Latest Test and Measurement News

Desktop Tester supports Embedded System Access

10 May 2013 - GOEPEL electronic presents a number of new features for its desktop tester series JULIET. The systems now support all Embedded System Access (ESA) technologies for high-speed in-system programming of Flash, PLD and MCU as well as structural and functional at-speed board test. In addition to traditional Boundary Scan, test strategies such as Processor Emulation and Chip Embedded Instruments based on VarioTAP and ChipVORX technologies are supported.

There are several innovations for system operations: universal adaptors for fast prototype adaption, an automated release mechanism and a pneumatic lock mechanism are available. Furthermore, all JULIET systems provide the same user interface as the RAPIDO in-line programmers, i.e. a uniform operating concept for all production systems.

“The JULIET test systems particularly address the flexible low volume production area, but are also utilized for fault diagnosis in repair processes and specific calibration procedures. The new features help for a significant increase in the systems’ safety, productivity and fault coverage”, says Alexander Beck, Team Manager Integration within GOEPEL electronic’s JTAG/Boundary Scan Division. “Utilizing the preconfigured JULIET tester avoids time-consuming integrations for expensive customized solutions, additionally accompanied by a more effective process handling.”

The modular JULIET systems combine all test electronics, as well as the basic mechanics in a compact desktop system. Furthermore, they are equipped with a special interface to an exchangeable adaptor providing fast changes to accommodate different Units Under Test (UUT).

All systems provide four independently programmable UUT voltages incl. current measurement for two and four registers for support of gang-applications. An integrated exchangeable-adaptor appliance with type recognition allows standard UUT adaptations through needle contacts or real connectors with simultaneous access to all interface signals, even in the active state. Due to this, the selective monitoring of critical signals is tremendously facilitated and debugging becomes more effective.

www.goepel.com/