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Readers Top 5 News of last 30 days
- 30 May 2017 - Unified Control of Inspection Systems
- 12 June 2017 - Flying Test Systems increases Test Coverage with XJTAG
- 30 May 2017 - Tektronix enhances its isolated Probe System
- 05 June 2017 - Enhanced Power Analyzer for 6-Phase Machines
- 07 June 2017 - NI unveils the next Generation of LabVIEW
Latest Test and Measurement News
AXI System optimized for shorter Cycle Times and faster PCB Handling
19 June 2017 - GOEPEL electronic presents the latest version of the X Line · 3D, the inline X-ray system for high-performance 3D inspection in large-scale production. Improvements in hardware and new software functions ensure even higher test speeds and thus shorter cycle times. The X Line · 3D Series 300 offers improved PCB transfer, significantly reducing PCB assembly handling time. In addition, systems of the speed variant X40PLUS now capable of scanning speed of up to 510 mm/s during image acquisition.
IoT Carrier Acceptance Test System facilitates IoT Integration
16 June 2017 - The Internet of Things (IoT) is taking shape. Manufacturers who want to integrate wireless modules into their products now face completely new test requirements. US's largest wireless network operator is the first network operator to publish specific test plans for IoT integrators. In response, Rohde & Schwarz announces the availability of its new R&S TS-290 IoT carrier acceptance test system, which is based on these test plans. The only test solution of its kind, it offers RF, protocol and performance test cases in a single box.
Advantest ships 5,000th V93000 Mixed-Signal Test System
15 June 2017 - Advantest has shipped its 5,000th V93000 test system to Integrated Device Technology, Inc. (IDT), a supplier of system-level semiconductor solutions. The recently installed system is equipped with the new DC Scale AVI64 universal analog pin card, Pin Scale 1600 digital cards and DC Scale DPS128 cards to meet IDT’s needs in new product markets.
Mid-Range Oscilloscopes with 4, 6, or 8 FlexChannels and Touch Display
14 June 2017 – Tektronix introduced the new 5 Series MSO mixed signal oscilloscope. To better meet modern electronics design challenges, the 5 Series MSO redefines the midrange oscilloscope with a host of innovations including the industry’s first FlexChannel technology that allows 4, 6 or 8 analog channels and up to 64 digital channels, integrated protocol analysis and signal generator, a new 12-bit signal acquisition system, and a high-definition capacitive touch display.
Flying Test Systems increases Test Coverage with XJTAG
13 June 2017 – XJTAG, a supplier of boundary scan technology and Flying Test Systems, a provider of electronic test solutions in the UK and Ireland, announced the signing of a joint Technology Partner Agreement. Flying Test Systems offers electronic circuit board test and repair services, Design for Test (DFT) consultancy services along with in-circuit, SPEA flying probe and functional test equipment for production.
Programmable DC Electronic Load for up to 350W
12 June 2017 - RIGOL Technologies announces an expansion of its Power Analysis test portfolio. The new DL3000 Series of DC Electronic Loads gives engineers evaluating power, optimizing power efficiency, and maximizing battery life a new powerful and affordable solution to quickly determine their power needs, debug their designs, and reduce their time to market.
NI unveils the next Generation of LabVIEW
09 June 2017 – National Instruments (NI) announced LabVIEW NXG 1.0, the first release of the next generation of LabVIEW engineering system design software. LabVIEW NXG bridges the gap between configuration-based software and custom programming languages with an innovative new approach to measurement automation that empowers domain experts to focus on what matters most – the problem, not the tool.
More Articles ...
- Characterization of Broadband Millimeter-Wave Designs
- Analog RF and Microwave Signal Generator with highest Phase Noise Performance
- Enhanced Power Analyzer for 6-Phase Machines
- USB-based 6 GHz Vector Network Analyzer
- Unified Control of Inspection Systems
- Tektronix enhances its isolated Probe System
- ATE Core Configurations simplify Standardization and reduce Integration Risk
- Antenna for 3D Measurements
- Anritsu appointed Testime Technology Ltd as a Distributor for the United Kingdom
- Signal and Spectrum Analyzer with 1.2 GHz Analysis Bandwidth
- Cirris UK joins Forces with Adaptronic & ATE Solutions
- Boxcar Function smooths out Noise to give clear Signals
- Test Cases for Validation of GCF RF NB-IoT and CAT-M
- New PXI-based dual-channel AWG and 8-channel Oscilloscope
- Spring Probe for RF Signal Testing on PCBAs
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