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Readers Top 5 News of last 30 days
- 03 May 2013 - Rohde & Schwarz expanded Oscilloscope Portfolio
- 23 April 2013 - 3D Solder Joint Inspection
- 26 April 2013 - Top/Bottom AOI for THT with Matrix Cameras and Multispectral Illumination
- 30 April 2013 - New PXI Controller supports four Test Technologies
- 19 April 2013 - Mek unveils new AOI Technology Line-up
Latest Test and Measurement News
KLA-Tencor announces novel Defect Discovery and Monitoring Technology
17 May 2013 - KLA-Tencor announced NanoPoint, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously limited the ability to detect tiny yield-killing defects inline at advanced nodes.
Modular Test System Power Supply from Diagnosys
17 May 2013 - The new modular powerpak unit from Diagnosys provides programmable voltage and current supplies to power units being tested. Designed primarily to complement the standard built-in power supplies of the PinPoint range of test systems, the powerpak extends both the number of power rails available and also the voltage and current available.
Four-Channel high Voltage Instrument for Analog Test System
16 May 2013 – LTX-Credence introduces the VSX four-channel multisite high voltage source and measure instrument for its low cost analog test system ASLx. Specifically designed for the challenging high voltage stress and breakdown tests required in today's growing power device market. It can source up to 1250V, for coverage of the majority of high voltage testing needs.
Analysis Software for USB Protocol Analyzers
16 May 2013 – Agilent Technologies announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs’ behavior, and streamlining USB test and validation.
National Instruments promotes Eric Starkloff to Senior Vice President of Marketing
15 May 2013 – National Instruments announced the promotion of Eric Starkloff to senior vice president of marketing. Eric leads the organizations responsible for strategic planning, positioning the company’s innovative hardware and software platforms, marketing NI’s products and corporate brand and creating an effective eBusiness platform.
More Articles...
- High-end Signal and Spectrum Analyzer for EMI Diagnostic and Precompliance Test
- Low Cost PXI Multiplexer Solutions
- Oscilloscopes with flexible Resolution
- New eBook: Functional Tests on I2C and SPI Monitors with JTAG
- 802.11ac WLAN One-Box Test Solution for Manufacturing
- Desktop Tester supports Embedded System Access
- Test and Debug Solution for Texas Instruments’ Hercules MCU Platform
- Free Data Acquisition Software and ActiveX Controls Library
- Vector Signal Generator for complex multichannel Scenarios
- 802.11ac Standards and MIMO Technology to drive Global RF Test Equipment Market
- Embedded System Access Test Platform open for 3rd Party Tools
- Kelvin Contactor for High Power Applications proves Performance
- Advantest acquires W2BI
- Rohde & Schwarz expanded Oscilloscope Portfolio
- Modular Immunity Tester supplies 8 kV Pulses
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