|
||||
| News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsTesting CIS Devices Used in high-resolution Smart Phones
Parallel Parametric Test System offers cost-effective Wafer Test
RF Peak Power Sensors featuring 100 ps Resolution
Marvin Test Solutions announces Release of ATEasy 202122 December 2021 – Marvin Test Solutions announced the release of ATEasy 2021, the latest iteration of its integrated Test Executive and Development Suite. ATEasy 2021 is a full featured software development environment and integrated test executive used to automate the test and evaluation of electronic devices, boards, subassemblies and systems. First released in 1991, and currently deployed in test and measurement applications worldwide, this latest release delivers improved execution performance, updated user interfaces, code beautification and support for 64-bit software components. PCI Express 5.0 EDSFF Interposers for SSD Protocol Testing
Portable Spectrum Analyzers for Signals up to 26.5 GHz
Memory Tester for advanced DRAMs and NAND Flash Devices
More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
RSS Feed
Subscribe to RSS Feed
Social Media
|
||
|
© All about Test 2018 |
||||
How to resolve AdBlock issue? 
11 January 2022 – Advantest started shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). When integrated on the proven T2000 ISS platform, the new T2000 IP Engine 4 (Image Processing Engine 4) system provides the optimal means of evaluating the latest high-resolution, high-speed CIS devices used in advanced smart phone cameras.
10 January 2022 – Keysight Technologies announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing. It features a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource.
23 December 2021 - B&K Precision announced the RFP3000 Series RF Peak Power Sensors. Each sensor utilizes real-time processing and enhanced hardware triggering to capture even the most elusive signals. The sensors, in combination with the included Power Analyzer software measure pulsed, burst, and modulated signals. These signals are found in commercial, and military radar, electronic warfare (EW), wireless communications (e.g., LTE, LTE-A, and 5G), consumer electronics (WLAN including Wi-Fi 6), as well as education, and research applications.
21 December 2021 - Teledyne LeCroy announced availability of PCI Express 5.0 EDSFF interposers for analysis of Enterprise & Datacenter Small Form Factor (EDSFF) E1.S, E1.L, E3.x type solid-state drives (SSDs) and devices. These EDSFF interposers work in combination with the Summit family of PCI Express 5.0 protocol analyzers to test product designs that utilizes the PCIe 5.0, NVM Express (NVMe) and Compute Express Link (CXL) protocol technologies with data rates up to 32 GT/s and link widths up to x16.
20 December 2021 - Rohde & Schwarz adds new frequency ranges to its portable all-rounder spectrum analyzers. New base models for the portable R&S FPL1000 take spectrum and signal analysis capabilities up to 26.5 GHz. They combine the functionality of benchtop instruments and the portability of a handheld instrument, with intuitive features to make high performance measuring on the go fast and simple.For the series, two new models have been added to the range, providing capabilities from 5 kHz to 14 GHz and 5 kHz to 26.5 GHz.
17 December 2021 – Advantest announced the newest cost-efficient, high-volume memory tester in its industry-leading T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices. The T5835can handle 768 devices simultaneously for final package-level testing.