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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsPXI Oscilloscope featuring 14 Bits Resolution and 1 GS/s Sample Rate08 November 2016 – National Instruments (NI) announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy. Continuous-Sweep Signal Analysis of Frequencies up to 110 GHz07 November 2016 – Keysight Technologies announced an industry-leading breakthrough in spectrum and signal analysis at millimeter-wave frequencies. The Keysight N9041B UXA X-Series signal analyzer is the first to provide frequency coverage to 110 GHz with a maximum analysis bandwidth of up to 5 GHz. The N9041B UXA features an advanced front-end circuitry that achieves low loss and efficient mixing, providing a displayed average noise level (DANL) as low as –150 dBm/Hz when characterizing wideband modulated signals in the millimeter-wave band. Test Probes for Signals up to 18 Gb/s04 November 2016 - Pico Technology launched a new family of high-performance microwave and gigabit test probes. The PicoConnect passive probes allow cost-effective fingertip browsing of broadband signals or data streams out to 9 GHz or 18 Gb/s. These include the now ubiquitous USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards. Wafer-Level Parametric Test Solution for Power Semiconductors04 November 2016 -- Tektronix introduced the Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down. SAS 4.0 Protocol Analyzer Platform03 November 2016 – Teledyne LeCroy announced the world’s first Serial Attached SCSI 4.0 (SAS) Protocol Analyzer platform supporting protocol testing and debugging of the emerging 24Gb/s SAS standard. The Sierra T244 analyzer platform leverages Teledyne LeCroy's cutting-edge TAP4 probe technology to provide early-adopters with visibility into the next-generation SAS 4.0 protocol. Dual Channel 13.6GHz Microwave Signal Generator02 November 2016 - Saelig announces the SynthHD PRO - a temperature-compensated, dual-channel, software-tunable RF signal generator and frequency sweeper, controlled and powered via a USB port on a device running Windows or Android software. The SynthHD PRO's dual, independent 54 MHz to 13.6 GHz channels can be configured to run at two different frequencies, or at the same frequency with different phases. This allows its use in antenna beam steering applications or quadrature signal generation commonly used in image-reject frequency conversion. Preview of mmWave 802.11ad Wireless Test Solution02 November 2016 – National Instruments (NI) announced a technology preview of its new 802.11ad, or WiGig, test solution. This demonstration of a new 802.11ad test solution is based on NI’s wideband mmWave transceiver technology used by automotive and wireless infrastructure researchers to prototype advanced radar and 5G systems. It consists of a vector signal generator and vector signal analyzer operating at 55 to 68 GHz with more than 2 GHz of instantaneous bandwidth. More Articles ...
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