|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Debug and Hardware Validation Tools for Intel Broadwell-DE Microarchitecture
24 April 2015 – Engineers designing microserver and other hyperscale workload systems based on the new Intel microarchitecture codenamed Broadwell-DE will be able to quickly debug software and validate high-speed communications interconnects with ASSET InterTech’s SourcePoint and ScanWorks platforms. The first generation of the Intel Xeon Processor D family is based on the microarchitecture previously referred to as Broadwell-DE.
High Sensitivity Current Probes for Oscilloscopes
23 April 2015 – Teledyne LeCroy introduces the CP030A and CP031A high sensitivity current probes. These probes provide sensitivity down to 1 mA/div allowing users to measure current from the mA range up to a continuous current of 30Arms and peak current of 50A all with the same probe. The sensitivity of 1 mA/div combined with 1% DC and low frequency accuracy allows for more precise and accurate low current measurements on Teledyne LeCroy oscilloscopes.
40 GHz Frequency Option for Vector Signal Generator
22 April 2015 - Rohde & Schwarz has released a 40 GHz version of the R&S SGU100A RF upconverter. This version expands the frequency range of the R&S SGS100A vector signal generator from 12.75 GHz to 40 GHz, making it the smallest microwave device of its kind on the market for continuous signals between 80 MHz and 40 GHz. Though compact (two height units and ½ 19" rack width or one height unit and full 19" rack width ), the combination of the R&S SGS100A and the R&S SGU100A offers outstanding performance.
Tunable Laser Source for Spectral Loss Measurements
22 April 2015 – Keysight Technologies introduced the 81606A tunable laser source, a new module for the 8164B lightwave measurement system. With sub-picometer tuning repeatability and best-in-class wavelength accuracy, even in full-speed, two-way sweeps, the new module helps verify the design of demanding devices and reduce test cost per device. The tunable laser speeds up the automated adjustment of wavelength-selective devices and allows test engineers to validate more devices per hour than they can with currently available models.
Testing non-scannable Partitions with Boundary Scan
21 April 2015 - GOEPEL electronics adds a next generation mixed signal I/O module to the JTAG/Boundary Scan hardware platform SCANFLEX. The new SFX-5296LX offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC. The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and digitizer.
High g Sensor Test Module for Gravity Handler
21 April 2015 - Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two axis testing with one single stimulation on a flexible and modular handler platform. The well-established “Shaker” module, which was originally available for the MT93xx only, is now also available for the flexible and modular MT9928 gravity handler.
Multistandard Test Solution for Bluetooth Prequalification
20 April 2015 - The R&S CMW500 wideband radio communication tester of Rohde & Schwarz supports all 38 RF signaling tests designed by the Bluetooth SIG while providing test capability for other cellular and non-cellular standards as well. Thanks to its particularly fast spectrum measurements, the platform helps users optimize their designs.
Oscilloscope Agilent JTAG Tektronix Goepel Boundary Scan LTE PXI AOI Anritsu National Instruments Automotive Advantest Aeroflex Inspection Keithley EMC spectrum analyzer signal Generator Keysight signal analyzer Power supply AXI LeCroy Multitest Yokogawa Handheld Teledyne LeCroy calibration Switching TESEQ Semiconductor Test USB characterization Semiconductor network analyzer wireless probe
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