|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
Patterning Control Solution for Sub-20nm Design Nodes
02 September 2014 - KLA-Tencor Corporation introduced the WaferSight PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system and the K-T Analyzer 9.0 advanced data analysis system. These three new products support KLA-Tencor's unique 5D patterning control solution, which addresses five elements of patterning process control—the three geometrical dimensions of device structures, time-to-results and overall equipment efficiency.
3D Laser Displacement Sensors
02 September 2014 - Cognex Corporation announced an expanded portfolio of 3D laser displacement sensors, an industrial vision controller, and powerful new 3D vision tools. The DS1050, DS1101, and DS1300 sensors address an unprecedented variety of 3D applications demanding high resolution and expanded measurement range. The DS1000 series now comes bundled with the new Cognex VC5 vision controller, delivering a complete solution to meet the most challenging 3D requirements.
Real Time Control of Power Supplies for Hardware-In-the-Loop Tasks
01 September 2014 – AMETEK Programmable Power has released the External Drive (-EXTD) option for its California Instruments RS Series of high-power regenerative programmable AC sources. The External Drive option gives users a simple, low-cost way to directly control the output of an RS Series power source in real time, enabling them to be more easily used in hardware-in-the-loop (HIL) test systems.
100 MHz Oscilloscope with 1 GSa/s Sampling Rate and 40 Kpts Waveform Memory
01 September 2014 -- B&K Precision introduces the new 2190D bench digital storage oscilloscope (DSO). This compact dual-channel DSO offers several measurement functions with 100 MHz bandwidth and 1 GSa/s sampling rate. Building on the success of the discontinued analog model 2190B oscilloscope, the 2190D now provides users with digital features including a 7” widescreen color display, waveform memory up to 40,000 points, pass/fail limit testing, digital filtering, waveform recorder, and 32 automatic measurements.
25MHz USB Arbitrary Function Generator
29 August 2014 - GW Instek launches the brand new AFG-100/200 series 25MHz USB modular arbitrary function generator with four models. The AFG-100/200 series arbitrary function generator with many unique features such as light weight, handy, and USB interface compatible is an ideal choice for the applications at the general laboratories in applying stand-alone operation or collocation with the GDS-2000A series digital oscilloscope.
Software Test Suite for improving Power Amplifier Efficiency
29 August 2014 – Keysight Technologies introduced the N7614B Signal Studio for Power Amplifier (PA) Test; an all-in-one, general-purpose test suite designed to help engineers improve PA efficiency through support for crest factor reduction (CFR), envelope tracking (ET) and digital pre-distortion (DPD) technologies.
Strip Test for Automotive Applications
28 August 2014 - In the past strip test was considered not to be appropriate for applications with high quality requirements – such as automotive or medical – because singulation of the packages would have to take place after testing. Multitest’s InCarrier concept overcomes these issues and combines the substantial advantages of the strip handling process with the quality driven advantages of the standard test handling process.
Agilent Oscilloscope JTAG Tektronix Boundary Scan Goepel AOI LTE PXI Anritsu National Instruments Advantest Automotive Inspection Aeroflex spectrum analyzer Keithley EMC signal Generator LeCroy Power supply signal analyzer AXI Yokogawa Multitest Handheld TESEQ calibration Switching SPI Semiconductor Test wireless USB Viscom characterization probe Pico Technology Corelis
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