|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
High-Bandwidth Optical Modulation Analyzer System
09 October 2015 - Teledyne LeCroy introduces the IQS series of Coherent Optical Receivers, featuring the industry’s highest bandwidth. These products extend Teledyne LeCroy’s Optical Modulation Analysis (OMA) portfolio, enabling the creation of flexible, modular systems with unparalleled performance and ease of use. When combined with Teledyne LeCroy’s LabMaster 10Zi-A oscilloscopes and integrated Optical-LinQ analysis software, the IQS receivers test DP-QPSK and DP-16QAM optical signals at speeds up to 130 GBaud.
APIX2 Physical Layer Testing for High-Resolution In-Car Video Applications
08 October 2015 – Keysight Technologies announced that its new APIX2 compliance application offers the capability to characterize and test APIX2 (Automotive Pixel Link) high-speed SerDes (serialiser/deserialiser) technology using the Keysight Infiniium Series oscilloscopes. Developed by Inova Semiconductors, APIX2 is a multi-channel technology for high-resolution in-car video applications. APIX2 can establish multiple display links with a bandwidth of up to 3Gbps, over two pairs of copper cables or a single QSTP cable, and supports HD video at 24 bit color depth.
Data Mining Tool streamlines Validation of Serdes High-Speed I/O Buses
08 October 2015 – With HSIO Validation Assistant (HVA) ASSET InterTech introduced a new data mining tool for its ScanWorks platform. It automatically analyzes a database of signal integrity test data and quantifies the risk associated with potential design flaws or poorly performing devices on a system’s high-speed input/output (HSIO) buses.
Remote Spectrum Monitor Platform for Spectrum Surveillance
07 October 2015 – Anritsu introduced the Remote Spectrum Monitor, a platform of modular and scalable products that helps operators generate a greater return on their multi-billion dollar spectrum investments and maximizes network capacity to meet consumer demand. Designed without a display or keyboard, Remote Spectrum Monitor automates the method of conducting radio surveillance, interference detection, and government spectrum policy enforcement while bringing greater flexibilities and cost efficiencies to network management.
Faster 3D X-Ray Inspection
06. October 2015 - The inline AXI system from GOEPEL electronics now offers an even faster high-end 3D inspection of complex assemblies. The “X40 PLUS” upgrade enables an X-ray inspection speed increase of up to 18 percent. Optimization the imaging chain in combination with an improved axle system and faster execution of the test algorithms results in significant savings of cycle time depending on the maximum resolution and the board dimensions.
300 kHz LCR Meter with Sweep and Bin Sorting Functions
05 October 2015 - B&K Precision introduced their new model 891 300 kHz bench LCR meter. This new compact, value-priced LCR meter can measure inductance, capacitance, and resistance with 0.05% best impedance accuracy over a fully adjustable test frequency range of 20 Hz to 300 kHz. With a 300-point linear and logarithmic sweep function, bin comparator, and versatile remote control interfaces, the 891 is suitable for characterizing components in laboratory, quality control and small volume production environments.
Measuring Module with TEDS Support
05 October 2015 – IPETRONIK supports the use of TEDS sensors (Transducer Electronic Data Sheet) with the new Lemo-2B-version of the multifunctional module Sx-STG. This under IEEE-1451.4 defined plug & measure standard contains among others information about the identification number of the sensor, the calibration and the supplier. It enables the flexible, faultless adjustment of the module on new sensor parameters. The Sx-STG detects e.g. IEEE-1451.4 Class 2 sensors (multi-wire connections, e.g. as bridge sensors) automatically when putting on and reads the sensor-specific data via the TEDS connection.
10 to 13 November 2015
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Keysight Advantest EMC Aeroflex Keithley spectrum analyzer Inspection signal Generator Power supply signal analyzer Yokogawa Multitest AXI Teledyne LeCroy LeCroy Handheld calibration Switching USB TESEQ characterization network analyzer Semiconductor Test wireless Semiconductor probe
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