News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.
30 July 2024 – Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, announced it entered into a stock purchase agreement to acquire all of the outstanding capital stock of Incal Technology, Inc., a Fremont, California-based, privately held manufacturer of packaged part reliability/burn-in test solutions used by a significant number of leading Artificial Intelligence (AI) semiconductor manufacturers.
23 July 2024 - Pickering Interfaces announced a family of low leakage switching solutions targeting very low current driven-guard measurements in semiconductor parametric test applications such as WAT (wafer acceptance testing). The cross-platform products include PXI, PXIe and LXI versions and are based on the switched guard design principle, with the overall designs assuring isolation resistances of up to 1013Ω.
Read more: PXI, PXIe, and LXI Modules for Semiconductor Parametric Testing
11 July 2024 – Advantest announced that its SmarTest 8 system software, used to develop complex test programs for the company’s flagship V93000 SoC test platform, has been assessed Automotive SPICE Capability Level 2 compliant by Kugler Maag Cie of UL Solutions. This strategic designation, achieved following an intensive assessment process completed in February 2024, assures customers entering the automotive market of SmarTest 8’s reliability for embedded automotive applications.
Read more: Test Software achieves ASPICE Level 2 Certification
09 July 2024 – After receiving approval from the British and Italian governments, Microtest Group, the Italian leader in the creation of test systems and in the testing of microchips on package and silicon wafers, announces the acquisition of ipTEST. ipTEST specializes in testing silicon carbide and gallium nitride semiconductors, with locations in Guildford (UK) and Ipoh (Malaysia), and reported €22 million in revenue in 2023, with a 50% increase in its highly specialized engineering and technical workforce, 60% of whom are under 45 years old.
03 July 2024 - Chroma ATE introduced the RF testing board HDRF2 specifically designed for RF testing of semiconductor chips. As an optional module for the Chroma 3680 Advanced SoC Test System, the HDRF2 meets the needs of various fields such as IoT and Broadcast, making it the ideal choice for testing high-end MCUs and SoCs with embedded RF functionality.
