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Readers Top 5 News of last 30 days
- 03 April 2018 - Test of LTE Cat-M1 and NB-IoT Devices
- 28 March 2018 - WLAN Signaling Tester for IEEE 802.11ax
- 26 March 2018 - High Speed Probe Card with Data Rates up to 6 Gbps
- 26 March 2018 - Optical Spectrum Analyzer for use in Production
- 30 March 2018 - General Purpose Digitizers with Sampling Rate up to 125 MS/s
Latest Test and Measurement News
Yamaha enters Solder Paste Inspection Market
16 April 2018 - Yamaha Motor Co., Ltd. released the YSi-SP, a high-speed 3D solder paste inspection machine that enables high-speed high-accuracy inspections based on its “1-head solution” concept for using a single type of head to handle various inspections. The YSi-SP is Yamaha Motor’s first solder paste inspection (SPI) machine. It is used to inspect the printing quality (volume, height, area, misalignment) of solder paste after it has been printed onto PCBs.
Test Asset Optimization Services reduces Test Cost
13 April 2018 – Keysight Technologies announced Test Asset Optimization Services, the industry’s first integrated solution that measures in real-time, asset true utilization and health. Keysight’s Test Asset Optimization Services eliminate the need for companies to assign personnel to manually record when instruments are in use and making measurements. Test Asset Optimization Services enables customers to dramatically improve return on investments by optimizing capital and operating expenses to meet test demands in research and development through manufacturing.
High-precision Frequency-selective Power Sensor
12 April 2018 - Rohde & Schwarz launched the power sensor R&S NRQ6 which combines the accuracy of a power meter with the dynamic range of a spectrum analyzer. It is the only power sensor on the market to perform extremely precise and fast measurements down to –130 dBm. The R&S NRQ6 operates in a frequency range from 50 MHz to 6 GHz. It can perform band-limited continuous average power measurements – i.e. measurements on a selected transmission channel – up to a signal bandwidth of 100 MHz.
High Throughput Manufacturing Test of 400G Modules
11 April 2018 - Tektronix introduced two new optical modules for its DSA8300 sampling oscilloscope that offer highest sensitivity and lowest noise, giving manufacturers the confidence they need to increase production capacity and improve yields for 400G designs moving into production. Tektronix also announced enhanced support for the latest 400G PAM4 TDECQ measurements with a software package optimized for 4 channel parallel processing for high throughput manufacturing test.
Stackable USB Digital Storage Oscilloscope
10 April 2018 - Advantech introduced a USB digital storage oscilloscopes which provides 200MHz bandwidth and up to 1GS/s sample rate. It also equips up to 128MS/ch waveform memory for high speed data acquisition. The 2 channel oscilloscope is in two versions available: as USB-DSO1 with 8-bit vertical resolution and as USB-DSO2 with 16-bit resolution.
High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories
09 April 2018 – Advantest introduced its T5503HS2 memory tester, the industry’s most productive test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” in which global demand for memories is skyrocketing.
Test Application Framework with new Tools and Backup Capabilities
06 April 2018 - Alfamation launched the latest version, 4.0, of its Supernova Test Application Framework software, which unleashes the power of NI TestStand. The new version adds new tools and backup capabilities, improved performance and more flexible administration features. Supernova is a configuration-based automated test environment that integrates with NI’s TestStand test management software to simplify access to high-end test capabilities.
More Articles ...
- Affordable Mixed Signal Oscilloscopes with 1 GSa/s Sampling Rate
- Test of LTE Cat-M1 and NB-IoT Devices
- General Purpose Digitizers with Sampling Rate up to 125 MS/s
- Testing Service for CMOS Image Sensor Wafers
- WLAN Signaling Tester for IEEE 802.11ax
- Optical Spectrum Analyzer for use in Production
- High Speed Probe Card with Data Rates up to 6 Gbps
- Shorten Validation Cycles for 400G PAM4 Designs
- Automotive Radar Test Solution
- Test of 6DOF Gyro Sensors in Singulated Packages
- Full Automatic Testing for IEEE802.11ax Devices
- Oscilloscope Probes for Power Electronics Measurements
- Stress Module for Automotive Ethernet Applications
- Test System for e-mobility high Voltage Components
- Multi-device Synchronization for Lock-in Amplifiers and Arbitrary Wave Generators
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