|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Microlease appoints European CEO
30 October 2014 - Microlease announced the appointment of Peter Collingwood to the new position of Chief Executive Officer, EMEA, and Bina Khatwani as Finance Director, EMEA. Following these appointments, Nigel Brown, CEO and Paul Smith, Finance Director, take global roles.
New Tip Style for Test Probes improves Performance and Reliability
30 October 2014 - Everett Charles Technologies (ECT) launches the new I40 tip style. The innovative geometry of the I40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper. Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear.
Generate phase-coherent Signals up to 20 GHz on four RF Outputs
29 October 2014 - Rohde & Schwarz presented an extremely compact solution with up to four RF outputs for generating phase-coherent signals up to 20 GHz. This test solution is ideal for aerospace and defense applications, for example to test multichannel antenna systems such as phased array antennas. The basis of the system is the R&S SMW200A. Equipped with the R&S SMW-B90 phase coherence option, it can phase lock modulated or unmodulated signals.
Signal Analyzer with 510 MHz Bandwidth and lowest Phase Noise
29 October 2014 – Keysight Technologies announced the new flagship of its X-Series: the N9040B UXA signal analyzer. The UXA delivers industry-leading phase noise performance as well as 510-MHz analysis and real-time bandwidths. Combining these three capabilities with a large display and touch-driven interface, the UXA provides wider, deeper views of elusive wideband signals—known or unknown.
SiliconAid Solutions partners with Ridgetop Group on IEEE P1687 and IEEE 1149.1-2013 Standards
28 October 2014 - SiliconAid Solutions and Ridgetop Group announced they have continued and expanded their partnership to enable support for the evolving industrial testability standards. Together they have developed a system to embed Ridgetop Group’s SJ BIST board-level interconnection reliability monitor leveraging IEEE P1687 and IEEE 1149.1-2013 for intellectual property (IP). SJ BIST is a patented test IP product that detects interconnect faults between electronic devices, such as between integrated circuits (ICs) (including field programmable gate arrays [FPGAs] and systems-on-chip [SOCs]) and printed circuit boards (PCBs).
Tester for Display Driver Semiconductors used in High-Resolution LCD Panels
28 October 2014 – Advantest has launched its new T6391 system for testing next-generation display driver ICs (DDIs) and their embedded functions that control high-resolution LCD panels. The new tester is designed to address three key trends in the next-generation DDI market – the growing number of pins on display driver devices, the increasing speeds of interfaces and highly integrated multi-functions – all of which contribute to higher resolution displays.
CAN Bus Analysis and Simulation
27 October 2014 – IPETRONIK provides the new IPEmotion 2014 R2 release of its data acquisition software for download. The latest version has been extended with numerous enhancements and optimizations. Major extensions apply to CAN traffic analysis and CAN traffic simulation. Further, it is now possible to edit data records and new export parameters such as parameters for V-TAB scaling are now available. The entire menu navigation for the IPEmotion App export has been enhanced in the new R2 version.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel PXI AOI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection spectrum analyzer Keithley EMC signal Generator signal analyzer Power supply LeCroy AXI Yokogawa Multitest Handheld calibration TESEQ Semiconductor Test Switching network analyzer SPI Viscom wireless USB characterization Pico Technology ASSET InterTech
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