News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.
12 February 2025 - Keysight Technologies announced the Low-Power Double Data Rate 6 (LPDDR6) design and test solution, a complete design and test solution to support the next technology wave for memory systems. The solution significantly improves device and system validation, providing new test automation tools necessary for advancing AI, especially in mobile and edge devices.
Read more: Comprehensive Design and Test Workflows for LPDDR6 Memory
28 January 2025 - Yokogawa Test & Measurement Corporation released AQ7420 high-resolution reflectometer. Utilizing OLCR (optical low-coherence reflectometry) technology, the AQ7420 is ideal for the internal structure analysis of optical modules and the visualization of microcracks in optical connectors. It provides a spatial resolution of 40 µm and exceptional back reflection measurement sensitivity down to -100 dB or lower, with no spurious noise. Combined with the optional sensor head unit, users can measure insertion loss simultaneously alongside back reflection, making the AQ7420 a highly efficient and cost-effective reflectometer for optical market applications.
22 January 2025 – Advantest announced that it has entered into small minority investments and partnership agreements with both Technoprobe SpA and FormFactor, Inc. Advantest is in discussions with, and will continue to evaluate investments in, additional probe card manufacturers as well as other critical semiconductor-industry supply chain companies.
Read more: Advantest forms Strategic Partnerships with FormFactor and Technoprobe
17 January 2025 – Test Research, Inc. (TRI), a provider of Test and Inspection solutions for the electronics manufacturing industry, launched the 3D AXI TR7600FB SII system, designed to deliver clearer imaging. The new X-ray imaging structure design addresses diverse product layouts and is optimized for specialized substrates, BGAs, multilayered structures, SiP, IC, CSP, Flip-Chip, and many more.
Read more: 3D AXI Platform optimized for Multilayer Structures
09 January 2025 – Advantest announced the launch of its new software development platform ACS Gemini, which allows customers to develop, simulate and debug machine learning applications in a virtual environment. The digital twin of ACS RTDI, ACS Gemini is part of Advantest’s mission to enable customers and partners to utilize data analytics in developing artificial intelligence (AI) and machine learning (ML) solutions for semiconductor testing.
Read more: Developer Platform for Accelerating AI and ML Application Development
