News - Component Test

OSM Test Adapter in four different Sizes

Yamaichi OSM Testadapter 28 February 2023 - The new OSM standard (Open Standard Module) from SGET describes four different-sized, space-saving and flexible solder-on module solutions that can be assembled, soldered and tested completely automatically. With the test adapter from Yamaichi Electronics, these modules are contacted safely and reliably. And they can be used in a manual as well as automatic test process.

DC Hipot Tester for Battery Safety Tests

HIOKI ST5680 06 February 2023 - HIOKI launched the DC Hipot tester ST5680 for the safety inspection process of battery modules . The DC Hipot test is one of the electrical safety tests in the module production of LIBs (lithium-ion batteries). The required test conditions depend on the standards required for each battery. The DC Hipot tester ST5680 has the specifications to comply with a wide range of international standards. It has the performance to comply with a wide range of DC Hipot tests and insulation resistance tests, as well as a wide variety of features to prove battery quality.

High-Frequency LCR Meter featuring Test Frequencies up to 50MHz

GWInst LCR 8200A 12 January 2023 - GW Instek launched the High Frequency LCR Tester LCR-8200A which is an extended series of the existing LCR-8200 series, providing test frequencies up to 50MHz. This extended series features a 7-inch color display and a high measurement accuracy (0.08%), same as the LCR-8200 series. The measurement results can be presented in numerical or graphical form depending on the selected measurement mode, allowing users to judge the characteristics of the DUT in the best way.

Review and Classification of Ultra-Small Photomask Defects

Advantest E5620 20 December 2022 – Advantest unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times.

Tektronix partners with BRIDG to expand Semiconductor Package Testing

Tek TCS 14 December 2022 - Tektronix announced an official collaboration with BRIDG, a not-for-profit, public-private partnership specializing in advanced system integration and integrated circuit packaging. This collaboration will expand advanced semiconductor package testing capabilities in the US. Tektronix Component Solutions offers domestic wafer test and package assembly and test services across a wide range of technologies.

High-Performance Test Cells for advanced Memory ICs

Advantest inteXcell 09 December 2022 – Advantest launched inteXcell, a new line of minimal-footprint test cells designed to address demanding final-test requirements presented by the increasing bit densities, lower power consumption and faster interface speeds of future memory devices. This new final test cell infrastructure integrates a T5835 memory tester optimized for use in high-productivity test cells and is designed to adopt future memory solutions. With inteXcell, ICs can be tested on the same platform from initial engineering through mass production.

Software Solution accelerates Yield Improvement in IC Engineering and Production

30 November 2022 – Advantest is offering a new yield-improvement solution that leverages artificial intelligence (AI) to expedite identifying the root causes of yield loss and increasing the efficiency of analyzing test results. The innovative and scalable Advantest Cloud Solutions Engineering AI Studio for Yield Improvement (ACS EASY) can increase the productivity of both device engineering and production operations for a wide range of users, from chip designers to outsourced semiconductor assembly and test (OSAT) companies.

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Readers Top 5 News of last 30 days

News - Component Test

OSM Test Adapter in four different Sizes

DC Hipot Tester for Battery Safety Tests

High-Frequency LCR Meter featuring Test Frequencies up to 50MHz

Review and Classification of Ultra-Small Photomask Defects

Tektronix partners with BRIDG to expand Semiconductor Package Testing

High-Performance Test Cells for advanced Memory ICs

Software Solution accelerates Yield Improvement in IC Engineering and Production

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