|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Free Electronic Instrument Control and Automation Software
21 May 2013 - Agilent Technologies announced the latest enhancement on its Command Expert software for faster and easier instrument control in many test applications. The updated version, which now includes support for Windows 8, brings new capabilities to users. Agilent has improved the instrument discovery process, providing closer integration with the company's I/O libraries. The software also supports new releases of common application development environments, and it includes more examples and instrument command sets to improve usability.
HIOKI launches 3-Phase Digital Power Meters
21 May 2013 - Hioki E.E. Corporation released two new 3-phase AC/DC digital power meters, the two-channel PW3336 and the three-channel PW3337, to support the power consumption and efficiency testing of electronic and industrial equipment. Both instruments can take direct-input measurements of large currents of up to 65A while maintaining measurement accuracy of 0.15%.
KLA-Tencor announces novel Defect Discovery and Monitoring Technology
17 May 2013 - KLA-Tencor announced NanoPoint, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously limited the ability to detect tiny yield-killing defects inline at advanced nodes.
Modular Test System Power Supply from Diagnosys
17 May 2013 - The new modular powerpak unit from Diagnosys provides programmable voltage and current supplies to power units being tested. Designed primarily to complement the standard built-in power supplies of the PinPoint range of test systems, the powerpak extends both the number of power rails available and also the voltage and current available.
Four-Channel high Voltage Instrument for Analog Test System
16 May 2013 – LTX-Credence introduces the VSX four-channel multisite high voltage source and measure instrument for its low cost analog test system ASLx. Specifically designed for the challenging high voltage stress and breakdown tests required in today's growing power device market. It can source up to 1250V, for coverage of the majority of high voltage testing needs.
Agilent Oscilloscope JTAG Boundary Scan Tektronix Goepel PXI AOI Anritsu LTE National Instruments Inspection Keithley LeCroy Advantest Aeroflex spectrum analyzer Automotive EMC signal analyzer signal Generator Multitest Yokogawa AXI TESEQ calibration Power supply Switching Handheld GAO Tek Corelis Geotest characterization USB ASSET InterTech probe Battery Test Viscom
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