|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Service/Maintenance Test
Aeroflex significantly reduces LTE Mobile Test Times for Service Centers11 February 2014 - Aeroflex announced that the latest upgrade to its Lector software provides dramatic improvements in the speed of mobile device RF tests in service centers. Lector 7 software achieves a remarkable doubling in LTE test speed for a range of mobile devices. Test times for a reference multi-band mobile device* using the Aeroflex 7100 LTE Digital Radio Test Set with Lector 7 have been improved by an average of 53%. It now takes only 3 minutes 5 seconds to complete the full set of LTE tests with Lector 7 as compared with 6½ minutes with the previous version, Lector 6.83. For a full test script covering multiple 2G/3G/4G bands, test time is reduced from ten minutes to less than six minutes, a saving of over 40% in test time. The 2G/3G/4G final tests were performed using a 7100 for LTE and an Aeroflex 4400 Mobile Phone Tester for 2G/3G, although a 2201 Service Tester can also be used in place of the 4400. “Speed of test is a critical factor in high volume service centres”, said Roger Perry, product manager at Aeroflex. “The substantial reductions in overall test time achieved with Lector 7 reinforce the cost-saving advantages service centres can achieve when using Aeroflex solutions for testing mobile devices.” *Using a European version of a popular Android smartphone as device under test. Aeroflex's Lector software is a well-established and cost-efficient test tool that allows service centers and repair shops to easily perform RF final tests of 2G/3G/4G mobile devices. Lector 7 seamlessly integrates Aeroflex's terminal testers, shield boxes and antenna couplers with a growing database of mobile devices to enable quick and simple testing. www.aeroflex.com/Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |