News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.
30 September 2025 – Advantest announced its 7038 Single Test Rack (STR) system-level test (SLT) and burn-in test (BI) solution. The 7038 STR extends the company’s proven 7038 SLT platform with a lower-cost architecture optimized for slot-based automated test solutions, enabling right-sized SLT deployment in the production of artificial intelligence (AI), high-performance compute (HPC), automotive, and other low- to mid-volume devices.
22 September 2025 - Designed to combine precision and speed in a scalable platform, the R&S ZNB3000 vector network analyzer from Rohde & Schwarz helps engineers and researchers accelerate innovation in high-performance RF applications and signal integrity testing. By extending the maximum frequencies up to 32 GHz, 43.5 GHz and 54 GHz, Rohde & Schwarz addresses even more applications with the R&S ZNB3000, from RF component testing for 5G, 6G and Wi-Fi applications to advanced high-speed interconnect testing for AI data centers and next-generation RF component testing for satellite communications in the Ka band and V band.
16 September 2025 - Keysight Technologies introduces two new millimeter-wave frequency extender modules, the NA5305A Frequency Extender up to 170 GHz and NA5307A Frequency Extender up to 250 GHz, and the 85065A Precision Calibration Kit 0.5 mm. When used with Keysight’s PNA/PNA-X Vector Network Analyzers (VNA) and the N5292A Test Set Controller, the new accessories enable engineers to achieve fully calibrated single-sweep broadband S-parameter measurements from 100kHz (or 10 MHz) to 170/250 GHz. Existing customers using the 110 GHz /120 GHz VNA can easily upgrade their configuration, providing added value to their original investment.
15 September 2025 – Advantest announced the release of its next-generation CD-SEM E3660, engineered for the dimensional metrology of photomasks and EUV masks used in cutting-edge semiconductor manufacturing. Compared to the previous generation’s E3650, the E3660 delivers more than a 20% improvement in CD reproducibility, enabling process engineers to meet the stringent requirements of mask manufacturing at the 2nm node and beyond. By reinforcing lithography process control in advanced device fabrication, the E3660 furthers Advantest’s vision of providing holistic test solutions across the semiconductor value chain.
08 August 2025 - Teradyne launched the Magnum 7H, a next-generation memory tester designed to meet the rigorous demands of testing high bandwidth memory (HBM) devices, integrated with GPUs and accelerators in high-performance, generative AI servers. The Magnum 7H is engineered to deliver high-parallelism, high-speed, and high-accuracy testing for HBM stacked die at scale. Volume shipments and HBM device production on Teradyne’s Magnum 7H have started ramping at the largest HBM manufacturers in the industry.
