|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinks |
Readers Top 5 News of last 30 days
News - Other T&MHIL Test of embedded Real-Time Control Systems14 February 2020 - Hitex now offers extensive support for Hardware-in-the-Loop (HIL) testing of AURIX based systems. HIL tests allow testing of embedded real-time control systems in a virtual environment. This can significantly reduce costs and test times. Complete HIL systems can be complex and expensive. Hitex has developed miniHIL in cooperation with Protos Software GmbH as a cost-effective system for automated tests. The test item is connected to miniHIL, for which a variety of adapters for different microcontrollers are available. Of course, proprietary hardware can also be connected via customized adapters. HIL refers to a process in which an embedded system is connected to a simulation of the real environment of the system. A HIL system has to emulate sensors and actuators in order to connect the test system to the environment. This procedure allows embedded systems to be secured at an early stage, which significantly reduces the costs for troubleshooting. For example, failure conditions can be documented and repeated more easily. HIL simulation usually has to run in real time and is used in development to save costs, increase quality, shorten development times and thus shorten the time to market. The miniHIL developed by Hitex and Protos is a cost-effective way to perform these HIL tests. www.hitex.com/ |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |