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18 May 2012 - Keithley Instruments will webcast a free, online technical seminar titled “Fundamentals of High Power Semiconductor Device Testing” on Thursday, May 24 at 15:00 CEST. Keithley staff applications engineer Jennifer Cheney will present a broad overview of power devices and consider the key parameters of diodes, MOSFETs, and BJTs that determine end product efficiency and explain solutions for testing the key power device parameters.

15 May 2012 – CETECOM announced it has entered into an agreement with Qualcomm Incorporated to become an authorized test lab (ATL), offering testing services and technology support to help device manufacturers using Qualcomm technology speed their time to market. CETECOM’s lab will provide functionality and performance testing for devices supporting LTE, 3G, and HSPA+ technologies.

14 May 2012 – Teseq Inc., a developer and provider of instrumentation and systems for EMC emission and immunity testing, announced it has hired Michael Yantz as its new Vice President of Business Development. Yantz, who is a veteran in the EMC testing industry, will focus on cultivating new North American and international sales channels and opportunities for Teseq while expanding the company’s reach into new markets.

Latest Test and Measurement News

Friday, 18 May 2012 13:24

Testing Audio/Video Interfaces on Consumer Electronics Equipment

18 May 2012 - Today's set-top boxes, tablet PCs and smartphones are equipped with digital video interfaces such as the high-definition multimedia interface (HDMI) and the mobile high-definition link (MHL). The new R&S VTC video test center from Rohde & Schwarz can be used to test the functionality of these interfaces and their compliance with the relevant standards. The R&S VTC provides combined realtime protocol testing and audio/ video analysis including difference picture analysis, offering user equipment manufacturers the most flexible test platform on the market.

High-Speed Memory Test System with 8 Gbps Test Speed

17 May 2012 - Advantest Corporation announced its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8 Gbps. The T5511 has a clock training functionality built into its hardware, essential for new DDR4-SDRAM and GDDR5-SDRAM device test.

RF Analyzer to measure Time Domains and Channel Power

16 May 2012 – Agilent Technologies enhanced its FieldFox RF analyzers with options for time-domain analysis and channel-power measurements. These options give engineers the features they need to more easily and quickly test their RF communications infrastructure. With FieldFox’s time-domain analysis (Option 010) engineers can determine the individual frequency response of one of a series of reflections. Using the powerful gating function, they can remove unwanted responses such as connector mismatch or cable discontinuities.