Latest Test and Measurement News

Embedded System Access Test Platform open for 3rd Party Tools   

07 May 2013 - In cooperation with selected partners within the GATE Alliance Program, GOEPEL electronic has developed a powerful Inter Process Link (IPL) for its JTAG/Boundary Scan software platform SYSTEM CASCON. The solution enables external tools to directly access the system internal project data base, additionally supporting interactive operations to handle data and control commands.

As a result, special software tools such as analyzers, visualizers, generators etc. can be coupled to and controlled by SYSTEM CASCON for targeted extension of the platform’s performance.

“In particular the increasing Chip Embedded Instruments utilization offers a variety of new test and measurement applications. Within this context, the seamless coupling with complementary third party software tools is a critical element for practical usage, which we specially addressed with the newly developed interface”, says Stefan Meissner, GOEPEL electronic’s spokesman. “Furthermore, we extend the scalability, flexibility and openness of SYSTEM CASCON as leading platform for the holistic implementation of Embedded System Access strategies.”

The newly developed IPL is a bidirectional integration interface, enabling external software tools nearly unlimited dynamic access to the internal data base of SYSTEM CASCON, incl. project data, object states and system information. At the same time, interactive control mechanisms are implemented, enabling a seamless connection to and utilization of respective 3rd party software. The solution’s universality allows for interaction with numerous complementary software tools, ranging from special data processors or process visualizers to complete pattern generators or signal analyzers.

About Embedded System Access (ESA)

ESA technologies enable the electrical access to embedded systems without utilizing mechanical nails or probe contacts (non-invasive methods). They apply design-integrated test and debug interfaces such as JTAG. In addition to Boundary Scan, ESA technologies include procedures like Chip Embedded Instruments, Processor Emulation Test, In-system Programming or Core Assisted Programming. ESA technologies are currently the most modern strategies for validation, test and debug as well as programming complex chips, boards, and complete units. They can be utilized throughout the entire product life cycle and enable for increased test coverage at reduced costs.

The new Inter Process Link will be supported in SYSTEM CASCON starting from version 4.6.2, and will be activated per license manager within the context of a respective software tool’s release.

www.goepel.com/