|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Safe Temperature Measurements on high Voltage hybrid and electric Vehicles
26 November 2014 – New developments in the field of hybrid and electric vehicles present entirely new challenges to the manufacturer's testing departments. Not only in regard to the new technology but also especially in terms of safety aspects. In high voltage measurement systems the safety of specialized staff must always take priority. IPETRONIK now provides a compact high voltage thermocouple module for K-type sensors which completely meets these requirements.
Modular Solutions for Product Identification in Manufacturing Lines
26 November 2014 - JOT Automation, a supplier of test and production solutions, complements its test solutions with modular product identification equipment. The JOT Scanner Unit SCU-439 and JOT Fail Separation Unit FMM-440 are designed for automated test lines and can be used with any process equipment that needs product identification data or if there is a need to mark/separate faulty products after the process.
New Information Portal focusing on Oscilloscopes
25 November 2014 - OScopes.info is a new website providing comprehensive information, helpful background knowledge and latest news about oscilloscopes. The website is intended for all who are using or plan to use an oscilloscope in their job or off work. It supports both experts and unexperienced users in selecting an appropriate oscilloscope for their application as well as in using existing instruments.
World’s fastest IQ PXIe Arbitrary Waveform Generator
25 November 2014 – Tabor Electronics released its first high speed IQ AWG for the PXI Express (PXIe) platform, offering advanced arbitrary capabilities and leading industry performance, all in a compact, stand-alone, dual slot PXI product. Equipped with 2.3GS/s, 14 bit clock (typically 2.5GS/s) and 1GHz output stage, the new 52592 is optimized for high bandwidth IQ applications. For applications needing only one IF signal, the new design also can be order in a single channel version, under the model number 52591.
USB 2.0 Connector and Cable Assembly Compliance testing using a Network Analyzer
24 November 2014 – Keysight Technologiesannounced the availability of its Method of Implementation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).
Passive Oscilloscope Probes operate over wide Temperature Range
24 November 2014 - The 10:1 passive oscilloscope probes Model 702902 and 702906 from Yokogawa operate over a wide temperature range from -40°̊C to +85̊C. They are ideally suited to use in accelerated testing and validation methods where temperature cycling is part of the test procedure. The 702902 is designed for use with the isolated BNC input modules of Yokogawa's DL850E ScopeCorder family, whereas the 702906 is intended to be used with the non-isolated BNC inputs of the Yokogawa DLM4000 and DLM2000 Series of oscilloscopes.
Package Characterization at Cold Conditions
21 November 2014 - The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving requirements for temperature performance driven by applications in the end markets. Whereas final test of the respective devices in high volume production will only be done at ambient/hot, they need to get qualified for cold conditions before they ramp.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI LTE AOI Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley spectrum analyzer EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test network analyzer Switching Viscom wireless USB characterization SPI probe Keysight
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