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Boundary Scan Test

Whitepaper, articles and application notes about Boundary Scan Test (also known as JTAG or IEEE 1149.x).

 

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JTAG - more than just a port for chip testing

Short Description:
For many the term ‘JTAG’ is still a point of confusion, as well it might since, for some engineers, it is a programming port whilst for others it is there to plug-in an emulator or debugger. In fact it was devised for neither of these purposes.
Submitted On:
31 Jan 2011
File Size:
365.95 Kb
File Author:
JTAG Technologies