News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.
03 April 2025 - Keysight Technologies has enhanced its double-pulse test portfolio enabling customers to benefit from accurate and easy measurement of the dynamic characteristics of Wide-Bandgap (WBG) power semiconductor bare chips. The technologies implemented in the measurement fixture minimize parasitics and do not require soldering to the bare chip. The fixtures are compatible with both versions of Keysight’s double pulse testers.
28 March 2025 - Yokogawa Test & Measurement Corporation launched the AQ6361 optical spectrum analyzer (OSA). This high-performance yet cost-effective benchtop OSA is designed predominantly for the production testing of datacom and telecom components such as laser diodes, optical transceivers, and optical amplifiers. The production-grade AQ6361 achieves up to 20 times the measurement speed of the best-selling AQ6370E model.
20 March 2025 - Rohde & Schwarz has expanded its vector network analyzer portfolio with the R&S ZNB3000, which offers best-in-class RF performance. It combines high measurement accuracy with exceptional speed. With its high throughput rate, the new vector network analyzer is especially suitable for high-volume production and short ramp-up time environments such as large-scale production of RF components. Innovative PCB-based frontends offer higher stability and minimize thermal drift allowing reliable measurements over several days without recalibration.
Read more: Vector Network Analyzer for high-volume Production
21 February 2025 – Advantest announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge platform is engineered to support the latest advancements in high-speed memory technologies – including GDDR7, LPDDR6, and DDR6 – critical to meeting the growing demands of artificial intelligence (AI), high-performance computing (HPC) and edge applications.
18 February 2025 - Rohde & Schwarz launched a novel wideband modulated load pull solution. Based on the R&S RTP oscilloscope, this solution offers an extension to traditional vector network analyzer (VNA)-based solutions for non-linear device characterization. By enabling load pull with wideband modulated signals, it allows precise validation of key performance indicators across varying impedances, such as error vector magnitude (EVM) and adjacent channel leakage ratio (ACLR), to support the development of RF components for next-generation wireless technologies.
