|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Burst Pulse Coupling & Decoupling Network for EFT-Testing
10 Mai 2012 - Teseq introduces the CDN 3083-B200, a 3-phase burst pulse coupling & decoupling network intended to allow EFT/Burst testing of equipment requiring large currents. The new coupling network is specially designed for heavy industry, smart grid and electro vehicle applications. The CDN 3083-B200 serves to inject fast transients (burst pulses) up to 8 kV (5/50 ns – 50 Ω) into the supply lines of the Equipment Under Test.
The CDN 3083-B200 is designed to be used with an EUT supply in AC mode up to 690 Vac in line to line or line to ground. DC voltage can be taken up to 1000 Vdc line to line or line to ground. Although designed for continuous duty at up to 200 A per phase, the unit can be subjected to considerably higher currents for short durations.
High inrush currents or pulse-shaped peak currents can be handled with ease. The current limitation is largely a matter of thermal loading and ambient temperature. A built-in thermometer enables the heating effect to be monitored.
The small and compact design allows easy handling and comfortable setup possibilities in standard compliant application setups, where distances between CDN and EUT are specified quiet short, and where the use of combined CDN's generally built in 19" racks show difficulties in meeting the test setup requirements specified by the standards.
The type of construction, inside a metal housing for use directly on the ground reference plane, ensures excellent HF earthing. The EUT supply connections take the form of generously dimensioned screw terminals.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator LeCroy signal analyzer Power supply AXI Yokogawa Handheld Multitest TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
© All about Test 2014