JTAG - more than just a port for chip testing
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Description:

The acronym JTAG is actually short for the Joint Test Action Group and its initial aims were just that, to provide an aid to circuit board testing. The ‘group’ met over a period of some five years, from 1985 to 1990, all the time devising and then finalizing a scheme to embed test circuitry into digital devices to assist in the structural test of the PCBs onto which they would be placed.

Since then the structure of JTAG as a test port has been well documented and understood. It has been a recognized IEEE standard (reference 1149.1) since 1990. In the meantime, a number of alternative uses for ‘JTAG‘ have been developed, such as its use for debugging and programming.

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JTAG Technologies

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