Latest Test and Measurement News

Wireless Communications Test Set with integrated Multiport Adapter

11 April 2013 – Agilent Technologies introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.

Smartphone and tablet volumes continue to grow, and test plans continue to expand to accommodate multiple radios, formats and frequency bands in today’s complex wireless devices. The Agilent EXT-C uniquely addresses these test challenges by increasing test throughput while keeping the overall cost of test equipment affordable and reducing the space and power used on the manufacturing line.

The EXT-C is an integrated one-box tester that includes a vector signal analyzer, vector signal generator, high-speed sequence analyzer, eight bi-directional input/output ports for multiformat cellular testing, and four output ports for GNSS testing.

Optimized for the fast-sequenced nonsignaling test methods required by the latest wireless-modem chipsets, the advanced EXT-C sequence analyzer works in synchronization with the modem chipset to eliminate signaling overhead and enable multiple measurements from a single acquisition. Combined with fully calibrated multi-DUT test capabilities, the EXT-C helps manufacturers achieve faster tests and increase yield on the production line.

 “The E6607C EXT is the latest innovation that Agilent brings to the cellular device manufacturing market,” said Joe DePond, vice president and general manager of Agilent’s Mobile Broadband Operation. “This product seamlessly blends our EXT-B and MPA into a form factor that will help our customers achieve unprecedented improvements in throughput while reducing the cost of testing.”

To minimize change in test processes and streamline the transition from R&D to volume manufacturing, the EXT-C uses the extensive X-Series measurement science available on Agilent spectrum analyzers to deliver trusted measurement applications tailored for fast manufacturing test. The EXT-C can be configured with a variety of X-Series measurement applications for cellular communications, wireless connectivity and digital audio/video, with support for standards such as LTE FDD, LTE TDD, TD-SCDMA and 2G/3G. Individual X-Series measurement applications can be included with the original instrument purchase or added later.

A comprehensive set of complementary software tools to accelerate test development is also available with the EXT-C. For example, Agilent Signal Studio makes it easy to create waveforms to generate nonsignaling control and test signals with the EXT. In preproduction, Agilent Sequence Studio enables engineers to quickly create and troubleshoot test plans. And to minimize production code test development, Agilent’s chipset software offers automated calibration and verification for specific wireless-chipset modems.

 The E6607C is fully backward compatible in terms of functionality with the previous-generation E6607B EXT and E6617A MPA combination. And, in anticipation of future test needs, the EXT-C offers full cellular-band coverage up to 3.8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes implemented in the latest chipsets.

Additional information

The E6607C EXT wireless communications test set is available for evaluations now, with volume availability expected in the second quarter of calendar 2013

www.agilent.com/find/EXT-C/