Latest Test and Measurement News

USB Based Time Domain Reflectometer

AA FRA 09 April 2019 - Analog Arts launched the fully automated high resolution TDR XT995. With a resolution of 0.5 mm, and a sampling rate of 100 GHz, XT995 is a unique TDR cable analyzer which includes a powerful integrated FRA. It is designed for various cables with lengths of 50 cm to more than 10 m with higher length (up to 3000 km) optional. This model enables the user to automatically test various types of cables for kink, cramp, impedance discontinuity, short and open.

Portable Delay Simulator supporting 1G or 10G

ECD PDS 10G 08 April 2019 - East Coast Datacom (ECD), Inc., a manufacturer of network emulators announces the PDS-1/10G Portable Delay Simulator. The PDS-1/10G product allows network impairments at link rates up to 10GbE. The PDS-1/10G can emulate real network conditions to easily identify issues impacting application performance.

aps Solutions signs Distribution and Service Agreement with Everbeing International

05 April 2019 - aps Solutions GmbH (“APS”) announces a distributor and service agreement with Everbeing International Corp. („EBI“), a Taiwanese Analytical Probe Station manufacturer, focused on high precision and affordable probing solutions. The exclusive sales and service territories are D-A-CH (Germany, Austria and Switzerland) and the countries of Scandinavia.

Multichannel BERT for testing 400GbE Transceivers

Anritsu MP1900 04 April 2019 – Anritsu Corporation enhances its Signal Quality Analyzer-R MP1900A BERT with the introduction of four PAM4 BERT options adding multichannel synchronization, multilane FEC pattern generation for 400GbE, Inter Symbol Interference (ISI) stressed signal generation to simulate transmission path losses, and application software for capturing device under test (DUT) error counts.

X-ray Inspection Systems for the Semicon Industry

YXLON FF70CL 03 April 2019 - YXLON International, a division of the Swiss Comet Group, launched a range of X-ray inspection systems dedicated to the Semicon industry. These systems offer advanced automated 2D and 3D inspection of bumps and filled vias to locate, identify and measure failures, including non-wetted bumps, voiding and misalignments to the highest standard. In terms of resolution these systems are among the best on the worldwide market.

Six new AWG Cards with up to 700 MByte/s Streaming Speed

Spectrum AWG 65 02 April 2019 - Spectrum Instrumentation has released six new Arbitrary Waveform Generators (AWGs) that are optimized for signal quality, size and cost. The new "65" series AWGs offer the latest 16-bit Digital-Analog-Converters, a fast PCIe x4 interface with up to 700 MByte/s streaming speed and a card length of only 168 mm to fit into nearly every PC.

Recording and Analysis of Power Supply Issues

HIOKI PQ3198 01 April 2019 - HIOKI launched the Power Quality Analyzer PQ3198, a new instrument that revamps the functionality and specifications of its predecessor, the Power Quality Analyzer PW3198. The product makes it even easier to record and analyze power supply issues, including by eliminating the need for a dedicated sensor power supply and by enabling power and efficiency measurement of two circuits.

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Latest Test and Measurement News

USB Based Time Domain Reflectometer

Portable Delay Simulator supporting 1G or 10G

aps Solutions signs Distribution and Service Agreement with Everbeing International

Multichannel BERT for testing 400GbE Transceivers

X-ray Inspection Systems for the Semicon Industry

Six new AWG Cards with up to 700 MByte/s Streaming Speed

Recording and Analysis of Power Supply Issues

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