Near-Field Probe Set from 30 MHz to 3 GHz

05 June 2025 - With the new RF Basic set, Langer EMV-Technik GmbH offers a powerful tool for development-accompanying diagnostics of electromagnetic emissions on electronic assemblies. The set is particularly aimed at developers and test engineers looking for a solid entry into EMC measurement technology. The set includes six passive near-field probes for measuring electric and magnetic fields in the frequency range from 30 MHz to 3 GHz. Thanks to the variety of probe heads, RF interference sources can be gradually localized and their coupling mechanisms analyzed.

Starting with a general analysis using the RF-R 400-1 and RF-E 02 probes, the relevant interference components for both conducted and radiated EMC tests (antenna measurements) can be detected. Higher-resolution probes such as the RF-R 3-2, RF-B 3-2, RF-U 2.5-2, and RF-E 05 enable precise investigation of field distribution and field orientation directly on the PCB.

A standout feature of this set is its versatility. It allows detection of around 80 percent of EMC-relevant interference factors, thus covering the majority of typical application scenarios – for both electric and magnetic near fields. The probes are designed for connection to spectrum analyzers, measuring receivers, or oscilloscopes with a 50-ohm input.

It is recommended to use an additional preamplifier (20–30 dB), especially with the high-resolution probes. This increases measurement sensitivity and also protects the input of the measuring device from overvoltage (only with external preamplifier).

With its well-balanced combination of functionality, resolution, and ease of use, the RF Basic set is the ideal solution for EMC newcomers and a reliable tool for optimizing electromagnetic compatibility in electronic development.

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