|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
iPad App to design and simulate Circuits
09 July 2014 – National Instruments introduced the new Multisim Touch app for iPad to design and simulate circuits using high-fidelity SPICE simulation results identical to the desktop. The fully interactive Multisim Touch is a new addition to the world-class Multisim simulation solution that extends powerful circuit analysis tools to the iPad so users can quickly prove new ideas, design when inspired or complete homework assignments.
Spring Probes: Fastest Availability guaranteed
09 July 2014 - Everett Charles Technologies (ECT) has established an advanced inventory stocking program for standard spring probes to ensure supply chain reliability and flexibility. ECT fully recognized customers need to shorten product development times and to react promptly to changing demand.
1200 W Multi-Range DC Power Supplies
08 July 2014 - B&K Precision announced the expansion of its 9115 Series with the addition of two new multi-range programmable DC power supplies, models 9115-AT and 9116. Like the 9115, the new models deliver full output power of 1200 W in any combination of voltage and current within the rated limits and continue to offer the same great features, but with a few notable differences. The 9115-AT provides unique built-in automotive test functions and the 9116 offers a higher voltage range up to 150 V.
Radio Test Set for testing analog Radios
08 July 2014 - Rohde & Schwarz designed the R&S CMA180 radio test set especially for analog radio production and maintenance. Equipped with a touchscreen for easy operation, the new tester can generate any test signal of up to 20 MHz bandwidth and process high input power levels of up to 150 W. It offers all of the functions of a high end device at an attractive price.
Oscilloscopes with Bandwith up to 500 MHz and large 10.1" Touch-Screen Display
07 July 2014 - Teledyne LeCroy introduced the WaveSurfer 3000 series of oscilloscopes featuring the MAUI advanced user interface. This advanced user interface, previously available only on higher-end oscilloscopes, seamlessly integrates a deep measurement toolset and multi-instrument capabilities into a cutting edge user experience centered on a large 10.1" touch screen, the largest display and only touch screen in this class of oscilloscope. WaveSurfer 3000 oscilloscopes are available in bandwidths from 200 MHz to 500 MHz, with 10 Mpts/ch memory and up to 4 GS/s sample rate.
BGA Interposer Solution for Probing DDR4 Designs
07 July 2014 – Agilent Technologies introduced two new interposer solutions for testing DDR4 and DDR3 DRAM designs with a logic analyzer. Both interposer solutions provide fast, accurate capture of address, command and data signals for debugging designs and making validation measurements. The Agilent W4633A BGA interposer is used with Agilent E5849A probes for high-data-rate DDR4 x4 or x8 DRAM designs. The Agilent W3636A BGA interposer allows engineers to probe DDR3 x16 nonstacked DRAM more than 2 G deep.
Intelligent Breakout Boxes to Simplify NVH Testing
04 July 2014 - VTI Instruments introduced its EMX-4008 and EMX-4016 - 8 and 16 channel breakout boxes (BOB's) for use with the EMX-425X series of modular dynamic signal analyzers. Incorporating these BOB's into a NVH test solution (Noise, Vibration, Harshness) provides users with an external trigger connector and an external calibration input connector to facilitate and simplify triggering and calibration of the EMX-425X cards.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley EMC spectrum analyzer signal Generator LeCroy signal analyzer AXI Power supply Yokogawa Handheld Multitest TESEQ Switching calibration SPI Viscom Semiconductor Test wireless USB characterization Pico Technology Corelis ASSET InterTech
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