|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
High Resolution Error Detection for Advanced ICs
27 November 2015 - Advantest Corporation initiated sales of its new TDR Option for the company’s TS9000 series of terahertz analysis systems. The new option enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilizing short-pulse terahertz waves. The solution provides an extremely high spatial precision of less than 5 μm, and a maximum measurement range of 300 mm.
Strong Growth expected for Network Testing and Monitoring Equipment Market
26 November 2015 – The widespread adoption of machine-to-machine (M2M) communication, shift from reactive to predictive analytics for the Internet of Things (IoT), and continuing virtualization of network functions are compelling service providers to seek advanced testing solutions for big data and cloud analytics. Testing methodologies that can check the conformance of higher level infrastructure will prove critical in a digital environment that is characterised by long-term evolution (LTE), heterogeneous networks (HetNets) and cloud computing.
Precision DC Calibrator provides high Currents and Voltages
26 November 2015 - The new Yokogawa 2560A precision DC calibrator offers a simple, stand-alone solution for the testing and calibrating DC measuring instruments such as analogue meters, clamp meters, thermometers, temperature transmitters and data loggers. The 2560A generates signals over a wide output range to enable the testing of products over their full operating ranges. In particular, it can generate DC voltages up to 1224 V and DC currents up to 36.72 A. By connecting two instruments in parallel, a maximum current of 73.44 A can be generated.
AC Power Source delivers up to 1500 VA
25 November 2015 - B&K Precision announced the expansion of its 9801 programmable AC power source offering with the addition of two new high power AC sources, models 9803 and 9805. The new 9803 and 9805 can deliver up to 750 VA and 1500 VA respectively, and also measure AC voltage, current, and power parameters. Both sources can operate in a 0-300 V continuous sweep range or 150 V/300 V auto-switching range with adjustable start and stop phase angle control.
Ultra-compact Handler Platform with high Test Capacity
24 November 2015 - JOT Automation introduced the modular JOT M10 Test Concept with the highest test capacity in a tiny footprint. The compact JOT M10 enables the reliable testing of the full range of applications with a single platform on the fast-moving factory floor. The JOT M10 automates functional, ICT, high voltage, SW download and RF testing with rapidly deployable, plug-and-play type test boxes, handlers and racks.
Omron appointed new Distributor in Poland
24 November 2015 - OMRON appointed JSD Polska as new distributor for its AOI solutions in Poland. JSD was founded in 2004 and is based in the Polish capital Warsaw. The company offers a wide range of production equipment for the Polish market and has an extensive install base with outstanding local customer support capability.
XJTAG Introduces Live Signal View with Improved Multi-Core Support and Increased Productivity
23 November 2015 – XJTAG announced the release of Version 3.4 of its Development System, which introduces major improvements in the visibility into complex systems during all phases of electronic product development and manufacture. A new feature is the Waveform Viewer, which offers a live, correlated view showing the digital signal levels and transitions of acquired JTAG Chain data.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI Anritsu AOI National Instruments Keysight Automotive Advantest EMC Aeroflex Keithley spectrum analyzer Inspection signal Generator Power supply signal analyzer Yokogawa AXI Multitest Teledyne LeCroy LeCroy Handheld calibration network analyzer Switching USB TESEQ wireless Semiconductor characterization Semiconductor Test probe
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