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Readers Top 5 News of last 30 days
- 12 February 2014 - Faster, easier Debugging of DDR Devices
- 18 February 2014 - SuperSpeed USB 10 Gbps (USB 3.1) Protocol Analyzer
- 20 February 2014 - Digital Predistortion simplifies Evaluation of Envelope Tracking Amplifiers
- 25 February 2014 - Wireless Test Set enables Insights into LTE-Advanced Category 6 Chipsets
- 24 February 2014 - Full bi-directional Cat 6 LTE-A Mobile Handset Test Capability
Latest Test and Measurement News
Nordson DAGE opened a new Research and Development Facility
10 March 2014 - Nordson DAGE opened its new expanded Research and Development facility in Colchester, Essex, UK. The move to the new location had been planned in line with new R & D programs with subsequent headcount expansion to further drive Nordson DAGE’s Bond Test and X-ray product development programs. The move has doubled the space and added important capability including a new cleanroom facility.
Processor Emulation in Combination with Boundary Scan
10 March 2014 – GOEPEL electronic developed another TAP Interface Card (TIC), named TIC122, for the modular Boundary Scan hardware platform SCANFLEX. The new TIC Module features a programmable multi-bus interface enabling nearly unlimited compatibility to a multitude of standardized and proprietary microprocessor debug protocols and – simultaneously – supporting all Boundary Scan standards.
Off-the-shelf Solution for IEC/EN 61000-4-3 EMS Measurements
07 March 2014 - The new standardized R&S CEMS100 test platform from Rohde & Schwarz is the first flexible and reliable off-the-shelf solution for EMS measurements in line with IEC/EN 61000-4-3. The state-of-the-art platform includes all the components needed for EMS and EMI measurements. It covers all common frequency ranges and field strengths required for precompliance tests and certification. Rohde & Schwarz will be showcasing the R&S CEMS100 next week on the international EMV Düsseldorf 2014 trade fair (booth CCD-202).
Aeroflex announced Acquisition of Shenick Network Systems
07 March 2014 - Aeroflex announced the acquisition of Shenick Network Systems. Shenick, headquartered in Dublin, Ireland, is a pioneer in the IP test and measurement testing market and has developed a unique solution for today’s virtualized and physical network infrastructure. Shenick’s TeraVM helps service providers and network equipment manufacturers load, analyze, develop and validate the performance and capabilities of a wide variety of network and security devices including VPN/Firewall, vSwitch, DPI or IPS/IDS, vLoad Balancer and video infrastructure.
Instrument covers all basic Immunity Requirements for CE Mark Testing
06 March 2014 - EMC PARTNER added the IMU4000 EMC test system to its iproduct portfolio. Covering all the basic immunity requirements for CE mark testing, the IMU4000 includes ESD, EFT, CWG, AC/DC DIPS, INTERRUPTS and VARIATIONS, COMMON MODE and both AC and IMPULSE MAGNETIC FIELDS. Available with impulse voltages up to 4kV the IMU4000 is an innovative and cost effective solution.
Free Software for Electronic Instrument Control and Test Automation
06 March 2014 – Agilent Technologies released the newest version of its Command Expert software for faster and easier instrument control in many test application development environments. This release includes support for Python, a common development environment for engineers. It also includes updates to the newest versions of the other development environments, along with continuing software enhancements.
Ultracompact Drive Test Scanner for wireless Networks
05. March 2014 - At Mobile World Congress 2014 Rohde & Schwarz presented the R&S TSME – a new, ultracompact drive test scanner for today's and tomorrow’s wireless communications standards and frequency bands. Measuring 151 mm x 47 mm x 93 mm and weighing just 650 g, it is not only much smaller and lighter than competing devices, it also consumes very little power, making it the ideal solution for testing the quality of communications channels in the field as well as inside buildings where high data traffic presents a difficult set of problems.
More Articles...
- XJTAG enters Repair Market with major new Release
- Tektronix announces Pricing and Line-up Changes for Mixed Signal Oscilloscopes
- Anritsu demonstrates LTE-A Category 6 Peak Data Rates of 300 Mbps
- 80 and 120 MHz Waveform Generators with low Jitter and Distortion
- Rigol extends Mixed-Signal Digital Oscilloscope Family
- PicoScope Oscilloscopes now run on Linux
- AppliedMicro and ASSET InterTech collaborate on Debugging Tools
- Rohde & Schwarz introduces new Oscilloscope Family
- Aeroflex introduces Base Station RF Tester
- Tool for automated Module Integration Testing of embedded Software
- Tektronix integrates six Instruments in one Oscilloscope
- Wireless Test Set enables Insights into LTE-Advanced Category 6 Chipsets
- USB Oscilloscope with eight high-resolution Channels
- Full bi-directional Cat 6 LTE-A Mobile Handset Test Capability
- Programmable Multi-Channel GPIB Power Supplies
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