|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Using Boundary Scan for fast Flash Programming
23 July 2014 – XJTAG has unveiled an integrated XJFlash feature for up to 50 times faster flash programming. XJFlash allows engineers to automatically generate customised programming solutions that can overcome the speed limitations generally associated with using boundary scan to program flash memories connected to FPGAs.
Hioki launches new Insulation Tester
23 July 2014 - Hioki E.E. Corporation launched the Insulation Tester ST5520. In order to ensure the safety of electronic components such as relays and connectors and of lithium-ion and other batteries used in electric vehicles and smartphones, it is necessary to qualify their insulation characteristics, and testing system manufacturers vie to offer instruments capable of high-volume, high-speed testing.
aps Solutions builds a Repair and Support Centre in Dresden, Germany
22 July 2014 – aps Solutions GmbH (“APS”) announces their decision to open a Repair and Service Centre for ‘state of the art’ high performance Vertical Probe Card technologies.
Easy-to-Use Vision Sensor for Color Applications
22 July 2014 - Cognex Corporation introduced the Checker 4G7C, an easy-to-use color vision sensor that distinguishes parts by color. Checker 4G7C delivers 376 x 240 inspection resolution with Ethernet support for industrial protocols and high-intensity white LED illumination for the detection and inspection of parts and features at up to 800 parts per minute.
RF Conformance Test System for Vehicle-to-Vvehicle Applications
21 July 2014 — The new R&S TS-ITS100 of Rohde & Schwarz is the first fully automated test system for standard-compliant testing of RF components in line with IEEE 802.11p. These components are used for vehicle-to-vehicle communications and intelligent transport systems (ITS). Thanks to its compact size, the RF conformance test system can be used throughout the entire value chain – from R&D to precompliance and compliance testing.
Agilent enhances CXA Signal Analyzer with additional Functionality
21 July 2014 – Agilent announced enhancements to the N9000A CXA X-Series signal analyzer that broaden its use in RF and microwave applications. The CXA platform now supports the Windows 7 operating system, giving it better performance and stability. Additional enhancements include RF CXA phase noise that now provides up to a 10 dB performance improvement, enhancing test result accuracy. Also, there is now an extension to the analyzer’s operating temperature range for guaranteed performance between 0°C to 55°C.
1.6-Gbps Digital Module enabling Protocol-Aware SoC Testing
18 July 2014 – Advantest introduced a new T2000 1.6GDM digital module, designed to improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform. The 1.6-Gbit-per-second module incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing, in which the tester communicates directly with the devices under test (DUTs) in each IC’s protocol language. A powerful EDA-Link, called FTA-Elink, connects the design simulator to the T2000 test platform directly.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI PXI LTE Anritsu National Instruments Advantest Automotive Aeroflex Inspection Keithley EMC spectrum analyzer signal Generator LeCroy signal analyzer Power supply AXI Yokogawa Handheld Multitest TESEQ Switching calibration SPI Semiconductor Test wireless Viscom USB characterization Pico Technology Corelis ASSET InterTech
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