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Readers Top 5 News of last 30 days
- 26 April 2018 - Wireless Test Set supports latest 5G Sub-6 GHz Tests defined by 3GPP
- 24 April 2018 - Entry-level Spectrum Analyzer combines 3 RF Test Instruments
- 02 May 2018 - End-to-End 5G NR-Ready Channel Emulation Solutions
- 24 April 2018 - Lock-in in Amplifier based Amplitude and Frequency Modulation and Demodulation
- 29 April 2018 - 6 ½-digit DMM and Data Acquisition and Logging Multimeter System
Latest Test and Measurement News
Testing Service for CMOS Image Sensor Wafers
30 March 2018 - Testing CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically for an array of large sensors or even sensors that are right up to the size of an entire 12-inch wafer.
WLAN Signaling Tester for IEEE 802.11ax
29 March 2018 - The R&S CMW270 wireless connectivity tester of Rohde & Schwarz is the first tester to emulate all IEEE 802.11a/b/g/n/ac standards, including 802.11ax. In signaling mode, users can test the RF properties of WLAN stations under real-world conditions.
Optical Spectrum Analyzer for use in Production
28 March 2018 - Yokogawa Test & Measurement Corporation released the AQ6360, an optical spectrum analyzer for production line applications that employs the dispersive spectroscopy technique and covers optical communication wavelengths in the 1200–1650 nm range. With its compact, lightweight design and optimal performance specifications, the AQ6360 is an ideal instrument for production line testing and inspection of the semiconductor lasers used in optical transceivers, optical amplifiers, and other types of optical communications devices.
High Speed Probe Card with Data Rates up to 6 Gbps
27 March 2018 - aps Solutions GmbH, an authorized distributor of Sedicon Technology from Korea, introduced a new solution for High Frequency Cantilever Probe Cards up to 10 GHz @-3dB or 6 Gbps. High quality Cantilever Probe Cards are offering many advantages for customers. Especially on cost of ownership, robustness, repair ability and delivery time Cantilever Probe Cards are unbeaten. Up to now, the frequency range of High Speed Probing was limited to test frequencies < 1 GHz.
Shorten Validation Cycles for 400G PAM4 Designs
26 March 2018 – Tektronix introduced the industry’s first 56 GBd 400G PAM4 optical probe for use with Tektronix DPO70000SX Series real-time oscilloscopes. Joining the award-winning 33 GHz DPO7OE1 introduced last year, the new 59 GHz DPO7OE2 single mode optical probe delivers the performance and advanced debug capabilities designers need to troubleshoot 400G PAM4 components and reduce time to market.
Automotive Radar Test Solution
23 March 2018 – Keysight Technologies announced the Keysight E8740A Automotive Radar Signal Analysis and Generation Solution. This solution enables radar-based, advanced driver assistance systems to proactively detect and mitigate risks of collisions. The solution performs analysis and generation of automotive radar signals across full frequency ranges for 24 GHz, 77 GHz and 79 GHz radar, and provides scalable analysis bandwidth from 2.5 GHz to > 5 GHz.
Test of 6DOF Gyro Sensors in Singulated Packages
22 March 2018 - Multitest launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits resulting in even lower cost of test, enhanced test accuracy and higher daily output. The new generation 6DOF module has been optimized for operational cost, uptime and stimulus clearness and accuracy.
More Articles ...
- Full Automatic Testing for IEEE802.11ax Devices
- Oscilloscope Probes for Power Electronics Measurements
- Stress Module for Automotive Ethernet Applications
- Test System for e-mobility high Voltage Components
- Multi-device Synchronization for Lock-in Amplifiers and Arbitrary Wave Generators
- Compact low-cost eight-in-one Oscilloscope
- Software Platform that integrates Simulation, Design, Test Workflows
- LabVIEW NXG with new Functionality
- All-in-One Solution for EMI/EMC Compliance Testing
- Contactors for Testing Wafer Level Chip Scale Packages
- Optical Sensor Head for Power Testing in free Space
- Signaling Test Solution for Bluetooth LE
- Increased Test Coverage for SPEA Flying Prober System
- Anritsu partners with Trescal in The Netherlands
- Compact 6 GHz USB RF Vector Spectrum Analyzer
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