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Test & Measurement Glossary

In this glossary you will find about 500 terms, abbreviations and acronyms used in the world of test, measurement, and electronics. The following figure shows the number of entries of the selected letter of the alphabet.
There are 45 entries in this glossary.
Search for glossary terms (regular expression allowed)
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Term Definition
SPC
Statistical Process Control
SPL
Sound Pressure Level
SPM
Scanning Probe Microscope
SPS
Standard Positioning Service (GPS)
SQC
Statistical Quality Control
SSH
Simulataneous Sample and Hold
STEM
Scanning Transmission Electron Microscope
STEP
Simple Transition Electronic Processing
STIL
Standard Test Interface Language (IEEE 1450)
STIX
Semiconductor Test Interface eXtensions (initiative)
STP
Standard Temperature Pressure (Standard conditions for temperature and pressure) There different standards defined e.g. by NIST: a temperature of 20 °C (293.15 K, 68 °F) and an absolute pressure of 101.325 kPa (14.696 psi, 1 atm).
STPD
Standard Temperature Pressure Dry
STRIFE
Stress and Life (Stress Plus Life Test)
SWEAT
Standard Wafer-level Electromigration Accelerated Test
SWR
Standing Wave Ratio (ratio of the amplitude of a partial standing wave at an antinode (maximum) to the amplitude at an adjacent node (minimum), in an electrical transmission line)


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