Readers Top 5 News of last 30 days
Latest Test and Measurement News
First PCI Express 6.0 Interposer for OCP NIC 3.0 Devices
31 May 2023 - Teledyne LeCroy announced availability of a PCI Express 6.0 Enterprise and Data Center Standard Form Factor (EDSFF) Open Compute Project (OCP) interposer module and Network Interface Card (NIC) 3.0 adapter kit, to be used with Teledyne LeCroy's PCIe protocol analyzers. It allows to test Open Compute Project NIC 3.0 devices with PCIe, NVMe, or CXL at speeds up to 64GT/s.
Read more ...
Signal Generators and Analyzers approved for 5G RAN Platforms
30 May 2023 - The R&S SMW200A and R&S SMM100A vector signal generators and the R&S FSW and R&S FPS signal and spectrum analyzers from Rohde & Schwarz have been approved by Qualcomm for testing the Qualcomm QRU100 5G RAN Platform – an O-RAN compliant solution with architecture flexibility designed to facilitate scalable and cost-effective 5G network deployments. OEMs providing RUs for Open RAN infrastructure adopting the Qualcomm QRU100 5G RAN Platform can be confident that these Rohde & Schwarz solutions meet the necessary sub-6 GHz test requirements for design verification and production.
Read more ...
Software-Defined Battery Lab Solution
26 May 2026 - NI, formerly known as National Instruments, launched a Software-Defined Battery Lab solution. Designed for electric vehicle battery validation labs, the new offering covers the entire, sustainable battery lifecycle from research and development to validation, production, second-life, and remanufacturing. The Software-Defined Battery Lab solution supports EV manufacturers and battery suppliers in tackling the pressing challenges of time-to-market, cost, and battery performance. NI’s offering prioritizes an open, software-connected approach to enable flexible, automated, and intelligent test strategies from an individual battery validation workbench to global lab deployment.
Read more ...
Software Testing and Debugging made easy
25 May 2023 – A convenient and fast access to the trace systems of various high-end microcontrollers and embedded processors is provided by the novel UDE SimplyTrace functions that PLS Programmierbare Logik & Systeme is now offering to the users of its Universal Debug Engine UDE 2023. Tracing is an essential debug method for investigating errors, timing problems or identifying bottlenecks in embedded applications, especially when the runtime behavior of the application under investigation must not be influenced during debugging. However, for efficient use of trace, the trace system of the microcontroller used must first be configured accordingly. This is usually not a trivial matter. The whole process can be very time-consuming and often requires in-depth knowledge of the SoC’s trace system.
Read more ...
Compact Opto-isolated Probes for Signals up to ±2500V
24 May 2023 - Saelig Company introduced the Micsig SigoFIT Series Opto-isolated Probes which have excellent amplitude/frequency characteristics and deliver an excellent common mode rejection ratio (CMRR up to 112dB at 100MHz, over 100dB at 500MHz.) The full-range noise floor is 1.1mVrms max, and the 24-hour zero drift is less than 50uV. These SigOFIT probes feature Micsig's exclusive SigOFIT optical isolation technology, remotely powered by laser light or battery, offering extremely high isolation voltage to help engineers to see true, uncorrupted signals within their specified bandwidths.
Read more ...
Handheld Field Tester for Mobile Radios and Networks
23 May 2023 – Viavi Solutions introduced the CX100 ComXpert Communications Service Monitor. This portable test set is a reliable, efficient solution for military radio maintainers and technicians as well as land mobile radio (LMR) technicians who need to perform testing of infrastructure, cables, antennas, and tactical, handheld, or vehicle-mounted radios in the field.
Read more ...
CT Scanner X-Ray System for Industrial Inspection
22 May 2023 - Waygate Technologies introduced a new flagship computed tomography (CT) solution called Phoenix V|tome|x M Omni today. Designed to replace the company’s most popular CT system, it builds on the success and proven technology of the Phoenix V|tome|x M, adding many features that further increase flexibility, speed, and detection quality. The highly versatile premium CT solution is suitable for a wide range of 3D metrology, research, and evaluation applications in the laboratory environment, as well as automated precision inspection in production. The Phoenix V|tome|x M Omni will serve many key industries, including battery inspection in the e-mobility and electronics sectors, and manifold applications in the aerospace industry, among others. The system will be available towards the end of this year.
Read more ...
|
More events... See our Trade Show Calendar Click here
|