This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

JTAG

Search for glossary terms (regular expression allowed)
Begin with Contains Exact termSounds like
Term Definition
JTAG
Joint Test Action Group (developed the Standard IEEE 1149.1 = Boundary Scan Test)


Upcoming Events

EMC Europe 2023
Bruges (Belgium)
02 to 05 September
EUROPEAN MICROWAVE WEEK 2024
Paris (France)
22 to 27 September
ECOC 2024
Frankfurt (Germany)
22 to 26 October

  More events...
  See our Trade Show Calendar
  Click here

 

Advertising