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News - Component TestOSM Test Adapter in four different Sizes
DC Hipot Tester for Battery Safety Tests
High-Frequency LCR Meter featuring Test Frequencies up to 50MHz
Review and Classification of Ultra-Small Photomask Defects
Tektronix partners with BRIDG to expand Semiconductor Package Testing
High-Performance Test Cells for advanced Memory ICs
Software Solution accelerates Yield Improvement in IC Engineering and Production30 November 2022 – Advantest is offering a new yield-improvement solution that leverages artificial intelligence (AI) to expedite identifying the root causes of yield loss and increasing the efficiency of analyzing test results. The innovative and scalable Advantest Cloud Solutions Engineering AI Studio for Yield Improvement (ACS EASY) can increase the productivity of both device engineering and production operations for a wide range of users, from chip designers to outsourced semiconductor assembly and test (OSAT) companies. More Articles ...
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