|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Transmitter Testing Software for USB 3.1 Type-CTM Designs
27 May 2016 – Keysight Technologies introduced the U7243B USB 3.1 transmitter performance validation and compliance test software, a comprehensive transmitter (TX) test support for the USB 3.1 Type-C specification. The test software allows authorized test centers to test USB 3.1 Gen2 SuperSpeed Plus 10 Gbps devices with Type-C implementations and gives in-house test and performance validation engineers the tools to ensure devices comply with the USB 3.1 Gen2 Type-C specification.
Camera Module for large THT Inspection
26 May 2016 - GOEPEL electronic presented a further evolution of the award-winning AOI system THT-Line providing shorter cycle times. The heart of the system is the newly developed camera module MultiEyeS, which offers large-scale, high-resolution image acquisition at unprecedented speeds without any motion. This allows, as an example, inspection of any number of THT components within an area of 490 mm x 390 mm in less than 7 seconds.
High-Density PXI Matrix Range
26 May 2016 - Pickering Interfaces announced the expansion of their range of 1-pole High-Density PXI Matrix Modules with the new High-Density PXI Matrix Range (40-520 family). These new PXI Matrix Modules are high-density matrices with 22 different configurations and up to 256 crosspoints to suit a large variety of user requirements.
Direct ECU Access via CAN FD
25 May 2016 - dSPACE has extended its comprehensive tool chain with even more possibilities for using the latest CAN FD data bus standard in rapid control prototyping (RCP). By supporting the XCP standard for CAN FD, dSPACE allows for high-performance bypassing of electronic control units (ECUs) and network access with a much higher bandwidth than with the classic CAN bus.
Anritsu adds Tools to VNA Families for Signal Integrity Testing
24 May 2016 – Anritsu Corporation introduced new options for its VectorStar and ShockLine vector network analyzers (VNAs). The VectorStar Eye Diagram and ShockLine Advanced Time Domain (ATD) options are part of the expanding SI capabilities offered by Anritsu and provide SI engineers with improved tools to conduct channel diagnostics and model validation of high-speed digital circuit designs.
E-Band Signal Analysis Reference Solution for Multichannel mmW Test
24 May 2016 - Keysight Technologies, announced an E-band Signal Analysis Reference Solution to provide low-cost millimeter wave analysis capability for applications in the 60-90 GHz range. The reference solution is based around the 10-bit ADC Infiniium S-Series oscilloscope to provide 2.5 GHz of high-fidelity, millimeter wave frequency analysis bandwidth.
Test Solution for 802.11ax High-Efficiency Wireless
23 May 2016 – National Instruments (NI) launched an early access version of the WLAN Measurement Suite with support for the IEEE 802.11ax (draft 0.1) high-efficiency wireless draft standard. The WLAN Measurement Suite, combined with NI’s RF vector signal transceiver (VST), empowers engineers to measure the performance of their 802.11ax designs confidently in the presence of significant new changes to the 802.11 physical layer specification.
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