Latest Test and Measurement News

JTAG/Boundary Scan Controller for Industrial Production Use

Goepel SCANFLEX BLADE 05 December 2018 - The SCANFLEX II BLADE 4 RMxX of Goepel electronic is a new series of products of the JTAG/Boundary Scan controller platform SCANFLEX II. The controllers provide access to instruments already embedded in the DUT circuit to test and program complex boards with problematic physical access. SCANFLEX II BLADE 4 RMxX constitutes a uniform control platform with up to 12 independent, truly parallel Test Access Ports (TAP). The controllers are directly designed as 19" 1U plug-in units and are therefore particularly suitable for industrial production applications.

Test of High-Voltage Semiconductors

Advantest EVA HVI 04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.

Test Solution for Radiation Measurements on 5G Devices

03 December 2018 - Rohde & Schwarz demonstrated an innovative test system for conducting radiation measurements on 5G millimeterwave devices in the range from 20 GHz to 87 GHz using a compact antenna test range (CATR). The new solution will offer 5G RF engineers a great advantage, significantly accelerating time-to-market for 5G millimeterwave cellular devices.

Test Handler offers PCB Exchange within less than four Seconds

IPTE ETH 30 November 2018 - IPTE, a supplier of automated production equipment for the electronics and mechanics industry, has made its proofed and trusted Easy-Test-Handler ETH 25 per cent faster due to a new and more efficient spindle drive. Thanks to this new drive the cycle time is clearly faster.

Isolated High Voltage 4-Ch 200MHz Oscilloscope

Cleverscope CS448a 29 November 2018 - The Cleverscope CS448 is a isolated four-channel 200MHz 14-bit oscilloscope designed to measure high voltage, fast slew-rate signals such as those in a full or three-phase power electronic switching bridge. With new 300MHz 200x probes it can now handle 1600V signals to cope with the latest SiC MOSFETs.

Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY

TLC Envision X84 28 November 2018 – Teledyne LeCroy introduced the new Envision X84 protocol analyzer, a flexible and robust analyzer designed to ease troubleshooting and support the development of complex imaging and detection systems for mobile displays and cameras. Envision X84 is the industry’s first analyzer that supports both MIPI C-PHY/D-PHY and MIPI Camera Serial Interface (CSI-2)/MIPI Display Serial Interface (DSI-2) in a single platform.

Pattern Conversion Software for Cloud-Based Semiconductor Testing

27 November 2018 – Test Systems Strategies, Inc. (TSSI), a supplier of design-to-test pattern conversion, simulation and validation tools, and Advantest CloudTesting ServiceTM (CTS), developer of the semiconductor industry’s first on-demand testing service, announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.

Main Menu

Newsletter

News Area

Info Area

Weblinks

Product Focus

Readers Top 5 News of last 30 days

Latest Test and Measurement News

JTAG/Boundary Scan Controller for Industrial Production Use

Test of High-Voltage Semiconductors

Test Solution for Radiation Measurements on 5G Devices

Test Handler offers PCB Exchange within less than four Seconds

Isolated High Voltage 4-Ch 200MHz Oscilloscope

Protocol Analyzer supports MIPI CSI-2 and MIPI DSI-2 over C-PHY or D-PHY

Pattern Conversion Software for Cloud-Based Semiconductor Testing

More Articles ...

Related Articles:

Upcoming Events

Tag Cloud

RSS Feed

Social Media