oscilloscopes. The software...

• Workbench simplifies Multicore Control And Debugging at System Level

  News - Board test

  Created: Wednesday, 18 January 2012 07:49

  Workbench simplifies Multicore Control And Debugging at System Level 18 January 2012 - PLS Programmierbare Logik & Systeme presents its Universal Debug Engine (UDE) 3.2 for the first time at embedded world 2012, Nuremberg in Hall 4, Booth 4-310 from ...

• Compliance Suite Software to Support Link Layer Specification Version 1.0

  News - General T&M

  Created: Tuesday, 17 January 2012 12:43

  Compliance Suite Software to Support Link Layer Specification Version 1.0 17 January 2012 - LeCroy announced the release of their compliance test suite that adheres to the newly ratified USB 3.0 Link Layer Test Specification 1.0. The LeCroy compliance te...

• Merger of JOT Automation and Master Automation Group completed

  Newsflash - Newsflash

  Created: Tuesday, 17 January 2012 07:35

  17 January 2012 - JOT Automation Ltd. and Master Automation Group Ltd. have completed the merger on 31.12.2011. Company name will be JOT Automation Ltd. With this merger JOT Automation Ltd. will strengthen its business and increase solution providing for ...

• Logic Technology increases Presence in Central Europe

  News - General T&M

  Created: Monday, 16 January 2012 12:32

  Logic Technology increases Presence in Central Europe 16 January 2012 – Logic Technology, a provider of solutions in the field of software code quality measurement, boards, development tools and software components, today announced that it has increase...

• USB Controlled Power Meter for 9 kHz to 3 GHz

  News - General T&M

  Created: Monday, 16 January 2012 07:26

  USB Controlled Power Meter for 9 kHz to 3 GHz 16 January 2012 - Teseq has introduced the new power meter model PMU 6003. It is designed for a large variety of applications in the frequency range of 9 kHz to 3 GHz. The main features of the PMU 6003 includ...

• AOI System for PCBs and IC Substrates

  News - General T&M

  Created: Friday, 13 January 2012 11:38

  AOI System for PCBs and IC Substrates 13 January 2011 – Camtek Ltd announced the launch of the Phoenix product family: The next generation of Automatic Optical Inspection (AOI) systems for the PCB and IC Substrates industry. The Phoenix product family ...

• Tektronix expands High Voltage Probe Offerings

  News - General T&M

  Created: Friday, 13 January 2012 07:29

  Tektronix expands High Voltage Probe Offerings 13 January 2012 – Tektronix announced four new high-voltage probes and significant upgrades to three existing probe offerings.  No high voltage probes on the market today can match the combination of ...

• LeCroy announces 60 GHz Real-time Bandwidth Oscilloscope

  News - General T&M

  Created: Thursday, 12 January 2012 12:14

  LeCroy announces 60 GHz Real-time Bandwidth Oscilloscope 12 January 2012 ─ LeCroy extends its technology leadership with a new 36 GHz / 80 GS/s chipset. Used in the new LabMaster 10 Zi oscilloscopes the patented technology delivers 60 GHz bandwidth and...

• ElectroTestExpo 2012 - Engineering Event for PCB Test and Debug

  News - General T&M

  Created: Thursday, 12 January 2012 07:57

  ElectroTestExpo 2012 - Engineering Event for PCB Test and Debug 12 January 2012 – The ‘ElectroTestExpo’ consortium announces a series of regional test exhibition and seminars to be held throughout 2012. For its third year of free-to-attend events E...

• New Method for Testing Advanced Wireless Systems

  News - General T&M

  Created: Wednesday, 11 January 2012 12:19

  New Method for Testing Advanced Wireless Systems 11 January 2012 – Agilent Technologies and Lime Microsystems announced a custom pairing of test equipment, transceiver technology and control software that constitutes a new method for testing and evalua...

• Synchronous Ethernet Testing

  News - Service/Maintenance

  Created: Wednesday, 11 January 2012 08:12

  Synchronous Ethernet Testing 11 January 2012 - Anritsu A/S, a subsidiary of Anritsu Corporation, announced the availability of a new Synchronous Ethernet test option for the all-round and easy-to-use CMA 3000 field tester. The new option supports Synchro...