|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Handheld Thermal Imagers for Predictive Maintenance Applications
31 July 2015 – Keysight Technologies announced the addition of two higher temperature models to its thermal imagers’ portfolio. The U5856A and U5857A can perform temperature measurements up to 650 degrees C and 1200 degrees C respectively. This allows users to detect a wide temperature range for various applications such as petrochemical and steel processing, electrical and mechanical applications, building maintenance and even electronics applications.
Automated and intuitive ECU Testing
30 July 2015 - AutomationDesk, the test automation software from dSPACE, brings numerous innovations with the release of its latest version, AutomationDesk 5.0. The new version significantly modernizes how ECU testing is performed. Its new signal-based test description makes it possible to quickly create and execute clear, intuitive tests. New features of AutomationDesk 5.0 enable efficient testing of complex camera-based advanced driver assistance systems (ADAS).
eBook explains extrem fast In-system Flash Programming via IJTAG
29 July 2015 – New faster methods for the in-system programming of onboard flash as well as I2C and SPI memory are explained in a new eBook published by ASSET InterTech. Advanced programming methods based on the IEEE 1687 Internal JTAG (IJTAG) standard and embedded programming engines in an onboard FPGA can accelerate programming speeds by a factor of 1,000, shortening the process from tens of minutes to a second or less.
Boundary Scan Test for non scanable Partitions
28 July 2015 - GOEPEL electronics presents with CION-LX Module/FXT48A a new Boundary Scan module. It offers a wide function range and dynamics for test of analog, digital and mixed signals. The module is an easy, safe and low cost solution to extend the Boundary Scan technology to non scanable partitions. The CION-LX Module/FXT48A has 48 single-ended and 6 differential channels covering a voltage range between 0,9V and 3,6V.
Safety-Rated High Voltage Differential Oscilloscope Probes for 2kV and 8kV
27 July 2015 – Teledyne LeCroy introduced two new additions to the HVD3000 series of high voltage differential probes — the 2 kV safety-rated HVD3206 and the 8.4 kV safety-rated HVD3605. Like the existing 1 kV safety-rated HVD310x probes, these new probes provide excellent performance by offering the best gain accuracy, widest differential voltage range, high offset range and exceptional common-mode rejection ratio (CMRR).
Wireless Test Set supports new WLAN 802.11ah and 802.11af
24 July 2015 – Keysight Technologies announced new WLAN 802.11ah and 802.11af capabilities for the EXM wireless test set. The EXM now supports more Internet-of-Things (IoT) wireless devices and formats in the design validation and manufacturing stages of product development. In addition, the technologies expand the test set’s existing broad multi-format coverage of wireless connectivity, cellular formats and development.
CETECOM increased EMC Test Capacities for Large Objects
23 July 2015 – CETECOM has upgraded its electromagnetic compatibility (EMC) test capacities to accommodate the growing customer demand for handling large objects. At CETECOM’s Saarbruecken facility, the expanded test chamber now allow large electrical cabinets, medical instruments and other large-volume objects to be accurately and efficiently evaluated. The integrated rotating platform with a high-capacity 63 A electrical motor accommodates heavy test objects with a mass up to 6 tons. Devices up to 4 meters wide can now be tested in this spacious new chamber.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight Aeroflex EMC Inspection spectrum analyzer Keithley signal Generator Power supply signal analyzer Yokogawa Multitest AXI LeCroy Teledyne LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test Semiconductor network analyzer wireless probe
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