|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Noise-Figure, Analog-Demodulation Measurement Applications for Signal Analyzer
28 August 2015 – Keysight announced the addition of its proven analog demodulation and noise figure measurement applications as software options to the UXA X-Series signal analyzer. Through the analyzer’s multi-touch user interface, the new software ensures intuitive and efficient operation for engineers creating advanced designs in aerospace, defense and wireless communications.
Very stable Cable Assemblies for VNA Testing
27 August 2015 - Aspen Electronics has signed an agreement to represent the specialist laboratory device company Nanjing Arance Electronics Co.,Ltd (Arance). The company produces a wide range of test and measurement products - of particular interest to test engineers will be the NAC series of cable assemblies. Arance’s NAC series highly flexible test assemblies have a rugged, lightweight construction that enables longer service life, reduced downtime, and lower operating costs over the life of the equipment.
Integrated Fader for LTE-Advanced 4x4 MIMO and 8x2 MIMO Tests
26 August 2015 – Anritsu has integrated channel fading simulation into its 4G LTE-Advanced Signalling Tester, the MD8430A. The new digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles. The MD8430A fading options can be combined with the MD8430A, cutting the need for investment in additional hardware to perform signalling tests under realistic radio frequency (RF) conditions.
Economical Line Impedance Stabilization Network for Pre-compliance Testing
25 August 2015 - Saelig Company announces the availability of the TBLC08 Line Impedance Stabilization Network (LISN) which enables measurements of line-conducted interference within the range of 9kHz to 30MHz, according to the CISPR16 or other standards, before any formal testing commences. The TBLC08 is designed especially for pre-compliance testing of single phase, AC-powered equipment with supply voltages up to maximum 260V.
Software for Multichannel Data Acquisition Systems
24 August 2015 – Keysight Technologies launched a new version of its U1092A AcqirisMAQS Multichannel Acquisition Software. This application, providing unique features for massively multichannel acquisition systems, evolved together with all Keysight’s latest technologies, including the newly introduced M9709A AXIe 8-bit high-speed digitizer.
Pick and Place Handler for testing High Voltage Applications up to 10 kV
21 August 2015 - Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing. The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) and for consumer market applications.
Fast Production Tests for GNSS Solutions
20 August 2015 -- Rohde & Schwarz offers a new, speed-optimized production tester - the R&S SMBV100A vector signal generator equipped with the R&S SMBV-P101 package. The fast GNSS production tester supports the GPS, Glonass, BeiDou and Galileo satellite systems and includes a wealth of additional test functions for characterizing GNSS chipsets and modules. During production testing of modules and receivers for satellite-based communications, the basic GNSS signal reception and the connection between the antenna and GNSS chipset need to be checked.
Oscilloscope Agilent JTAG Goepel Tektronix Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Keysight EMC Aeroflex Inspection spectrum analyzer Keithley signal Generator signal analyzer Power supply Multitest Yokogawa AXI Teledyne LeCroy LeCroy Handheld calibration Switching USB TESEQ characterization Semiconductor Test wireless Semiconductor network analyzer probe
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