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Readers Top 5 News of last 30 days
- 15 November 2013 - TRI premieres new 3D AOI Solution at Productronica 2013
- 15 November 2013 - JOT Automation to show new Inline Routing Solution at Productronica
- 14 November 2013 - SPEA presents new Flying Probe and Bed-of-Nails Testers
- 20 November 2013 - Solder Paste Inspection with optimized 3D Calculation
- 03 December 2013 - Tektronix enhances Spectrum Analyzer Performance of Mixed Domain Oscilloscopes
Latest Test and Measurement News
Signal and Spectrum Analyzers to support IEEE 802.11p Vehicle-to-Vehicle Communications
12 December 2013 — Rohde & Schwarz has expanded the functionality of its R&S FSV and R&S FSW signal and spectrum analyzers to also support the IEEE 802.11p wireless standard. The new R&S FSV-K91p and R&S FSW-K91p measurement options are especially designed for IEEE 802.11p compliant signal analysis in vehicle-to-vehicle (V2V) applications and intelligent transport systems (ITS).
High-Performance Test Handler for SoC Devices
12 December 2013 - Advantest launched its newest test handler for system-on-chip (SoC) devices, the field-upgradable M4871 pick-and-place system. The handler integrates Advantest’s proven technology from the company’s existing product lines with advanced, new functions including visual alignment with high throughput, active thermal control using Advantest’s Tri-Temp capability and a new handler data visualization framework that enables users to conduct real-time monitoring of a test cell’s production status from any network-enabled connection.
Parallel Test and Programming in Gang Applications
11 December 2013 - GOEPEL electronic has extended its SCANFLEX Boundary Scan hardware product range, now introducing the SFX Gang Test Module Kit as a new solution for parallel test and programming of up to 32 different assemblies with an integrated Mass Interconnect Interface from Virginia Panel. The kit, consisting of three basic modules, is an easy-to-integrate complete solution for parallel applications based on Embedded System Access (ESA) technologies providing throughput increase by factors of 16 or 32.
Anritsu enhances BERT Signal Quality Analyser
11 December 2013 – Anritsu introduced a high-sensitivity error detector and other additions to its MP1800A BERT (Bit Error Rate Tester) signal quality analyser to support multi-channel BER measurements up to 32.1Gbit/s. The enhanced MP1800A is suitable for testing the backplanes, cables, and interconnects used in the next generation of ultra-high speed network equipment.
Background: Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyser?
10 December 2013 - Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue.
More Articles...
- Teledyne LeCroy adds Mixed Signal Capabilities to HDO Oscilloscopes
- Yokogawa launches two new Source Measure Units
- Agilent enhances Wideband Digital Receiver/Digitizer
- Aeroflex launches complete WCDMA Handset Simulator
- Tool to Simplify Installation and Maintenance of Optical Fiber Networks
- New Wiring Validation Software makes testing faster, easier
- Interruption-free Power Supply for mobile DAQ Systems
- Tektronix enhances Spectrum Analyzer Performance of Mixed Domain Oscilloscopes
- Corelis adds advanced Triggering to I2C Bus Analyzers
- Innovative Wafer Inspection combining 2D and 3D Measurements
- iSYSTEM introduces Wireless Debugger
- Switch Matrix for Vector Network Analysis with up to 48 Ports
- N4L appointed distributor for Bulgaria, Greece, Romania and Serbia
- Advantest launches Photo Mask Measurement Tool
- USB Plug and Play comes to the NI LabVIEW RIO Architecture
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