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Latest Test and Measurement NewsAdvantest Europe and Nash Technologies team for Application Engineering Services12 May 2017 – Advantest Europe GmbH and Nash Technologies GmbH announced a strategic partnership to develop solutions for test of semiconductor devices. Advantest’s SoC market share is growing significantly and customers demand solutions to test their devices on its leading V93000 and T2000 test platforms. Characterization of Displays with an Imaging Colorimeter11 May 2017 - Instrument Systems launched the new LumiTop 2700 imaging colorimeter. As a combination of spectroradiometer and RGB camera, the LumiTop 2700 characterizes displays with an extremely high measurement speed and outstanding accuracy. The LumiTop 2700 imaging colorimeter guarantees fast but at the same time highly precise characterization of displays in production. Test of fast serial Interfaces up to 5 Gbit/s10 May 2017 - The new test options for the R&S RTO2000 series oscilloscopes of Rohde & Schwarz with a bandwidth of 6 GHz make these instruments ideal for testing fast communications interfaces. The new options support the 5 Gbit/s SuperSpeed USB and PCI Express (PCIe) 2.0 interfaces. There is also a new solution for USB power delivery (USB-PD). New Software for PCIe Protocol Analyzers09 May 2017 - Teledyne LeCroy announced LinkExpert, a new alternative software interface for its PCI Express (PCIe) protocol analyzer line of products. LinkExpert provides complete control and management of Teledyne LeCroy’s family of protocol analyzer and exerciser hardware while displaying high-level diagnostic information about communication between the root complex (i.e. host systems) and end-points (i.e. devices). Test Software for the latest IEEE 802.11ax Draft Standard08 May 2017 – National Instruments (NI) announced the WLAN Test Toolkit 17.0 with support for Draft 1.1 of the IEEE 802.11ax standard. Combined with NI’s second-generation Vector Signal Transceiver (VST), the WLAN Test Toolkit 17.0 supports 802.11ax waveform generation and analysis for characterization, validation and production test of products, such as RF front end components, wireless modules and user devices, that implement Draft 1.1 of the IEEE 802.11ax standard. MIPI D-PHY and C-PHY Test Solution for Mobile and IoT Technologies05 May 2017 - Keysight Technologies announced a new MIPI D-PHY and C-PHY test solution to help accelerate the development of next-generation mobile and IoT devices. Keysight’s new test solution supports the MIPI Alliance’s D-PHY v2.0/v2.1 specification and C-PHY v1.0/v1.1 specification and conformance test suite. Lock-in Amplifier/AWG with Pulse Counter04 May 2017 - Zurich Instruments expanded their UHFLI, a 600 MHz Lock-in Amplifier and Arbitrary Wave Generator (AWG), with a Pulse Counter option for recording random pulses. Pulses of a minimal time of 4.44 ns can be counted on up to four channels at a bandwidth of 225 MHz. More Articles ...
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